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Published in:
2005 | OriginalPaper | Chapter
SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers
Authors : H.P. Oepen, H. Hopster
Published in: Magnetic Microscopy of Nanostructures
Publisher: Springer Berlin Heidelberg
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Scanning electron microscopy with polarization analysis (SEMPA) has developed into a powerful technique to study domains in ultrathin films. In this chapter, we discuss from a very general point of view the instrumental aspects of the method. Examples of thin film investigations are given that demonstrate unique features of SEMPA. New solutions around apparent limitations of the technique are presented at the end, i.e., analyzing samples with contaminated surfaces and imaging in external fields.