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Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) Read chapter Read first chapter

2015 | OriginalPaper | Chapter

6. Scanning Conductive Torsion Mode Microscopy

Authors : Ling Sun, Elmar Bonaccurso

Published in: Surface Science Tools for Nanomaterials Characterization

Publisher: Springer Berlin Heidelberg

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Abstract

In this chapter, we introduce a special non-contact scanning probe based current sensing technique: scanning conductive torsion mode microscopy (SCTMM), which allows for simultaneous topography and electrical current mapping on solid samples. Due to the low interacting force between the probe and sample surface, this new technique is particularly indicated for and usually applied to measurements on soft materials and fragile structures. We first describe the working principle and discuss the advantages of the technique and its limitations. We also review recent applications of this technique, including studies of structure-properties relationship, local conductivity of nanopillar arrays, electropolymerization of conjugated polymers, and molecular orientation of self-assembly structures. In the end, we discuss some potential improvements of future scanning probe based current sensing techniques.

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previous chapter Field Ion Microscopy for the Characterization of Scanning Probes
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Metadata
Title
Scanning Conductive Torsion Mode Microscopy
Authors
Ling Sun
Elmar Bonaccurso
Copyright Year
2015
Publisher
Springer Berlin Heidelberg
Book
Surface Science Tools for Nanomaterials Characterization

Print ISBN: 978-3-662-44550-1

Electronic ISBN: 978-3-662-44551-8

Copyright Year: 2015

DOI
https://doi.org/10.1007/978-3-662-44551-8_6

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