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The Principle and Physical Chemistry of Soft Interface Read chapter Read first chapter

2019 | OriginalPaper | Chapter

9. Scanning Electron Microscopy

Authors : Xi Jiang, Takeshi Higuchi, Hiroshi Jinnai

Published in: Molecular Soft-Interface Science

Publisher: Springer Japan

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Abstract

Scanning electron microscopy (SEM), an important member of the electron microscopy family, is a versatile instrument widely used in various fields such as nanotechnology, biology, and the life sciences for imaging of micro- and nanostructure morphology and characterizations of chemical composition of various materials.

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previous chapter X-Ray and Neutron Reflectivity and Grazing Incidence X-Ray Diffraction
next chapter Transmission Electron Microscopy
Literature
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Danilatos GD (1988) Foundations of environmental scanning electron microscopy. Adv Electron Electron Phys 71:109–250CrossRef
2.
Higuchi T, Murakami D, Nishiyama H, Suga M, Takahara A, Jinnai H (2014) Nanometer-scale real-space observation and material processing for polymer materials under atmospheric pressure: application of atmospheric scanning electron microscopy. Electrochemistry (in press)
3.
McMullan D (1995) Scanning electron microscopy 1928–1965. Scanning 17:175–185CrossRef
4.
Michler GH (2008) Electron microscopy of polymers. Springer Laboratory
5.
Suga M, Nishiyama H, Konyuba Y, Iwamatsu S, Watanabe Y, Yoshiura C, Ueda T, Sato C (2011) The atmospheric scanning electron microscope with open sample space observes dynamic phenomena in liquid or gas. Ultramicroscopy 111:1650–1658CrossRef
Metadata
Title
Scanning Electron Microscopy
Authors
Xi Jiang
Takeshi Higuchi
Hiroshi Jinnai
Copyright Year
2019
Publisher
Springer Japan
Book
Molecular Soft-Interface Science

Print ISBN: 978-4-431-56875-9

Electronic ISBN: 978-4-431-56877-3

Copyright Year: 2019

DOI
https://doi.org/10.1007/978-4-431-56877-3_9

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