2004 | OriginalPaper | Chapter
Radiofrequency and Microwave Noise Metrology
Authors : E. Rubiola, V. Giordano
Published in: Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Publisher: Springer Netherlands
Included in: Professional Book Archive
Activate our intelligent search to find suitable subject content or patents.
Select sections of text to find matching patents with Artificial Intelligence. powered by
Select sections of text to find additional relevant content using AI-assisted search. powered by
The radiofrequency interferometer, as compared to other methods for the measurement of amplitude noise and phase noise, shows higher sensitivity. In favorble onditions the background noise can be as low as—180 dB[rad2]/Hz at f= 1Hz off the carrier, up to microwaves (10 GHz) for real-time measurements. Exploiting correlation and averaging, a white noise floor of—204 dB[rad2]/Hz has been observed, not limited by the thermal energy k B T0 referred to the carroer power P0. This article reports on the method, on the recent developments, and on the measurement of low-noise hard-to-measure devices.