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Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) Read chapter Read first chapter

2015 | OriginalPaper | Chapter

2. Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application

Authors : Maxmore Chaibva, Nicole Shamitko-Klingensmith, Justin Legleiter

Published in: Surface Science Tools for Nanomaterials Characterization

Publisher: Springer Berlin Heidelberg

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Abstract

Scanning probe acceleration microscopy (SPAM) is a technique that reconstructs the time-resolved tip/sample forces during standard tapping-mode atomic force microscopy (TMAFM) imaging in solution, allowing for the simultaneous mapping of topography and mechanical properties of surfaces. Here, we describe the relationship between tapping forces and sample mechanical properties, the theoretical basis for the SPAM technique, and its application to a variety of systems.

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previous chapter Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
next chapter Scanning Probe Microscopy for Nanolithography
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Metadata
Title
Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application
Authors
Maxmore Chaibva
Nicole Shamitko-Klingensmith
Justin Legleiter
Copyright Year
2015
Publisher
Springer Berlin Heidelberg
Book
Surface Science Tools for Nanomaterials Characterization

Print ISBN: 978-3-662-44550-1

Electronic ISBN: 978-3-662-44551-8

Copyright Year: 2015

DOI
https://doi.org/10.1007/978-3-662-44551-8_2

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