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Published in: Microsystem Technologies 5/2010

01-05-2010 | Technical Paper

Shallow and deep dry etching of silicon using ICP cryogenic reactive ion etching process

Authors: Ü. Sökmen, A. Stranz, S. Fündling, S. Merzsch, R. Neumann, H.-H. Wehmann, E. Peiner, A. Waag

Published in: Microsystem Technologies | Issue 5/2010

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Abstract

We achieved to etch nanostructures as well as structures with high aspect ratios in silicon using an inductively coupled plasma cryogenic deep reactive ion etching process. We etched cantilevers, submicron diameter pillars, membranes and deep structures in silicon with etch rates between 13 nm/min and 4 μm/min. These structures find applications as templates for metal organic vapour phase epitaxial growth of GaN-based nanostructures for optoelectronic devices or they are the basic constituents of a nanoparticle balance in the subnanogram range and of a thermoelectric generator.

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Metadata
Title
Shallow and deep dry etching of silicon using ICP cryogenic reactive ion etching process
Authors
Ü. Sökmen
A. Stranz
S. Fündling
S. Merzsch
R. Neumann
H.-H. Wehmann
E. Peiner
A. Waag
Publication date
01-05-2010
Publisher
Springer-Verlag
Published in
Microsystem Technologies / Issue 5/2010
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-010-1035-7

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