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2019 | OriginalPaper | Chapter

Sparse (P)MOR for Electro-Thermal Coupled Problems with Many Inputs

Authors : Nicodemus Banagaaya, Lihong Feng, Peter Benner

Published in: Nanoelectronic Coupled Problems Solutions

Publisher: Springer International Publishing

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This chapter reviews the recently proposed (parametric) model order reduction methods for electro-thermal (ET) coupled problems with many inputs, arising from (nano-)microelectronic simulation. For non-parametric problems, we discuss the block-diagonal structured model order reduction (MOR) methods (BDSM-ET) proposed in [6, 7]. For parametric problems, we discuss the parametric MOR method for ET coupled problems with many inputs (IpBDSM-ET) proposed in [3]. By construction, these methods lead to sparse reduced-order models (ROMs) and their efficiency is demonstrated using (non-)parametric ET coupled problems from industrial applications.

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Metadata
Title
Sparse (P)MOR for Electro-Thermal Coupled Problems with Many Inputs
Authors
Nicodemus Banagaaya
Lihong Feng
Peter Benner
Copyright Year
2019
DOI
https://doi.org/10.1007/978-3-030-30726-4_14

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