2007 | OriginalPaper | Chapter
Physics-Based Simulation of 1/f Noise in MOSFETs under Large-Signal Operation
Authors : Sung-Min Hong, Hong-Hyun Park, Chan Hyeong Park, Myoung Jin Lee, Hong Shick Min, Young June Park
Published in: Simulation of Semiconductor Processes and Devices 2007
Publisher: Springer Vienna
Activate our intelligent search to find suitable subject content or patents.
Select sections of text to find matching patents with Artificial Intelligence. powered by
Select sections of text to find additional relevant content using AI-assisted search. powered by
1/
f
noise in MOSFETs under large-signal excitation, which is important in CMOS analog and RF circuits, is modeled as a perturbation in the semiconductor equations employing the oxide-trapping model. The oxide-trapping model for a MOSFET in periodic large-signal operation shows that 1/
f
noise reduces more than the small-signal noise model predicts as the gate OFF voltage decreases further below the threshold voltage.