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Published in: Journal of Cryptographic Engineering 3/2015

01-09-2015 | Regular Paper

Security analysis of concurrent error detection against differential fault analysis

Authors: Xiaofei Guo, Debdeep Mukhopadhyay, Chenglu Jin, Ramesh Karri

Published in: Journal of Cryptographic Engineering | Issue 3/2015

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Abstract

Differential fault analysis (DFA) poses a significant threat to advanced encryption standard (AES). Only a single faulty ciphertext is required to extract the secret key. Concurrent error detection (CED) is widely used to protect AES against DFA. Traditionally, these CEDs are evaluated with uniformly distributed faults, the resulting fault coverage indicates the security of CEDs against DFA. However, DFA-exploitable faults, which are a small subspace of the entire fault space, are not uniformly distributed. Therefore, fault coverage does not accurately measure the security of the CEDs against DFA. We provide a systematic study of DFA of AES and show that an attacker can inject biased faults to improve the success rate of the attacks. We propose fault entropy (FE) and fault differential entropy (FDE) to evaluate CEDs. We show that most CEDs with high fault coverage are not secure when evaluated with FE and FDE. This work challenges the traditional use of fault coverage for uniformly distributed faults as a metric for evaluating the security of CEDs against DFA.

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Appendix
Available only for authorised users
Footnotes
1
Appendix A describes the AES encryption algorithm.
 
2
Classic fault model, such as permanent single bit stuck-at faults, is not relevant for DFA.
 
3
Single, stuck-at fault model. The assumption of random fault in DFA is not relevant.
 
4
The number of faults is calculated with an assumption that the faults are injected at the input to the round. If the faults can be injected anywhere in the AES round, all these numbers can be proportionally scaled.
 
5
In practice, it may be subjected to clock, power, laser, or EM injection attack, but it is relatively feasible and affordable to use multiple countermeasures on the checker. To defend against clock glitch attack, one can use dual rail logic style [50]. To defend against power or EM pulse attack, one can use a power supply noise detector for the checker [40]. To defend against laser, one can use shielding [16].
 
6
This is demonstrated using clock glitch in Dutertre et al. [21].
 
7
This is demonstrated using laser in Canivet et al. [13].
 
8
For more details, we refer to [19].
 
9
The evaluation is similar to the attack presented in Lashermes et al. [34].
 
10
\(i\) and \(j\) are the row and column indices of the state matrix, respectively. Appendix 7.1 contains the detail of the AES algorithm.
 
11
The details of SubBytes are in Appendix A.
 
12
This means eight bit binary value in hex.
 
13
We compute the difference between the fault-free and the faulty 10th round input.
 
Literature
1.
go back to reference Agoyan, M., Dutertre, J.M., Mirbaha, A.P., Naccache, D., Ribotta, A.L., Tria, A.: How to Flip a Bit? IOLTS pp. 235–239 (2010) Agoyan, M., Dutertre, J.M., Mirbaha, A.P., Naccache, D., Ribotta, A.L., Tria, A.: How to Flip a Bit? IOLTS pp. 235–239 (2010)
2.
go back to reference Agoyan, M., Dutertre, J.M., Naccache, D., Robisson, B., Tria, A.: When clocks fail: on critical paths and clock faults. In: Proc. CARDIS, pp. 182–193 (2010) Agoyan, M., Dutertre, J.M., Naccache, D., Robisson, B., Tria, A.: When clocks fail: on critical paths and clock faults. In: Proc. CARDIS, pp. 182–193 (2010)
3.
go back to reference Ali, S.S., Mukhopadhyay, D.: A differential fault analysis on AES key schedule using single fault. In: 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2011, Tokyo, Japan, September 29, 2011, pp. 35–42 (2011) Ali, S.S., Mukhopadhyay, D.: A differential fault analysis on AES key schedule using single fault. In: 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2011, Tokyo, Japan, September 29, 2011, pp. 35–42 (2011)
4.
go back to reference Ali, S.S., Mukhopadhyay, D.: Differential fault analysis of AES-128 key schedule using a single multi-byte fault. In: Smart Card Research and Advanced Applications - 10th IFIP WG 8.8/11.2 International Conference, CARDIS 2011, Leuven, Belgium, September 14–16, 2011, Revised Selected Papers, pp. 50–64 (2011) Ali, S.S., Mukhopadhyay, D.: Differential fault analysis of AES-128 key schedule using a single multi-byte fault. In: Smart Card Research and Advanced Applications - 10th IFIP WG 8.8/11.2 International Conference, CARDIS 2011, Leuven, Belgium, September 14–16, 2011, Revised Selected Papers, pp. 50–64 (2011)
5.
go back to reference Ali, S.S., Mukhopadhyay, D.: An improved differential fault analysis on AES-256. In: Progress in Cryptology - AFRICACRYPT 2011: 4th International Conference on Cryptology in Africa, Dakar, Senegal, July 5–7, 2011, Proceedings, pp. 332–347 (2011) Ali, S.S., Mukhopadhyay, D.: An improved differential fault analysis on AES-256. In: Progress in Cryptology - AFRICACRYPT 2011: 4th International Conference on Cryptology in Africa, Dakar, Senegal, July 5–7, 2011, Proceedings, pp. 332–347 (2011)
6.
go back to reference Ali, S.S., Mukhopadhyay, D., Tunstall, M.: Differential fault analysis of AES: towards reaching its limits. J. Cryptogr. Eng. 3, 73–97 (2013) Ali, S.S., Mukhopadhyay, D., Tunstall, M.: Differential fault analysis of AES: towards reaching its limits. J. Cryptogr. Eng. 3, 73–97 (2013)
7.
go back to reference Amiel, F., Clavier, C., Tunstall, M.: Fault analysis of dpa-resistant algorithms. FDTC, pp. 223–236 (2006) Amiel, F., Clavier, C., Tunstall, M.: Fault analysis of dpa-resistant algorithms. FDTC, pp. 223–236 (2006)
8.
go back to reference Barenghi, A., Breveglieri, L., Koren, I., Naccache, D.: Fault injection attacks on cryptographic devices: theory, practice, and countermeasures. Proc. IEEE 100(11), 3056–3076 (2012)CrossRef Barenghi, A., Breveglieri, L., Koren, I., Naccache, D.: Fault injection attacks on cryptographic devices: theory, practice, and countermeasures. Proc. IEEE 100(11), 3056–3076 (2012)CrossRef
9.
go back to reference Barenghi, A., Hocquet, C., Bol, D., Standaert, F.X., Regazzoni, F., Koren, I.: Exploring the Feasibility of low cost fault injection attacks on sub-threshold devices through an example of a 65 nm AES implementation, pp. 48–60 (2011) Barenghi, A., Hocquet, C., Bol, D., Standaert, F.X., Regazzoni, F., Koren, I.: Exploring the Feasibility of low cost fault injection attacks on sub-threshold devices through an example of a 65 nm AES implementation, pp. 48–60 (2011)
10.
go back to reference Battistello, A., Giraud, C.: Fault analysis of infective AES computations. FDTC, pp. 101–107 (2013) Battistello, A., Giraud, C.: Fault analysis of infective AES computations. FDTC, pp. 101–107 (2013)
11.
go back to reference Bertoni, G., Breveglieri, L., Koren, I., Maistri, P., Piuri, V.: Error analysis and detection procedures for a hardware implementation of the advanced encryption standard. IEEE Trans. Comput. 52(4), 492–505 (2003)CrossRef Bertoni, G., Breveglieri, L., Koren, I., Maistri, P., Piuri, V.: Error analysis and detection procedures for a hardware implementation of the advanced encryption standard. IEEE Trans. Comput. 52(4), 492–505 (2003)CrossRef
12.
go back to reference Blömer, J., Seifert, J.P.: Fault Based cryptanalysis of the advanced encryption standard. FC, pp. 162–181 (2003) Blömer, J., Seifert, J.P.: Fault Based cryptanalysis of the advanced encryption standard. FC, pp. 162–181 (2003)
14.
go back to reference Breveglieri, L., Koren, I., Maistri, P.: An Operation-centered approach to fault detection in symmetric cryptography ciphers. IEEE Trans. Comput. 56, 635–649 (2007)MathSciNetCrossRef Breveglieri, L., Koren, I., Maistri, P.: An Operation-centered approach to fault detection in symmetric cryptography ciphers. IEEE Trans. Comput. 56, 635–649 (2007)MathSciNetCrossRef
15.
go back to reference Briais, S., Cioranesco, J.M., Danger, J.L., Guilley, S., Naccache, D., Porteboeuf, T.: Random active shield. FDTC, pp. 103–113 (2012) Briais, S., Cioranesco, J.M., Danger, J.L., Guilley, S., Naccache, D., Porteboeuf, T.: Random active shield. FDTC, pp. 103–113 (2012)
16.
go back to reference Canivet, G., Clediere, J., Ferron, J., Valette, F., Renaudin, M., Leveugle, R.: Detailed analyses of single laser shot effects in the configuration of a Virtex-II FPGA. IOLTS, pp. 289–294 (2008) Canivet, G., Clediere, J., Ferron, J., Valette, F., Renaudin, M., Leveugle, R.: Detailed analyses of single laser shot effects in the configuration of a Virtex-II FPGA. IOLTS, pp. 289–294 (2008)
17.
go back to reference Canivet, G., Maistri, P., Leveugle, R., Clédière, J., Valette, F., Renaudin, M.: Glitch and laser fault attacks onto a secure aes implementation on a sram-based fpga. J. Cryptol. 24 (2011) Canivet, G., Maistri, P., Leveugle, R., Clédière, J., Valette, F., Renaudin, M.: Glitch and laser fault attacks onto a secure aes implementation on a sram-based fpga. J. Cryptol. 24 (2011)
18.
go back to reference Chih-Hsu, Y., Bing-Fei, W.: Simple error detection methods for hardware implementation of advanced encryption standard. IEEE Trans. Comput. 55(6), 730–731 (2006) Chih-Hsu, Y., Bing-Fei, W.: Simple error detection methods for hardware implementation of advanced encryption standard. IEEE Trans. Comput. 55(6), 730–731 (2006)
19.
go back to reference Cover, T.M., Thomas, J.A.: Elements of information theory. Wiley (1991) Cover, T.M., Thomas, J.A.: Elements of information theory. Wiley (1991)
20.
go back to reference Dehbaoui, A., Dutertre, J., Robisson, B., Tria, A.: Electromagnetic transient faults injection on a hardware and a software implementations of AES. In: Proc. IEEE FDTC, pp. 7–15 (2012) Dehbaoui, A., Dutertre, J., Robisson, B., Tria, A.: Electromagnetic transient faults injection on a hardware and a software implementations of AES. In: Proc. IEEE FDTC, pp. 7–15 (2012)
21.
go back to reference Dutertre, J.M., Fournier, J., Mirbaha, A.P., Naccache, D., Rigaud, J.B., Robisson, B., Tria, A.: Review of fault injection mechanisms and consequences on countermeasures design. DTIS, pp. 1–6 (2011) Dutertre, J.M., Fournier, J., Mirbaha, A.P., Naccache, D., Rigaud, J.B., Robisson, B., Tria, A.: Review of fault injection mechanisms and consequences on countermeasures design. DTIS, pp. 1–6 (2011)
22.
go back to reference Giraud, C.: DFA on AES. AES, pp. 27–41 (2005) Giraud, C.: DFA on AES. AES, pp. 27–41 (2005)
23.
go back to reference Guo, X., Karri, R.: Invariance-based concurrent error detection for advanced encryption standard. In: Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE, 3–7 June 2012, San Francisco, CA, 573–578 (2012) Guo, X., Karri, R.: Invariance-based concurrent error detection for advanced encryption standard. In: Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE, 3–7 June 2012, San Francisco, CA, 573–578 (2012)
24.
go back to reference Guo, X., Karri, R.: Recomputing with permuted operands: a concurrent error detection approach. IEEE Trans. CAD 32(10), 1595–1608 (2013)CrossRef Guo, X., Karri, R.: Recomputing with permuted operands: a concurrent error detection approach. IEEE Trans. CAD 32(10), 1595–1608 (2013)CrossRef
25.
go back to reference Guo, X., Mukhopadhyay, D., Jin, C., Karri, R.: NREPO: normal basis recomputing with permuted operands. In: IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2014, pp. 118–123 (2014) Guo, X., Mukhopadhyay, D., Jin, C., Karri, R.: NREPO: normal basis recomputing with permuted operands. In: IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2014, pp. 118–123 (2014)
26.
go back to reference Jarvinen, K., Blondeau, C., Page, D., Tunstall, M.: Harnessing biased faults in attacks on ECC-based signature schemes. FDTC, pp. 72–82 (2012) Jarvinen, K., Blondeau, C., Page, D., Tunstall, M.: Harnessing biased faults in attacks on ECC-based signature schemes. FDTC, pp. 72–82 (2012)
27.
go back to reference Joye, M., Manet, P., Rigaud, J.: Strengthening hardware AES implementations against fault attack. IET Inf. Sec. 1, 106–110 (2007)CrossRef Joye, M., Manet, P., Rigaud, J.: Strengthening hardware AES implementations against fault attack. IET Inf. Sec. 1, 106–110 (2007)CrossRef
28.
go back to reference Kaminsky, A., Kurdziel, M., Radziszowski, S.: An overview of cryptanalysis research for the advanced encryption standard. MILCOM, pp. 1310–1316 (2010) Kaminsky, A., Kurdziel, M., Radziszowski, S.: An overview of cryptanalysis research for the advanced encryption standard. MILCOM, pp. 1310–1316 (2010)
29.
go back to reference Karaklajić, D., Schmidt, J.M., Verbauwhede, I.: Hardware designer’s guide to fault attacks. IEEE Trans. VLSI 21(12), 2295–2306 (2013)CrossRef Karaklajić, D., Schmidt, J.M., Verbauwhede, I.: Hardware designer’s guide to fault attacks. IEEE Trans. VLSI 21(12), 2295–2306 (2013)CrossRef
30.
go back to reference Karpovsky, M., Kulikowski, K.J., Taubin, A.: Robust protection against fault-injection attacks of smart cards implementing the advanced encryption standard. DNS, pp. 93–101 (2004) Karpovsky, M., Kulikowski, K.J., Taubin, A.: Robust protection against fault-injection attacks of smart cards implementing the advanced encryption standard. DNS, pp. 93–101 (2004)
31.
go back to reference Karri, R., Wu, K., Mishra, P., Kim, Y.: Concurrent error detection schemes of fault based side-channel cryptanalysis of symmetric block ciphers. IEEE Trans. CAD 21(12), 1509–1517 (2002)CrossRef Karri, R., Wu, K., Mishra, P., Kim, Y.: Concurrent error detection schemes of fault based side-channel cryptanalysis of symmetric block ciphers. IEEE Trans. CAD 21(12), 1509–1517 (2002)CrossRef
32.
go back to reference Khelil, F., Hamdi, M., Guilley, S., Danger, J.L., Selmane, N.: Fault analysis attack on an aes fpga implementation. In: Proc. New Technologies, Mobility and Security, pp. 1–5 (2008) Khelil, F., Hamdi, M., Guilley, S., Danger, J.L., Selmane, N.: Fault analysis attack on an aes fpga implementation. In: Proc. New Technologies, Mobility and Security, pp. 1–5 (2008)
33.
go back to reference Kim, C.H.: Differential fault analysis against AES-192 and AES-256 with minimal faults. FDTC, pp. 3–9 (2010) Kim, C.H.: Differential fault analysis against AES-192 and AES-256 with minimal faults. FDTC, pp. 3–9 (2010)
34.
go back to reference Lashermes, R., Reymond, G., Dutertre, J., Fournier, J., Robisson, B., Tria, A.: A DFA on AES based on the entropy of error distributions. FDTC, pp. 34–43 (2012) Lashermes, R., Reymond, G., Dutertre, J., Fournier, J., Robisson, B., Tria, A.: A DFA on AES based on the entropy of error distributions. FDTC, pp. 34–43 (2012)
35.
go back to reference Li, Y., Sakiyama, K., Gomisawa, S., Fukunaga, T., Takahashi, J., Ohta, K.: Fault sensitivity analysis. In: Proc. CHES, pp. 320–334 (2010) Li, Y., Sakiyama, K., Gomisawa, S., Fukunaga, T., Takahashi, J., Ohta, K.: Fault sensitivity analysis. In: Proc. CHES, pp. 320–334 (2010)
36.
go back to reference Mozaffari-Kermani, M., Reyhani-Masoleh, A.: Concurrent structure-independent fault detection schemes for the advanced encryption standard. IEEE Trans. Comput. 59(5), 608–622 (2010) Mozaffari-Kermani, M., Reyhani-Masoleh, A.: Concurrent structure-independent fault detection schemes for the advanced encryption standard. IEEE Trans. Comput. 59(5), 608–622 (2010)
37.
go back to reference Maistri, P.: Countermeasures against fault attacks: the good, the bad, and the ugly. IOLTS, pp. 134–137 (2011) Maistri, P.: Countermeasures against fault attacks: the good, the bad, and the ugly. IOLTS, pp. 134–137 (2011)
38.
go back to reference Maistri, P., Leveugle, R.: Double-data-rate computation as a countermeasure against fault analysis. IEEE Trans. Comput. 57(11), 1528–1539 (2008)MathSciNetCrossRef Maistri, P., Leveugle, R.: Double-data-rate computation as a countermeasure against fault analysis. IEEE Trans. Comput. 57(11), 1528–1539 (2008)MathSciNetCrossRef
39.
go back to reference Malkin, T., Standaert, F.X., Yung, M.: A comparative cost/security analysis of fault attack countermeasures. FDTC, pp. 109–123 (2005) Malkin, T., Standaert, F.X., Yung, M.: A comparative cost/security analysis of fault attack countermeasures. FDTC, pp. 109–123 (2005)
40.
go back to reference Metra, C., Schiano, L., Favalli, M.: Concurrent detection of power supply noise. IEEE Trans. Reliab. 52(4), 469–475 (2003)CrossRef Metra, C., Schiano, L., Favalli, M.: Concurrent detection of power supply noise. IEEE Trans. Reliab. 52(4), 469–475 (2003)CrossRef
41.
go back to reference Moradi, A., Shalmani, M.T.M., Salmasizadeh, M.: A generalized method of differential fault attack against AES cryptosystem. In: Proc. CHES, pp. 91–100 (2006) Moradi, A., Shalmani, M.T.M., Salmasizadeh, M.: A generalized method of differential fault attack against AES cryptosystem. In: Proc. CHES, pp. 91–100 (2006)
42.
go back to reference Mozaffari-Kermani, M., Reyhani-Masoleh, A.: A lightweight high-performance fault detection scheme for the advanced encryption standard using composite field. IEEE Trans. VLSI 19(1), 85–91 (2011)CrossRef Mozaffari-Kermani, M., Reyhani-Masoleh, A.: A lightweight high-performance fault detection scheme for the advanced encryption standard using composite field. IEEE Trans. VLSI 19(1), 85–91 (2011)CrossRef
43.
go back to reference Mukhopadhyay, D.: An improved fault based attack of the advanced encryption standard. AFRICACRYPT, pp. 421–434 (2009) Mukhopadhyay, D.: An improved fault based attack of the advanced encryption standard. AFRICACRYPT, pp. 421–434 (2009)
45.
go back to reference Dusart, P., L, G., Vivolo, O.: Differential fault analysis on AES. Cryptology ePrint Archive (2003) Dusart, P., L, G., Vivolo, O.: Differential fault analysis on AES. Cryptology ePrint Archive (2003)
46.
go back to reference Piret, G., Quisquater, J.: A differential fault attack technique against spn structures, with application to the AES and Khazad. In: Proc. CHES, pp. 77–88 (2003) Piret, G., Quisquater, J.: A differential fault attack technique against spn structures, with application to the AES and Khazad. In: Proc. CHES, pp. 77–88 (2003)
47.
go back to reference Saha, D., Mukhopadhyay, D., Chowdhury, D.R.: A diagonal fault attack on the advanced encryption standard. IACR Cryptology ePrint Archive, p. 581 (2009) Saha, D., Mukhopadhyay, D., Chowdhury, D.R.: A diagonal fault attack on the advanced encryption standard. IACR Cryptology ePrint Archive, p. 581 (2009)
48.
go back to reference Sakiyama, K., Li, Y., Ohta, K., Iwamoto, M.: Information-theoretic approach to optimal differential fault analysis. IEEE Trans. Inf. Forensics Secur. 7(1), 109–120 (2012)CrossRef Sakiyama, K., Li, Y., Ohta, K., Iwamoto, M.: Information-theoretic approach to optimal differential fault analysis. IEEE Trans. Inf. Forensics Secur. 7(1), 109–120 (2012)CrossRef
49.
go back to reference Satoh, A., Sugawara, T., Homma, N., Aoki, T.: High-performance concurrent error detection scheme for AES hardware. In: Proc. CHES, pp. 100–112 (2008) Satoh, A., Sugawara, T., Homma, N., Aoki, T.: High-performance concurrent error detection scheme for AES hardware. In: Proc. CHES, pp. 100–112 (2008)
50.
go back to reference Selmane, N., Bhasin, S., Guilley, S., Graba, T., Danger, J.L.: WDDL is protected against setup time violation attacks. FDTC, pp. 73–83 (2009) Selmane, N., Bhasin, S., Guilley, S., Graba, T., Danger, J.L.: WDDL is protected against setup time violation attacks. FDTC, pp. 73–83 (2009)
51.
go back to reference Selmane, N., Guilley, S., Danger, J.L.: Practical setup time violation attacks on aes. EDCC, pp. 91–96 (2008) Selmane, N., Guilley, S., Danger, J.L.: Practical setup time violation attacks on aes. EDCC, pp. 91–96 (2008)
52.
go back to reference Takahashi, J., Fukunaga, T., Yamakoshi, K.: DFA mechanism on the AES key schedule. FDTC, pp. 62–74 (2007) Takahashi, J., Fukunaga, T., Yamakoshi, K.: DFA mechanism on the AES key schedule. FDTC, pp. 62–74 (2007)
53.
go back to reference Tunstall, M., Mukhopadhyay, D., Ali, S.: Differential fault analysis of the advanced encryption standard using a single fault. WISTP, pp. 224–233 (2011) Tunstall, M., Mukhopadhyay, D., Ali, S.: Differential fault analysis of the advanced encryption standard using a single fault. WISTP, pp. 224–233 (2011)
54.
go back to reference Wu, K., Karri, R., Kuznetsov, G., Goessel, M.: Low cost concurrent error detection for the advanced encryption standard. ITC, pp. 1242–1248 (2004) Wu, K., Karri, R., Kuznetsov, G., Goessel, M.: Low cost concurrent error detection for the advanced encryption standard. ITC, pp. 1242–1248 (2004)
56.
go back to reference Yumbul, K., Erdem, S., Savas, E.: On selection of modulus of quadratic codes for the protection of cryptographic operations against fault attacks. IEEE Trans. Comput. (99), 1 (PP) (2012) Yumbul, K., Erdem, S., Savas, E.: On selection of modulus of quadratic codes for the protection of cryptographic operations against fault attacks. IEEE Trans. Comput. (99), 1 (PP) (2012)
Metadata
Title
Security analysis of concurrent error detection against differential fault analysis
Authors
Xiaofei Guo
Debdeep Mukhopadhyay
Chenglu Jin
Ramesh Karri
Publication date
01-09-2015
Publisher
Springer Berlin Heidelberg
Published in
Journal of Cryptographic Engineering / Issue 3/2015
Print ISSN: 2190-8508
Electronic ISSN: 2190-8516
DOI
https://doi.org/10.1007/s13389-014-0092-8

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