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Published in:
Electronic Structure of Atoms Read chapter Read first chapter

2019 | OriginalPaper | Chapter

18. Semiconductor Characterization Techniques

Author : Manijeh Razeghi

Published in: Fundamentals of Solid State Engineering

Publisher: Springer International Publishing

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Abstract

Semiconductor characterization techniques are used in order to gain knowledge on the physical properties of a semiconductor crystal. The process is similar to decoding the DNA sequence of a living organism as it involves understanding the nanoscale structure of the crystal, i.e., its atoms, electrons, structures, and interactions with the surrounding environment. The knowledge gained from the characterization process is essential in determining whether the semiconductor crystal probed is suitable for a particular device component with certain functionalities.

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previous chapter Compound Semiconductors and Crystal Growth Techniques
next chapter Defects
Appendix
Available only for authorised users
Literature
Ohring M (1992) The materials science of thin films. Academic Press, San DiegoMATH
Williams DB, Carter CB (1996) Transmission electron microscopy. Plenum Press, New YorkCrossRef
Long DA (1977) Raman spectroscopy. McGraw-Hill, New York
Perkowitz S (1993) Optical characterization of semiconductors: infrared, Raman, and photoluminescence spectroscopy. Academic Press, London
Razeghi M (1989) The MOCVD challenge volume 1: a survey of GaInAsP-InP for photonic and electronic applications. Adam Hilger, Bristol
Razeghi M (1995) The MOCVD challenge volume 2: a survey of GaInAsP-GaAs for photonic and electronic device applications. Institute of Physics, Bristol, pp 21–29
Stradling RA, Klipstein PC (1990) Growth and characterization of semiconductors. Adam Hilger, New York
Warren BE (1990) X-ray diffraction. Dover Publications, New York
Metadata
Title
Semiconductor Characterization Techniques
Author
Manijeh Razeghi
Copyright Year
2019
Book
Fundamentals of Solid State Engineering

Print ISBN: 978-3-319-75707-0

Electronic ISBN: 978-3-319-75708-7

Copyright Year: 2019

DOI
https://doi.org/10.1007/978-3-319-75708-7_18