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Open Access 2025 | Open Access | Book

Single-Event Effects, from Space to Accelerator Environments

Analysis, Prediction and Hardening by Design

Authors: Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía

Publisher: Springer International Publishing

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About this book

This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.

Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.

Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context

This is an open access book.

Table of Contents

Frontmatter

Open Access

Chapter 1. Radiation Environment and Their Effects on Electronics
Abstract
Reliability evaluation of circuits operating in harsh environments is essential to prevent functional failures and potential catastrophic events. To achieve this, it is important to have a solid understanding of different radiation environments and their effects on matter. This chapter aims to provide the necessary foundations to comprehend the dynamics of radiation environments, including space and Earth’s atmosphere, as well as particle accelerators. Additionally, the chapter explores the prominent effects resulting from the interaction of energetic particles with matter. This knowledge is crucial for developing strategies to mitigate the impact of radiation on circuit reliability and ensure the proper functioning of electronic systems in challenging environments.
Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía

Open Access

Chapter 2. Introduction to Single-Event Effects
Abstract
Radiation effects in state-of-the-art electronics has become a critical concern that goes beyond the traditional systems operating in harsh environments such as in aviation and space missions. Therefore, there is an increased interest in studying these effects as well as in investigating on how to design reliable and fault-tolerant systems that are hardened against radiation. In this chapter, the main stochastic events, known as single-event effects, are presented. Furthermore, the fundamental concepts necessary to understand the problem of radiation effects in electronics are introduced.
Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía

Open Access

Chapter 3. Single-Event Effect Prediction Methodologies
Abstract
The use of circuit modeling and simulation has long been established as a fundamental approach in studying physical phenomena, particularly in the field of electronics for understanding the behavior of MOS transistors. Likewise, in the investigation of electronic components’ susceptibility to radiation effects, numerous models have been developed and documented in the literature to analyze the diverse interaction mechanisms at both the device and circuit levels. This chapter provides an introduction to circuit modeling and simulation techniques specifically tailored for studying single-event effects (SEEs). The aim is to elucidate the underlying principles and methodologies employed in simulating the impact of radiation on electronic circuits. Furthermore, we will outline the multi-scale and multi-physics prediction workflow that will be employed throughout the remainder of this book.
Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía

Open Access

Chapter 4. Radiation Hardening
Abstract
To cope with the threats of a harsh environment containing energetic particles, scientists and engineers have been developing mitigation strategies and hardening techniques to improve the resilience of electronic systems. Considering that the radiation environment and the operation conditions are known, as it will be shown in this chapter, several techniques can be applied to increase the robustness of a circuit. The radiation hardening techniques can be adopted during the manufacturing process of a technology or, in a higher level, in the circuit design phase of the component. While process-based techniques offer undeniable efficiency, hardening techniques at the design level are the main focus of this chapter thanks to their several advantages.
Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía

Open Access

Chapter 5. Analysis of Layout-Based RHBD Techniques
Abstract
Radiation hardening techniques play a pivotal role in enhancing the resilience of VLSI circuits employed in radiation environments, most notably in critical applications such as in space technologies. Building upon the preceding chapter, some Radiation Hardening by Design (RHBD) techniques have been devised to effectively counteract the detrimental impact of radiation on electronic circuits, addressing diverse levels of abstraction ranging from circuit layout to system and software design. This chapter delves into an insightful analysis of the efficacy achieved through layout design techniques, namely Gate Sizing (GS), Transistor Stacking (TS), and Transistor Folding (TF). Moreover, it explores the utilization of asymmetric designs and the innovative Diffusion Splitting (DS) technique as means to augment the hardening efficiency while mitigating the associated area overhead.
Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía

Open Access

Chapter 6. Analysis of Circuit-Based RHBD Techniques
Abstract
This chapter focuses on circuit-level techniques, completing the analysis of radiation hardening by design (RHBD) methods across various design abstraction levels. Here, we evaluate the charge sharing effect, considering its dependence on cell placement and logic synthesis. Subsequently, an optimization methodology is proposed to enhance overall circuit hardness through signal probability–based pin swapping.
Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía
Backmatter
Metadata
Title
Single-Event Effects, from Space to Accelerator Environments
Authors
Ygor Quadros de Aguiar
Frédéric Wrobel
Jean-Luc Autran
Rubén García Alía
Copyright Year
2025
Electronic ISBN
978-3-031-71723-9
Print ISBN
978-3-031-71722-2
DOI
https://doi.org/10.1007/978-3-031-71723-9