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2004 | OriginalPaper | Chapter

Radiofrequency and Microwave Noise Metrology

Authors : E. Rubiola, V. Giordano

Published in: Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

Publisher: Springer Netherlands

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The radiofrequency interferometer, as compared to other methods for the measurement of amplitude noise and phase noise, shows higher sensitivity. In favorble onditions the background noise can be as low as—180 dB[rad2]/Hz at f= 1Hz off the carrier, up to microwaves (10 GHz) for real-time measurements. Exploiting correlation and averaging, a white noise floor of—204 dB[rad2]/Hz has been observed, not limited by the thermal energy k B T0 referred to the carroer power P0. This article reports on the method, on the recent developments, and on the measurement of low-noise hard-to-measure devices.

Metadata
Title
Radiofrequency and Microwave Noise Metrology
Authors
E. Rubiola
V. Giordano
Copyright Year
2004
Publisher
Springer Netherlands
DOI
https://doi.org/10.1007/1-4020-2170-4_32