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2018 | OriginalPaper | Chapter

98. Scanning Tunneling Spectroscopy

Author : Keisuke Sagisaka

Published in: Compendium of Surface and Interface Analysis

Publisher: Springer Singapore

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Abstract

Spectroscopic measurement performed with STM, referred to as scanning tunneling spectroscopy (STS), provides information proportional to the local density of states (LDOS), the number of states per unit energy, of the sample surface. The STS measurement is usually made by positioning the STM tip over a target feature of a surface, deactivating the feedback loop to fix the STM tip height, applying a sample bias ramp, and recording tunneling current (I) or differential conductance (dI/dV).

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previous chapter Scanning Tunneling Microscopy
next chapter Soft X-Ray Absorption Fine Structure
Literature
1.
A rigorous assessment of the tunneling current and dI/dV can be found in Chen, C. J.: Introduction to Scanning Tunneling Microscopy: 2nd edn. Oxford University Press (2008)
2.
Hamers, R.J., Tromp, R.M., Demuth, J.E.: Surface electronic structure of Si(111)-(7 × 7) resolved in real space. Phys. Rev. Lett. 56, 1972 (1986)CrossRef
3.
Lee, J., Slezak, J.A., Davis, J.C.: Spectroscopic imaging STM studies of high-Tc superconductivity. J. Phys. Chem. Solids 66, 1370 (2005)CrossRef
4.
Feenstra; R. M., Stroscio, J. A.; Fein; A.P., Tunneling spectroscopy of the Si(111)2×1 surface. Surf. Sci. 181, 295 (1987)CrossRef
5.
Kohsaka, Y., Taylor, C., Fujita, K., Schmidt, A., Lupien, C., Hanaguri, T., Azuma, M., Takano, M., Eisaki, E., Takagi, H., Uchida, S., Davis, J.C.: An intrinsic bond-centered electronic glass with unidirectional domains in underdoped cuprates. Science 315, 1380 (2008)CrossRef
6.
Morgenstern, M., Haude, D., Meyer, C., Wiesendanger, R.: Experimental evidence for edge-like states in three-dimensional electrons systems. Phys. Rev. B 64, 205104 (2001). Also, derivation of energy broadening is discussed in ref [1]
7.
Sagisaka, K., Fujita, D.: A parabolic quantum well on a single dimer row of the Si(001) surface studied by scanning tunneling microscopy. J. Phys: Conf. Ser. 100, 052002 (2008)
Metadata
Title
Scanning Tunneling Spectroscopy
Author
Keisuke Sagisaka
Copyright Year
2018
Publisher
Springer Singapore
Book
Compendium of Surface and Interface Analysis

Print ISBN: 978-981-10-6155-4

Electronic ISBN: 978-981-10-6156-1

Copyright Year: 2018

DOI
https://doi.org/10.1007/978-981-10-6156-1_98

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