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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 9/2015

01-09-2015

Study on the physics and dielectric property of K2O–B2O3–SiO2/Al2O3 glass + ceramic

Authors: Xiao-Hua Zhou, Xin-Shi Yang, Yu-Qin Zhang, Cheng-Li Sun, Shu-Ren Zhang

Published in: Journal of Materials Science: Materials in Electronics | Issue 9/2015

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Abstract

Effects of different glass/ceramic weight ratio and different K ions content in K2O–B2O3–SiO2 (KBS) glass on the physics and dielectric properties of K2O–B2O3–SiO2/Al2O3 glass + ceramic composites were investigated. The results show that when glass/ceramic = 47.5:52.5 (mass fraction) and K ions content was 0.9 wt% (in the KBS glass), the ε r of the composite was 4.83, the tan δ = 3.51 × 10−3, the flexural strength was 123.85 MPa, the thermal expansion coefficient was 5.7592 × 10−6 °C−1.
previous article Structure and properties analysis for Zn3Nb2O8 and (Zn0.95M0.05)3Nb2O8 (M = Ni, Co, Mg and Mn) microwave dielectric materials
next article Microstructure, elastic modulus and shear strength of alumina (Al2O3) nanoparticles-doped tin–silver–copper (Sn–Ag–Cu) solders on copper (Cu) and gold/nickel (Au/Ni)-plated Cu substrates

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Metadata
Title
Study on the physics and dielectric property of K2O–B2O3–SiO2/Al2O3 glass + ceramic
Authors
Xiao-Hua Zhou
Xin-Shi Yang
Yu-Qin Zhang
Cheng-Li Sun
Shu-Ren Zhang
Publication date
01-09-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 9/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-3324-5

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