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Journal of Electronic Testing

01-04-2013

Soft Fault Classification of Analog Circuits Using Network Parameters and Neural Networks

Authors: A. Kavithamani, V. Manikandan, N. Devarajan

Published in: Journal of Electronic Testing | Issue 2/2013

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Abstract

A new method to identify component faults in analog circuits is proposed using network parameters like driving point impedance, transfer impedance, voltage gain and current gain. Using Monte-Carlo simulation each component of the circuit is varied within its tolerance limit and samples of each network parameter are found for fault free circuit. Similarly all possible single faults are introduced and the corresponding samples of network parameters are found. Fault classification is done through neural network. The proposed method is validated through second order Sallenkey band pass filter. Numerical results are presented to clarify the proposed method and prove its efficiency.

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Literature
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Guo Z, Savir J (2006) Coefficient based test of parametric faults in analog circuits. IEEE Trans Instrum Meas 55:150–157CrossRef
2.
Jantos P, Grzechca D (2008) The influence of global parametric faults on analogue electronic circuits time domain response features. Proceedings of the IEEE-DDECS’08, Slovakia, Europe, April 16–18, 2008.
3.
Kavithamani A, Manikandan V, Devarajan N (2009) Analog circuit fault diagnosis based on bandwidth and fuzzy classifier. Proceedings of international conference, IEEE—TENCON 2009, pp 1–6, Singapore, November 23–26, 2009.
4.
Kavithamani A, Manikandan V, Devarajan N (2011) Analog circuit fault detection using location of poles. Int J Elec Test Theory Appl 27:673–678CrossRef
5.
Kavithamani A, Manikandan V, Devarajan N (2011) Improved coefficient based test for diagnosing parametric faults of analog circuits. Proceedings of International Conference: TENCON 2011, Bali, Indonesia, November 21–24, pp 1–5
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Kavithamani A, Manikandan V, Devarajan N (2012) Fault detection of analog circuits using network parameters. Int J Electron Test Theory Appl 28:257–261CrossRef
7.
Manikandan V, Devarajan N (2007) SBT Approach towards analog circuit fault diagnosis. Active and Passive Electronic Components, Hindawi Publishing Corporation, USA, pp 1–11
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Papakostas DK, Hatzopoulos AA (2008) A unified procedure for fault detection of analog and mixed-mode circuits using magnitude and phase components of the power supply current spectrum. IEEE Trans Instrum Meas 57:2589–2595CrossRef
Metadata
Title
Soft Fault Classification of Analog Circuits Using Network Parameters and Neural Networks
Authors
A. Kavithamani
V. Manikandan
N. Devarajan
Publication date
01-04-2013
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 2/2013
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-013-5370-3