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2018 | OriginalPaper | Chapter

6. Schottky Diodes

Authors : Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker

Published in: Semiconductor Power Devices

Publisher: Springer International Publishing

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Excerpt

Schottky diodes are formed by a metal-semiconductor junction, whose rectifying behavior was described early [Sch38, Sch39]. They are unipolar devices, which means that only one type of carriers is available for the current transport. If they are designed for large blocking voltages, the resistance of the base will increase strongly due to the lack of charge carrier modulation. Schottky power diodes have been used for a long time, but in the last years they have gained an increased importance in following areas:
  • Si Schottky diodes in the voltage range up to approximately 100 V to be used as freewheeling diodes for MOSFETs. Their advantage is the low junction voltage and the absence of stored charge. At turn-off from conducting to blocking mode, only the capacitive recharge of the junction capacitance needs to be considered. This makes them very useful for very high switching frequencies.
  • Schottky diodes from semiconductor materials with wide bandgap. With these materials, much higher blocking voltages are possible due to the higher critical fields. Because of the much smaller possible junction voltage compared with wide-gap pn-diodes, Schottky diodes have become an attractive alternative.

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Literature
[Bar09]
go back to reference Bartsch, W., Schoerner, R., Dohnke, K.O.: Optimization of bipolar SiC-diodes by analysis of avalanche breakdown performance. In: Proceedings of the ICSCRM 2009, paper Mo-P-56 (2009) Bartsch, W., Schoerner, R., Dohnke, K.O.: Optimization of bipolar SiC-diodes by analysis of avalanche breakdown performance. In: Proceedings of the ICSCRM 2009, paper Mo-P-56 (2009)
[Bec16]
go back to reference Beckedahl, P., Buetow, S., Maul, A., Roeblitz, M., Spang, M.: 400 A, 1200 V SiC power module with 1nH commutation inductance. In: Proceedings of the international conference on integrated power systems (CIPS), (2016) Beckedahl, P., Buetow, S., Maul, A., Roeblitz, M., Spang, M.: 400 A, 1200 V SiC power module with 1nH commutation inductance. In: Proceedings of the international conference on integrated power systems (CIPS), (2016)
[Ber97]
go back to reference Berndes, G., Strauch, G., Mößner (IXYS Semiconductor GmbH), S.: “Die Schottky-Diode - ein wiederentdecktes Bauelement für die Leistungshalbleiter-Hersteller”. Kolloquium Halbleiter-Leistungsbauelemente, Freiburg (1997) Berndes, G., Strauch, G., Mößner (IXYS Semiconductor GmbH), S.: “Die Schottky-Diode - ein wiederentdecktes Bauelement für die Leistungshalbleiter-Hersteller”. Kolloquium Halbleiter-Leistungsbauelemente, Freiburg (1997)
[Bjo06]
go back to reference Bjoerk, F., Hancock, J., Treu, M., Rupp, R., Reimann, T.: 2nd generation 600 V SiC Schottky diodes use merged pn/Schottky structure for surge overload protection. In: Proceedings of the APEC (2006) Bjoerk, F., Hancock, J., Treu, M., Rupp, R., Reimann, T.: 2nd generation 600 V SiC Schottky diodes use merged pn/Schottky structure for surge overload protection. In: Proceedings of the APEC (2006)
[Dah01]
go back to reference Dahlquist, F., Lendenmann, H., Östling, M.: A high performance JBS rectifier – design considerations. Mater. Sci. Forum 353–356, 683 (2001)CrossRef Dahlquist, F., Lendenmann, H., Östling, M.: A high performance JBS rectifier – design considerations. Mater. Sci. Forum 353–356, 683 (2001)CrossRef
[Dra15]
go back to reference Draghici, M., Rupp, R., Gerlach, R., Zippelius, B.: A new 1200 V SiC MPS diode with improved performance and ruggedness. Mater. Sci. Forum 821–823, 608–611 (2015)CrossRef Draghici, M., Rupp, R., Gerlach, R., Zippelius, B.: A new 1200 V SiC MPS diode with improved performance and ruggedness. Mater. Sci. Forum 821–823, 608–611 (2015)CrossRef
[Fic14]
go back to reference Fichtner, S., Lutz, J., Basler, T., Rupp, R., Gerlach, R.: Electro-thermal simulations and experimental results on the surge current capability of 1200 V SiC MPS diodes. In: Proceedings of the 8th international conference on integrated power systems (CIPS), pp. 438–443 (2014) Fichtner, S., Lutz, J., Basler, T., Rupp, R., Gerlach, R.: Electro-thermal simulations and experimental results on the surge current capability of 1200 V SiC MPS diodes. In: Proceedings of the 8th international conference on integrated power systems (CIPS), pp. 438–443 (2014)
[Fic15]
go back to reference Fichtner, S., Frankeser, S., Rupp, R., Basler, T., Gerlach, R., Lutz, J.: Ruggedness of 1200 V SiC MPS diodes. Microelectron. Reliab. 55(9–10), 1677–1681 (2015)CrossRef Fichtner, S., Frankeser, S., Rupp, R., Basler, T., Gerlach, R., Lutz, J.: Ruggedness of 1200 V SiC MPS diodes. Microelectron. Reliab. 55(9–10), 1677–1681 (2015)CrossRef
[Hei08b]
go back to reference Heinze, B., Baburske, R., Lutz, J., Schulze, H.J.: Effects of metallisation and bondfeets in 3.3 kV free-wheeling diodes at surge current conditions. In: Proceedings of the ISPS, prague (2008) Heinze, B., Baburske, R., Lutz, J., Schulze, H.J.: Effects of metallisation and bondfeets in 3.3 kV free-wheeling diodes at surge current conditions. In: Proceedings of the ISPS, prague (2008)
[Hei08c]
go back to reference Heinze, B., Lutz, J., Neumeister, M., Rupp, R.: Surge current ruggedness of silicon carbide Schottky- and merged-PiN-Schottky diodes. In: Proceedings ISPSD 2008. Orlando, Florida, USA (2008)CrossRef Heinze, B., Lutz, J., Neumeister, M., Rupp, R.: Surge current ruggedness of silicon carbide Schottky- and merged-PiN-Schottky diodes. In: Proceedings ISPSD 2008. Orlando, Florida, USA (2008)CrossRef
[Hu79]
go back to reference Hu, C.: A parametric study of power MOSFETs. Record of 1979 IEEE power specialists conference, pp. 385–395 (1979) Hu, C.: A parametric study of power MOSFETs. Record of 1979 IEEE power specialists conference, pp. 385–395 (1979)
[Hua16]
go back to reference Huang, Y., Erlbacher, T., Buettner, J., Wachutka, G.: A trade-off between nominal forward current density and surge current capability for 4.5 kV SiC MPS diodes. In: Proceedings of the ISPSD, Prague, pp. 63–66 (2016) Huang, Y., Erlbacher, T., Buettner, J., Wachutka, G.: A trade-off between nominal forward current density and surge current capability for 4.5 kV SiC MPS diodes. In: Proceedings of the ISPSD, Prague, pp. 63–66 (2016)
[Lut14]
go back to reference Lutz, J., Baburske, R.: Some aspects on ruggedness of SiC power devices. Microelectron. Reliab. 54, 49–56 (2014)CrossRef Lutz, J., Baburske, R.: Some aspects on ruggedness of SiC power devices. Microelectron. Reliab. 54, 49–56 (2014)CrossRef
[Niw17]
go back to reference Niwa, H., Suda, J., Kimoto, T.: Ultrahigh-voltage SiC MPS diodes with hybrid unipolar/bipolar operation. IEEE Trans. Electron Devices 64(3), 874–881 (2017)CrossRef Niwa, H., Suda, J., Kimoto, T.: Ultrahigh-voltage SiC MPS diodes with hybrid unipolar/bipolar operation. IEEE Trans. Electron Devices 64(3), 874–881 (2017)CrossRef
[Ogu04]
go back to reference Ogura, T., Ninomiya, H., Sugiyama, K., Inoue, T.: 4.5 kV injection en-hanced gate transistors (IEGTs) with high turn-off ruggedness. IEEE Trans. Electron Devices 51, 636–641 (2004)CrossRef Ogura, T., Ninomiya, H., Sugiyama, K., Inoue, T.: 4.5 kV injection en-hanced gate transistors (IEGTs) with high turn-off ruggedness. IEEE Trans. Electron Devices 51, 636–641 (2004)CrossRef
[Pal16]
go back to reference Palanisamy, S., Fichtner, S., Lutz, J., Basler, T., Rupp, R.: Various structures of 1200 V SiC MPS diode models and their simulated surge current behavior in comparison to measurement. In: Proceedings of the ISPSD, Prague, pp 235–238 (2016) Palanisamy, S., Fichtner, S., Lutz, J., Basler, T., Rupp, R.: Various structures of 1200 V SiC MPS diode models and their simulated surge current behavior in comparison to measurement. In: Proceedings of the ISPSD, Prague, pp 235–238 (2016)
[Pet01]
go back to reference Peters, D., Dohnke, K.O., Hecht, C., Stephani, D.: 1700 V SiC Schottky diodes scaled up to 25 A. Mater. Sci. Forum 353–356, 675–678 (2001)CrossRef Peters, D., Dohnke, K.O., Hecht, C., Stephani, D.: 1700 V SiC Schottky diodes scaled up to 25 A. Mater. Sci. Forum 353–356, 675–678 (2001)CrossRef
[Rup06]
go back to reference Rupp, R., Treu, M., Voss, S., Björk, F., Reimann, T.: ‘2nd Generation’ SiC Schottky diodes: a new benchmark in SiC device ruggedness. In: Proceedings of the ISPSD, pp. 1–4 (2006) Rupp, R., Treu, M., Voss, S., Björk, F., Reimann, T.: ‘2nd Generation’ SiC Schottky diodes: a new benchmark in SiC device ruggedness. In: Proceedings of the ISPSD, pp. 1–4 (2006)
[Rup12]
go back to reference Rupp, R., Gerlach, R., Kabakow, A.: Current distribution in the various functional areas of a 600 V SiC MPS diode in forward operation. Mater. Sci. Forum 717, 929–932 (2012)CrossRef Rupp, R., Gerlach, R., Kabakow, A.: Current distribution in the various functional areas of a 600 V SiC MPS diode in forward operation. Mater. Sci. Forum 717, 929–932 (2012)CrossRef
[Rup14]
go back to reference Rupp, R., Gerlach, R., Kabakow, A., Schörner, R., Hecht, C., Elpelt, R., Draghici, M.: Avalanche behaviour and its temperature dependence of commercial SiC MPS diodes: influence of design and voltage class. In: Proc. of the 26th ISPSD, pp 67–70 (2014) Rupp, R., Gerlach, R., Kabakow, A., Schörner, R., Hecht, C., Elpelt, R., Draghici, M.: Avalanche behaviour and its temperature dependence of commercial SiC MPS diodes: influence of design and voltage class. In: Proc. of the 26th ISPSD, pp 67–70 (2014)
[Sch38]
[Sch39]
go back to reference Schottky, W.: Zur Halbleitertheorie der Sperrschicht- und Spitzengleichrichter. Zeitschrift für Physik 113, 376–414 (1939)CrossRefMATH Schottky, W.: Zur Halbleitertheorie der Sperrschicht- und Spitzengleichrichter. Zeitschrift für Physik 113, 376–414 (1939)CrossRefMATH
[Sco91]
go back to reference Schlangenotto, H., Niemann, E.: Switching properties of power devices on silicon carbide and silicon. EPE-MADEP (Symposion on materials and devices for power electronis), Firenze, pp. 8–13 (1991) Schlangenotto, H., Niemann, E.: Switching properties of power devices on silicon carbide and silicon. EPE-MADEP (Symposion on materials and devices for power electronis), Firenze, pp. 8–13 (1991)
[Scr94]
go back to reference Schaffer, W.J., Negley, G.H., Irvine, K.G., Palmour, J.W.: Conductivity anisotropy in epitaxial 6H and 4H SiC. Mater. Res. Soc. Symp. Proc. 339, 595–600 (1994)CrossRef Schaffer, W.J., Negley, G.H., Irvine, K.G., Palmour, J.W.: Conductivity anisotropy in epitaxial 6H and 4H SiC. Mater. Res. Soc. Symp. Proc. 339, 595–600 (1994)CrossRef
[Sin00]
go back to reference Singh, R., et al: 1500 V 4 Amp 4H-SiC JBS diodes. In: Proceedings of the ISPSD, Toulouse (2000) Singh, R., et al: 1500 V 4 Amp 4H-SiC JBS diodes. In: Proceedings of the ISPSD, Toulouse (2000)
[Spe65]
[Sze81]
go back to reference Sze, S.M.: Physics of semiconductor devices. Wiley, New York (1981) Sze, S.M.: Physics of semiconductor devices. Wiley, New York (1981)
[Tre01]
go back to reference Treu, M., Rupp, M., Kapels, H., Bartsch, W.: Mater. Sci. Forum 353–356, 679–682 (2001)CrossRef Treu, M., Rupp, M., Kapels, H., Bartsch, W.: Mater. Sci. Forum 353–356, 679–682 (2001)CrossRef
[Win12]
[Zve01]
go back to reference Zverev, I., et al: SiC Schottky rectifiers: performance, reliability and key application. In: Proceedings of the 9th EPE, Graz (2001) Zverev, I., et al: SiC Schottky rectifiers: performance, reliability and key application. In: Proceedings of the 9th EPE, Graz (2001)
Metadata
Title
Schottky Diodes
Authors
Josef Lutz
Heinrich Schlangenotto
Uwe Scheuermann
Rik De Doncker
Copyright Year
2018
DOI
https://doi.org/10.1007/978-3-319-70917-8_6