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Published in:

16-05-2024

Simulation and machine learning based analytical study of single electron transistor (SET)

Authors: Jeet Chatterjee, Jenifa Khatun, Siddhi, Ankit Kumar, Koushik Ghosh, Judhajit Sanyal, Sandip Bhattacharya

Published in: Journal of Computational Electronics | Issue 4/2024

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Abstract

In recent years, the requirement for greater scalability of transistor technology for the continuation of Moore’s law has led researchers toward the investigations of several innovative advanced semiconductor device as potentially superior alternatives to conventional transistors. Among them, single-electron transistors (SETs) have shown considerable promise in terms of performance and reliability with significant device dimension scaling. However, realistic modeling and simulation are the primary steps toward the practical implementation of SET designs. In this work, a technology computer-aided design simulation-based analytical study of silicon quantum dot SETs is developed to improve the electrical characteristics of the devices through optimization of different device parameters. Further, the investigation is extended to explore the temperature dependency of quantum tunneling by analysis of the characteristic plots of such quantum dot-based nano-devices. Moreover, a machine learning (ML)-based approach has been implemented and validated through development and testing of ML models predicting SET device performance by examining dependence of relevant design parameters on device performance. Hence, the proposed model of SETs provides the analytical understanding for a sustainable and realistic design of SETs allowing approaches to future nano-device-based IC design.

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Metadata
Title
Simulation and machine learning based analytical study of single electron transistor (SET)
Authors
Jeet Chatterjee
Jenifa Khatun
Siddhi
Ankit Kumar
Koushik Ghosh
Judhajit Sanyal
Sandip Bhattacharya
Publication date
16-05-2024
Publisher
Springer US
Published in
Journal of Computational Electronics / Issue 4/2024
Print ISSN: 1569-8025
Electronic ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-024-02175-4