2004 | OriginalPaper | Chapter
Stop Minding Your P’s and Q’s: Implementing a Fast and Simple DFS-Based Planarity Testing and Embedding Algorithm
Authors : John M. Boyer, Pier Francesco Cortese, Maurizio Patrignani, Giuseppe Di Battista
Published in: Graph Drawing
Publisher: Springer Berlin Heidelberg
Included in: Professional Book Archive
Activate our intelligent search to find suitable subject content or patents.
Select sections of text to find matching patents with Artificial Intelligence. powered by
Select sections of text to find additional relevant content using AI-assisted search. powered by
In this paper we give a new description of the planarity testing and embedding algorithm presented by Boyer and Myrvold [2], providing, in our opinion, new insights on the combinatorial foundations of the algorithm. Especially, we give a detailed illustration of a fundamental phase of the algorithm, called walk-up, which was only succinctly illustrated in [2]. Also, we present an implementation of the algorithm and extensively test its efficiency against the most popular implementations of planarity testing algorithms. Further, as a side effect of the test activity, we propose a general overview of the state of the art (restricted to efficiency issues) of the planarity testing and embedding field.