Skip to main content
Top

2022 | OriginalPaper | Chapter

10. Simulated Size Effects Relationships Motivated by the Load-Sharing Cell Model

Authors : James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng, Fabrizio Ruggeri

Published in: Fiber Bundles

Publisher: Springer International Publishing

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

In this chapter, we discuss the load-sharing (LS) cell model and size effects raised regarding Figure 14 data. The data in Figure 14 is generated from static loading tests where three different protocols are considered. Here, the cycle time to failure is from an accelerated failure time (AFT) perspective where the load-sharing directly reduces the cycle lifetime. That is, the role of increased voltage to voltage BD is functionally replaced by increased time or the number of cycles to cycle breakdown.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Footnotes
1
Such curvature is very apparent in the raw Weibull plots given in Figure 5 of Ntenga et al. (2019). These plots are for the tensile strength of plant fibers (PFs). The authors use a Weibull in their analysis even though they note that a lognormal has a better fit due to this curvature. However, “PF properties are considerably influenced by their hierarchic composite microstructure” that consists of “cellulose microfibrils about the axis of the fibre.” This suggests that a chain-of-bundles may be an appropriate model for the PF and that the curvature could be due to a finite weakest link size effect discussed earlier in Chap. 4 and later, below.
 
Literature
go back to reference Bažant, Z. P., & Le, J.-L. (2017). Probabilistic mechanics of quasibrittle structures—strength, lifetime, and size effect. Cambridge University Press.CrossRefMATH Bažant, Z. P., & Le, J.-L. (2017). Probabilistic mechanics of quasibrittle structures—strength, lifetime, and size effect. Cambridge University Press.CrossRefMATH
go back to reference Kim, Y.-H., & Lee, J. C. (2004). Reliability characteristics of high-k dielectrics. Microelectronics Reliability, 44(2), 183–193.CrossRef Kim, Y.-H., & Lee, J. C. (2004). Reliability characteristics of high-k dielectrics. Microelectronics Reliability, 44(2), 183–193.CrossRef
go back to reference Le, J.-L. (2012). A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress. Microelectronics Reliability, 52(1), 100–106.CrossRef Le, J.-L. (2012). A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress. Microelectronics Reliability, 52(1), 100–106.CrossRef
go back to reference Le, J.-L., Bažant, Z. P., & Bazant, M. Z. (2009). Lifetime of high-k gate dielectrics and analogy with strength of quasibrittle structures. Journal of Applied Physics, 106(10), 104119.CrossRef Le, J.-L., Bažant, Z. P., & Bazant, M. Z. (2009). Lifetime of high-k gate dielectrics and analogy with strength of quasibrittle structures. Journal of Applied Physics, 106(10), 104119.CrossRef
go back to reference Ntenga, R., SAÏDJO, S., Beda, T., & Béakou, A. (2019). Estimation of the effects of the cross-head speed and temperature on the mechanical strength of kenaf bast fibers using Weibull and Monte-Carlo statistics. Fibers, 7(10), 89.CrossRef Ntenga, R., SAÏDJO, S., Beda, T., & Béakou, A. (2019). Estimation of the effects of the cross-head speed and temperature on the mechanical strength of kenaf bast fibers using Weibull and Monte-Carlo statistics. Fibers, 7(10), 89.CrossRef
go back to reference Pirrotta, O., Larcher, L., Lanza, M., Padovani, A., Porti, M., Nafria, M., & Bersuker, G. (2013). Leakage current through the poly-crystalline HfO2: Trap densities at grains and grain boundaries. Journal of Applied Physics, 114, 134503.CrossRef Pirrotta, O., Larcher, L., Lanza, M., Padovani, A., Porti, M., Nafria, M., & Bersuker, G. (2013). Leakage current through the poly-crystalline HfO2: Trap densities at grains and grain boundaries. Journal of Applied Physics, 114, 134503.CrossRef
go back to reference Strong, A. W., Wu, E. Y., Vollertsen, R.-P., Sune, J., La Rosa, G., Rauch III, S. E., & Sullivan, T. D. (2009). Reliability wearout mechanisms in advanced CMOS technologies. John Wiley & Sons.CrossRef Strong, A. W., Wu, E. Y., Vollertsen, R.-P., Sune, J., La Rosa, G., Rauch III, S. E., & Sullivan, T. D. (2009). Reliability wearout mechanisms in advanced CMOS technologies. John Wiley & Sons.CrossRef
go back to reference Taylor, H. M. (1987). A model for the failure process of semicrystalline polymer materials under static fatigue. Probability in the Engineering and Informational Sciences, 1(2), 133–162.CrossRefMATH Taylor, H. M. (1987). A model for the failure process of semicrystalline polymer materials under static fatigue. Probability in the Engineering and Informational Sciences, 1(2), 133–162.CrossRefMATH
go back to reference Zhang, X.-Y., Hsu, C.-H., Lien, S.-Y., Wu, W.-Y., Ou, S.-L., Chen, S.-Y., Huang, W., Zhu, W.-Z., Xiong, F.-B., & Zhang, S. (2019). Temperature-dependent HfO2/Si interface structural evolution and its mechanism. Nanoscale Research Letters, 14(1), 83.CrossRef Zhang, X.-Y., Hsu, C.-H., Lien, S.-Y., Wu, W.-Y., Ou, S.-L., Chen, S.-Y., Huang, W., Zhu, W.-Z., Xiong, F.-B., & Zhang, S. (2019). Temperature-dependent HfO2/Si interface structural evolution and its mechanism. Nanoscale Research Letters, 14(1), 83.CrossRef
Metadata
Title
Simulated Size Effects Relationships Motivated by the Load-Sharing Cell Model
Authors
James U. Gleaton
David Han
James D. Lynch
Hon Keung Tony Ng
Fabrizio Ruggeri
Copyright Year
2022
DOI
https://doi.org/10.1007/978-3-031-14797-5_10

Premium Partners