Skip to main content
Disciplines
Automotive Business IT + Informatics Construction + Real Estate Electrical Engineering + Electronics Energy + Sustainability Insurance + Risk Finance + Banking Management + Leadership Marketing + Sales Mechanical Engineering + Materials
Events
DE
EN
Books
Journals
Topic Page
Marketing
Start single access now
Access for companies
EXTENDED SEARCH
Log in
Top
Journal of Electronic Testing
Published in: Journal of Electronic Testing 6/2013

01-12-2013

Preserving Hamming Distance in Arithmetic and Logical Operations

Authors: Shlomi Dolev, Sergey Frenkel, Dan E. Tamir, Vladimir Sinelnikov

Published in: Journal of Electronic Testing | Issue 6/2013

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

This paper presents a new method for fault-tolerant computing where for a given error rate, r, the hamming distance between correct inputs and faulty inputs, as well as the hamming distance between correct results and faulty results, is preserved throughout processing; thereby enabling correction of up to r transient faults per computation cycle. The new method is compared and contrasted with current protection methods and its cost/performance is analyzed.
previous article Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

inform now
Show more products
Literature
1.
Bell D, Laxton R (1975) Some BCH codes are optimal. Electronics letters 11:14
2.
Blahut RE (1983) Theory and practice of error control codes, Addison-Wesley
3.
Cassel M, De Lima FG (2006) “Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs,” in Proc. of 12th IEEE International On-Line Testing Symposium, pp 139–144
4.
Chen W, Gong R, Liu F, Dai K, Wang Z (2006) “Improving the fault-tolerance of a computer system with space-time triple modular redundancy,” in Proc. of International Conference of Embedded Systems Applications, pp 183-190
5.
Dolev S and Frenkel S (2008) “Toward Hamming Processor,” Technical Report, #08-05, Dept. of Computer Science, Ben-Gurion University of the Negev
6.
Hass KJ, Gambles JW, Walker B, Zampaglione M (1998) “Mitigating single event upsets from combinational logic,” in Proc. of 7th NASA, Symposium on VLSI Design, vol. 4.1, pp. 1–10
7.
Hentschke R, Marques F, Lima F, Carro L, Susin A, Reis R (2002) “Analyzing area and performance penalty of protecting different digital modules with hamming code and triple modular redundancy,” in Proc. of the 13h Symposium on Integrated Circuits and Systems Design, p. 95–100
8.
Jasinski R, Pedroni VA (2004) “Evaluating logic resources utilization in an FPGA-based TMR CPU,” in Proc. of the International Military and Aerospace Applications of Programmable Logic Devices, pp. 1005
9.
Lala K (2001) Self-checking and fault-tolerant digital design, Morgan Kaufmann
10.
Lima F, Cota E, Carro1 L, Lubaszewski M, Reis R, Velazco R, Rezgui S (2000) “Designing a radiation hardened 8051-like micro-controller,” in Proc. of 13th Symposium on Integrated Circuits and Systems Design, pp. 255–260
11.
Mavis DG, Eaton PH (2002) “Soft-error rate mitigation techniques for modern microcircuits,” in Proc. of 40th Annual Reliability Physics Symposium, pp. 216–225
12.
Nelson VP (1990) Fault-tolerant computing: fundamental concepts. IEEE Comput 23(7):19–25CrossRef
13.
Nicolaidis M (2003) Carry checking/parity prediction adders and ALUs. IEEE Trans Very Large Scale Integr Syst 11(1):121–128CrossRef
14.
Reyhani-Masoleh A, Hasan MA (2004) Low complexity bit parallel architectures for polynomial basis multiplication over GF(2m). IEEE Trans Comput 53(8):945–959CrossRef
15.
Spielman D (1996) “Highly Fault-Tolerant Parallel Computation,” in Proc. of the 37th IEEE Annual Symposium on Foundations of Computer Science, pp. 154–163
16.
Xin L, Shen K, Huang MC, and Chu L (2007 “A Memory soft-error measurement on production systems,” in Proc. of USENIX Annual Technical Conference, pp. 275–280
Metadata
Title
Preserving Hamming Distance in Arithmetic and Logical Operations
Authors
Shlomi Dolev
Sergey Frenkel
Dan E. Tamir
Vladimir Sinelnikov
Publication date
01-12-2013
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 6/2013
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-013-5421-9

Other articles of this Issue 6/2013

Journal of Electronic Testing 6/2013 Go to the issue

OriginalPaper

Autonomous Fault-Tolerant Systems onto SRAM-based FPGA Platforms

OriginalPaper

Physics-Based Low-Cost Test Technique for High Voltage LDMOS

OriginalPaper

Online Testable Approaches in Reversible Logic

OriginalPaper

Selective SWIFT-R

OriginalPaper

A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration

OriginalPaper

Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique