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Published in: Journal of Materials Science: Materials in Electronics 13/2020

21-05-2020

Preparation, structural characteristics and optical parameters of the synthesized nano-crystalline sulphur-doped Bi2Te2.85Se0.15 thermoelectric materials

Authors: M. S. Shalaby, H. M. Hashem, N. M. Yousif, H. A. Zayed, A. Sotelo, L. A. Wahab

Published in: Journal of Materials Science: Materials in Electronics | Issue 13/2020

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Abstract

In the present work, a systematic preparation of Bi2Te2.85Se0.15−xSx (x = 0.0, 0.02, 0.04 and 0.06) compositions was carried out by solvothermal method. The materials were characterized by XRD, SEM, EDX, TEM and Raman spectroscopy. XRD, as well as TEM, to confirm the nanostructure of samples. The electrical and thermal properties were investigated in the temperature range from room temperature to 600 K. The highest power factor was 1.3 × 10−2 mW/K2 m at 600 K for (x = 0.06) sample. This improvement in the thermoelectric properties may be due to the ordered atomic arrangement of Bi, Te, and Se induced by sulphur in the Bi2Te2.85Se0.15−xSx nanocomposites, which was confirmed by X-ray diffraction and Raman spectral analysis. The optical properties, such as energy gap, refractive index, extinction coefficient and dielectric constants, were obtained from the diffused reflectance data in the range of 200 to 800 nm. Sulphur doping influences the optical energy gap, reaching the lowest value for x = 0.04 samples (0.14 eV), while the highest allowed energy gap was found in x = 0.06 ones (0.41 eV). Also, It should be mentioned that dielectric constants (εr and εi) were affected due to Sulphur doping, whereas the samples with x = 0.04 and 0.02 have the highest and lowest εr, respectively, and the opposite for εi when increasing the wavelength.

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Appendix
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Metadata
Title
Preparation, structural characteristics and optical parameters of the synthesized nano-crystalline sulphur-doped Bi2Te2.85Se0.15 thermoelectric materials
Authors
M. S. Shalaby
H. M. Hashem
N. M. Yousif
H. A. Zayed
A. Sotelo
L. A. Wahab
Publication date
21-05-2020
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 13/2020
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-03611-4

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