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Semiconductors

Issue 3/2011

Content (24 Articles)

Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion)

Mechanisms of defect formation in ingots of 4H silicon carbide polytype

D. D. Avrov, A. V. Bulatov, S. I. Dorozhkin, A. O. Lebedev, Yu. M. Tairov, A. Yu. Fadeev

Electronic Properties of Semiconductors

The I–V characteristics of asymmetrically necked samples of high-resistivity silicon

S. Ašmontas, V. Kleiza

Electronic Properties of Semiconductors

Effect of temperature on electron spectra in the region of the intrinsic-absorption edge of CdGa2Se4

T. G. Kerimova, R. A. Guliyev

Spectroscopy, Interaction with Radiation

A model of nonlinear optical transmittance for insulator nanocomposites

V. P. Dzyuba, A. E. Krasnok, J. N. Kulchin, I. V. Dzyuba

Surfaces, Interfaces, and Thin Films

Specific features of amorphous silicon layers grown by plasma-enhanced chemical vapor deposition with tetrafluorosilane

J. S. Vainshtein, O. I. Kon’kov, A. V. Kukin, O. S. El’tsina, L. V. Belyakov, E. I. Terukov, O. M. Sreseli

Surfaces, Interfaces, and Thin Films

Raman scattering in self-formed nanoporous carbon produced on the basis of silicon carbide

M. E. Kompan, D. S. Krylov, V. V. Sokolov

Surfaces, Interfaces, and Thin Films

Mechanisms of current flow in Au-CdTe contacts with a modified surface

V. P. Machnij, N. J. Skrypnyk

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Optical constants detection in tin dioxide nano-size layers by surface plasmon resonance investigation

B. K. Serdega, I. E. Matyash, L. S. Maximenko, S. P. Rudenko, V. A. Smyntyna, V. S. Grinevich, L. N. Filevskaya, B. Ulug, A. Ulug, B. M. Yücel

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Photoreflectance spectroscopy of electron-hole states in a graded-width GaAs/InGaAs/GaAs quantum well

L. P. Avakyants, P. Yu. Bokov, E. V. Glazyrin, I. P. Kazakov, A. V. Chervyakov

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Silicon-on-insulator structures with a nitrogenated buried SiO2 layer: Preparation and properties

I. E. Tyschenko, V. P. Popov

Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors

Structure and properties of small clusters of transition 3d-element oxides

A. V. Popov

Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors

Carrier transport in layered semiconductor (p-GaSe)-ferroelectric (KNO3) composite nanostructures

A. P. Bakhtinov, V. N. Vodopyanov, Z. D. Kovalyuk, V. V. Netyaga, D. Yu. Konoplyanko

Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors

Study of the processes of carbonization and oxidation of porous silicon by Raman and IR spectroscopy

A. V. Vasin, P. N. Okholin, I. N. Verovsky, A. N. Nazarov, V. S. Lysenko, K. I. Kholostov, V. P. Bondarenko, Y. Ishikawa

Physics of Semiconductor Devices

Analysis of spatial modes in half-disk lasers based on AlGaAsSb/InGaAsSb quantum well nanoheterostructures

A. N. Imenkov, V. V. Sherstnev, E. A. Grebenshchikova, M. A. Sipovskaya, M. I. Larchenkov, D. I. Tarasov, A. N. Baranov, Yu. P. Yakovlev

Physics of Semiconductor Devices

Laminated grid solar cells (LGCells) on multicrystalline silicon. Application of atomic hydrogen treatment

G. G. Untila, T. N. Kost, A. B. Chebotareva, M. E. Belousov, V. A. Samorodov, A. Yu. Poroykov, M. A. Timofeyev, M. B. Zaks, A. M. Sitnikov, O. I. Solodukha

Physics of Semiconductor Devices

HgCdTe heterostructures on Si (310) substrates for midinfrared focal plane arrays

M. V. Yakushev, D. V. Brunev, V. S. Varavin, V. V. Vasilyev, S. A. Dvoretskii, I. V. Marchishin, A. V. Predein, I. V. Sabinina, Yu. G. Sidorov, A. V. Sorochkin

Fabrication, Treatment, and Testing of Materials and Structures

Characterization of single-crystal diamond grown from the vapor phase on substrates of natural diamond

A. A. Altukhov, A. L. Vikharev, A. M. Gorbachev, M. P. Dukhnovsky, V. E. Zemlyakov, K. N. Ziablyuk, A. V. Mitenkin, A. B. Muchnikov, D. B. Radishev, A. K. Ratnikova, Yu. Yu. Fedorov

Fabrication, Treatment, and Testing of Materials and Structures

The influence of hydrogenation on the electrical properties of the Cd x Hg1 − x Te epitaxial structures

V. S. Varavin, G. Yu. Sidorov, M. O. Garifullin, A. V. Vishnyakov, Yu. G. Sidorov

Fabrication, Treatment, and Testing of Materials and Structures

Investigation of the local density of states in self-assembled GeSi/Si(001) nanoislands by combined scanning tunneling and atomic-force microscopy

P. A. Borodin, A. A. Bukharaev, D. O. Filatov, M. A. Isakov, V. G. Shengurov, V. Yu. Chalkov, Yu. A. Denisov

Fabrication, Treatment, and Testing of Materials and Structures

The effect of composition on the formation of light-emitting Si nanostructures in SiO x layers on irradiation with swift heavy ions

G. A. Kachurin, S. G. Cherkova, D. V. Marin, V. G. Kesler, V. A. Skuratov, A. G. Cherkov

Fabrication, Treatment, and Testing of Materials and Structures

Effect of the silicon doping level and features of nanostructural arrangement on decrease in external quantum efficiency in InGaN/GaN light-emitting diodes with increasing current

B. Ya. Ber, E. V. Bogdanova, A. A. Greshnov, A. L. Zakgeim, D. Yu. Kazanzev, A. P. Kartashova, A. S. Pavluchenko, A. E. Chernyakov, E. I. Shabunina, N. M. Shmidt, E. B. Yakimov

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