2005 | OriginalPaper | Chapter
Study of Ferromagnet-Antiferromagnet Interfaces Using X-Ray PEEM
Authors : A. Scholl, H. Ohldag, F. Nolting, S. Anders, J. Stöhr
Published in: Magnetic Microscopy of Nanostructures
Publisher: Springer Berlin Heidelberg
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This chapter discusses polarization dependent X-ray photoemission electron microscopy (X-PEEM) and its application to coupled magnetic layers, in particular ferromagnet-antiferromagnet structures.