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Published in: Journal of Materials Science: Materials in Electronics 6/2015

01-06-2015

Structural property and optical band edge of Ag(In0.5Al0.5)S2

Authors: Ching-Hwa Ho, Chia-Chi Pan

Published in: Journal of Materials Science: Materials in Electronics | Issue 6/2015

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Abstract

Single crystals of Ag(In0.5Al0.5)S2 were grown by chemical vapor transport using ICl3 as a transport agent. The as-grown Ag(In0.5Al0.5)S2 essentially shows dark red and its absorption edge close to red-to-green energy portion. The stoichiometric content of the Ag(In0.5Al0.5)S2 was evaluated by energy dispersion X-ray spectroscopy. The X-ray diffraction measurement confirmed that the crystal is single phase and crystallized in the chalcopyrite structure. The lattice constants of the crystals were determined to be a = 5.763 ± 0.08 Å and c = 10.623 ± 0.016 Å, respectively. Raman spectroscopy revealed a prominent A1 (282 cm−1) peak (i.e. main characteristic mode), which verified the chalcopyrite structure of the Ag(In0.5Al0.5)S2. The absorption-edge anisotropy of the Ag(In0.5Al0.5)S2 has been studied by polarization-dependent transmission measurements with the linearly polarized lights along \({\text{E}}\parallel \,{ < }11\bar{1}{ > }\) (denoted as E) and along \({\text{E}} \bot \,{ < }11\bar{1}{ > }\) (denoted as E) onto the {112} plane of the crystal. The unpolarized band gap determined by transmission measurement was about 2.31 ± 0.01 eV, which is lying in between the lower E (~2.24 ± 0.01 eV) and higher E (~2.40 ± 0.01 eV) polarized gaps. The absorption-edge anisotropy by the E and E polarizations has been clearly demonstrated herein. On the basis of the experimental results, the structure and optical band edge of the Ag(In0.5Al0.5)S2 is thus realized.

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Literature
1.
go back to reference M.G. Panthani, V. Akhavan, B. Goodfellow, J.P. Schmidtke, L. Dunn, A. Dodabalapur, P.F. Barbara, B.A. Korgel, J. Am. Chem. Soc. 130, 16770 (2008)CrossRef M.G. Panthani, V. Akhavan, B. Goodfellow, J.P. Schmidtke, L. Dunn, A. Dodabalapur, P.F. Barbara, B.A. Korgel, J. Am. Chem. Soc. 130, 16770 (2008)CrossRef
2.
go back to reference N. Naghavi, S. Spiering, M. Powalla, B. Cavana, D. Lincot, Prog. Photovoltaics Res. Appl. 11, 437 (2003)CrossRef N. Naghavi, S. Spiering, M. Powalla, B. Cavana, D. Lincot, Prog. Photovoltaics Res. Appl. 11, 437 (2003)CrossRef
3.
go back to reference F.C. Akkari, R. Brini, M. Kanzari, B. Rezig, J. Mater. Sci. 40, 5751 (2005)CrossRef F.C. Akkari, R. Brini, M. Kanzari, B. Rezig, J. Mater. Sci. 40, 5751 (2005)CrossRef
6.
go back to reference Y. Hamanaka, T. Kuzuya, T. Sofue, T. Kino, K. Ito, K. Sumiyama, Chem. Phys. Lett. 466, 176 (2008)CrossRef Y. Hamanaka, T. Kuzuya, T. Sofue, T. Kino, K. Ito, K. Sumiyama, Chem. Phys. Lett. 466, 176 (2008)CrossRef
7.
go back to reference A. Igor, K. Tetsuya, N. Nobuyuki, S. Katsuaki, J. Appl. Phys. 32, L516 (1993)CrossRef A. Igor, K. Tetsuya, N. Nobuyuki, S. Katsuaki, J. Appl. Phys. 32, L516 (1993)CrossRef
9.
go back to reference A. Tadjarodi, A.H. Cheshmekhavar, M. Imani, Appl. Surf. Sci. 263, 449 (2012)CrossRef A. Tadjarodi, A.H. Cheshmekhavar, M. Imani, Appl. Surf. Sci. 263, 449 (2012)CrossRef
10.
11.
go back to reference S.H. You, K.J. Hong, B.J. Lee, T.S. Jeong, C.J. Youn, J.S. Park, S.N. Baek, J. Cryst. Growth 245, 261 (2002)CrossRef S.H. You, K.J. Hong, B.J. Lee, T.S. Jeong, C.J. Youn, J.S. Park, S.N. Baek, J. Cryst. Growth 245, 261 (2002)CrossRef
13.
15.
go back to reference C.H. Ho, Y.S. Huang, J.L. Chen, T.E. Dann, K.K. Tiong, Phys. Rev. B 60, 15766 (1999)CrossRef C.H. Ho, Y.S. Huang, J.L. Chen, T.E. Dann, K.K. Tiong, Phys. Rev. B 60, 15766 (1999)CrossRef
16.
go back to reference C.H. Ho, C.C. Wu, Z.H. Cheng, J. Cryst. Growth 279, 312 (2005) C.H. Ho, C.C. Wu, Z.H. Cheng, J. Cryst. Growth 279, 312 (2005)
18.
go back to reference I. Oja, M. Nanu, A. Katerski, M. Krunks, A. Mere, J. Raudoja, A. Goossens, Thin Solid Films 480–481, 82 (2005)CrossRef I. Oja, M. Nanu, A. Katerski, M. Krunks, A. Mere, J. Raudoja, A. Goossens, Thin Solid Films 480–481, 82 (2005)CrossRef
19.
go back to reference F.M. Courtel, R.W. Paynter, B. Marsan, M. Morin, Chem. Mater. 21, 3752 (2009)CrossRef F.M. Courtel, R.W. Paynter, B. Marsan, M. Morin, Chem. Mater. 21, 3752 (2009)CrossRef
20.
go back to reference J. Alvarez-García, E. Rudigier, N. Rega, B. Barcones, R. Scheer, A. Pérez-Rodríguez, A. Romano-Rodríguez, J.R. Morante, Thin Solid Films 122, 431–432 (2003) J. Alvarez-García, E. Rudigier, N. Rega, B. Barcones, R. Scheer, A. Pérez-Rodríguez, A. Romano-Rodríguez, J.R. Morante, Thin Solid Films 122, 431–432 (2003)
21.
go back to reference D. Papadimitriou, N. Esser, C. Xue, Phys. Stat. Solidi (b) 242, 2633 (2005)CrossRef D. Papadimitriou, N. Esser, C. Xue, Phys. Stat. Solidi (b) 242, 2633 (2005)CrossRef
22.
go back to reference Z. Wendong, S. Shengbo, X. Chenyang, P. Dimitra, J. Raman Spectrosc. 36, 777 (2005)CrossRef Z. Wendong, S. Shengbo, X. Chenyang, P. Dimitra, J. Raman Spectrosc. 36, 777 (2005)CrossRef
23.
go back to reference S. Roy, P. Guha, S.N. Kundu, H. Hanzawa, S. Chaudhuri, A.K. Pal, Mater. Chem. Phys. 73, 24 (2002)CrossRef S. Roy, P. Guha, S.N. Kundu, H. Hanzawa, S. Chaudhuri, A.K. Pal, Mater. Chem. Phys. 73, 24 (2002)CrossRef
24.
25.
27.
go back to reference M. Sugiyama, H. Nakanishi, S. Chichibu, Jpn. J. Appl. Phys. 40, L428 (2001)CrossRef M. Sugiyama, H. Nakanishi, S. Chichibu, Jpn. J. Appl. Phys. 40, L428 (2001)CrossRef
Metadata
Title
Structural property and optical band edge of Ag(In0.5Al0.5)S2
Authors
Ching-Hwa Ho
Chia-Chi Pan
Publication date
01-06-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 6/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-2900-z

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