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Revisiting Applicable and Comprehensive Knowledge Tracing in Large-Scale Data

  • 2026
  • OriginalPaper
  • Chapter
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Abstract

This chapter delves into the evolution of knowledge tracing (KT) in educational technology, highlighting the shift from traditional machine learning to deep learning models. It explores the limitations of current deep learning models, such as the Deep Knowledge Tracing (DKT) model, which struggles with applicability and comprehensiveness. The introduction of DKT2, a novel model that leverages xLSTM, the Rasch model, and Item Response Theory (IRT), is a significant advancement. DKT2 addresses these limitations by incorporating exponential activation functions and matrix memory, enhancing its predictive accuracy and scalability. The chapter presents extensive experiments across three large-scale datasets, demonstrating DKT2's superior performance in one-step, multi-step, and varying-history-length predictions. It also discusses the impact of different input settings and the importance of multi-concept prediction, providing a comprehensive analysis of the model's strengths and potential applications in real-world educational settings.

Supplementary Information

The online version contains supplementary material available at https://​doi.​org/​10.​1007/​978-3-032-06109-6_​14.

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Title
Revisiting Applicable and Comprehensive Knowledge Tracing in Large-Scale Data
Authors
Yiyun Zhou
Wenkang Han
Jingyuan Chen
Copyright Year
2026
DOI
https://doi.org/10.1007/978-3-032-06109-6_14
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