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Study the opto-structural properties of the mixed halide perovskite films by maintaining an equimolar stoichiometry of organic halide and metal halide composition in the precursor solution

  • 01-01-2026
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Abstract

This study delves into the synthesis and characterization of mixed halide perovskite films, focusing on the impact of varying halide composition while maintaining a fixed 1:1 molar ratio of organic and inorganic components. The research reveals that the optical bandgap of the films can be precisely tuned by adjusting the ratio of iodide to bromide, with the absorption edge shifting from 788 nm for MAPbI3 to 547 nm for MAPbBr3. This tuning is crucial for optimizing light absorption and emission characteristics across the visible spectrum. X-ray diffraction analysis confirms the formation of a cubic perovskite crystal structure, with the MAPbBr2I composition exhibiting the highest crystallinity. The study also explores the surface morphology of the films using scanning electron microscopy, highlighting the influence of halide composition on the crystallization and film formation process. Fourier transform infrared spectroscopy and Raman spectroscopy provide insights into the molecular interactions and vibrational properties of the perovskite films. The findings underscore the significance of maintaining a consistent stoichiometric ratio to optimize the film quality and performance. The study concludes that the MAPbBr2I composition offers the most balanced combination of optical and structural properties, making it a promising candidate for optoelectronic applications such as high-efficiency solar cells and LEDs.

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Title
Study the opto-structural properties of the mixed halide perovskite films by maintaining an equimolar stoichiometry of organic halide and metal halide composition in the precursor solution
Authors
Priyanka L. Chaudhari
Dipti R. Patil
Sagar A. More
Milan S. Sonawane
Krutika V. Patil
Lekhamala D. Ingale
Balaji V. Sanap
Shanabhau Bagul
Sanjay S. Ghosh
Publication date
01-01-2026
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 3/2026
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-026-16581-w
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