Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 2/2019

23-11-2018

Synergetic effect of strain rate and electroplated Cu film for shear strength of solder/Kovar joints

Authors: Xiaowu Hu, Nifa Bao, Zhixian Min

Published in: Journal of Materials Science: Materials in Electronics | Issue 2/2019

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

The effects of strain rate and electroplated Cu on the shear fracture behaviors of Sn37Pb/electroplated Cu (EPC)/Kovar solder joints were investigated after reflowing at 250 °C for 5 min. The Kovar was electroplated with 4.1 µm thick layer of Ni and 1.9 µm thick layer of Au. The copper electroplating time were 2, 5, 10 and 20 min, respectively, resulting in a different deposited thicknesses of Cu film on the Kovar substrate. The shear tests of Sn37Pb/EPC/Kovar joints were performed with different strain rates ranging from 8.3 × 10−2 to 1.6 s−1 to study the shear fracture behavior. Experimental results showed that the shear strength and failure mode of solder joints were affected by the thickness of electroplated Cu film and the applied strain rate. The shear strength of solder joint demonstrated increment at first and then decrement as the applied strain rate increased. It was observed that the shear failure mode of solder joints is well known to have experienced a transition from ductile fracture with the low strain rates (8.33 × 10−2 s−1 and 3.33 × 10− 1 s−1) to a mixed fracture with the intermediate strain rate (6.67 × 10−1 s−1) and high strain rates (1 s−1, 1.33 s−1 and 1.67 s−1). Studies in the shear properties of solder joints with electroplated Cu layer indicated that the electroplated Cu on the Kovar substrate has a significant improvement in the shear strength of solder joints. With increasing in the deposited thickness, the shear strength of solder joints increased when the deposited thickness was no more than 3.3 µm. Subsequently, the shear strength started to drop as the deposited thickness further increased.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference T.L. Yang, J.J. Yu, W.L. Shih, C.H. Hsueh, C.R. Kao, Effects of silver addition on Cu-Sn microjoints for chip-stacking applications. J. Alloys Compd. 605(12), 193–198 (2014)CrossRef T.L. Yang, J.J. Yu, W.L. Shih, C.H. Hsueh, C.R. Kao, Effects of silver addition on Cu-Sn microjoints for chip-stacking applications. J. Alloys Compd. 605(12), 193–198 (2014)CrossRef
2.
go back to reference Z.X. Zhu, C.C. Li, L.L. Liao, C.K. Liu, C.R. Kao, Au-Sn bonding material for the assembly of power integrated circuit module. J. Alloys Compd. 671, 340–345 (2016)CrossRef Z.X. Zhu, C.C. Li, L.L. Liao, C.K. Liu, C.R. Kao, Au-Sn bonding material for the assembly of power integrated circuit module. J. Alloys Compd. 671, 340–345 (2016)CrossRef
3.
go back to reference T.L. Yang, J.Y. Wu, C.C. Li, S. Yang, C.R. Kao, Low temperature bonding for high temperature applications by using SnBi solders. J. Alloys Compd. 647, 681–685 (2015)CrossRef T.L. Yang, J.Y. Wu, C.C. Li, S. Yang, C.R. Kao, Low temperature bonding for high temperature applications by using SnBi solders. J. Alloys Compd. 647, 681–685 (2015)CrossRef
4.
go back to reference L.J. Yu, H.W. Yen, J.Y. Wu, J.J. Yu, C.R. Kao, Micromechanical behavior of singlecrystalline Ni3Sn4 in micro joints for chip-stacking application. Mater. Sci. Eng.: A. 685, 123–130 (2017)CrossRef L.J. Yu, H.W. Yen, J.Y. Wu, J.J. Yu, C.R. Kao, Micromechanical behavior of singlecrystalline Ni3Sn4 in micro joints for chip-stacking application. Mater. Sci. Eng.: A. 685, 123–130 (2017)CrossRef
5.
go back to reference X. Hu, W. Chen, X. Yu, Y. Li, Y. Liu, Shear strengths and fracture behaviors of Cu/Sn37Pb/Cu soldered joints subjected to different displacement rates. J. Alloys Compd. 600, 13–20 (2014)CrossRef X. Hu, W. Chen, X. Yu, Y. Li, Y. Liu, Shear strengths and fracture behaviors of Cu/Sn37Pb/Cu soldered joints subjected to different displacement rates. J. Alloys Compd. 600, 13–20 (2014)CrossRef
6.
go back to reference Y.J. Chen, C.K. Chung, C.R. Yang, C.R. Kao, Single-joint shear strength of micro Cu pillar solder bumps with different amounts of intermetallics. Microelectron. Reliab. 53(1), 47–52 (2013)CrossRef Y.J. Chen, C.K. Chung, C.R. Yang, C.R. Kao, Single-joint shear strength of micro Cu pillar solder bumps with different amounts of intermetallics. Microelectron. Reliab. 53(1), 47–52 (2013)CrossRef
7.
go back to reference Y. Wan, S. Li, X. Hu, Y. Qiu, T. Xu, Y. Li, X. Jiang, Shear strength and fracture surface analysis of Sn58Bi/Cu solder joints under a wide range of strain rates. Microelectron. Reliab. 86, 27–37 (2018)CrossRef Y. Wan, S. Li, X. Hu, Y. Qiu, T. Xu, Y. Li, X. Jiang, Shear strength and fracture surface analysis of Sn58Bi/Cu solder joints under a wide range of strain rates. Microelectron. Reliab. 86, 27–37 (2018)CrossRef
8.
go back to reference X. Hu, T. Xu, L.M. Keer, Y. Li, X. Jiang, Shear strength and fracture behavior of reflowed Sn3.0Ag0.5Cu/Cu solder joints under various strain rates. J. Alloys Compd. 690, 720–729 (2017)CrossRef X. Hu, T. Xu, L.M. Keer, Y. Li, X. Jiang, Shear strength and fracture behavior of reflowed Sn3.0Ag0.5Cu/Cu solder joints under various strain rates. J. Alloys Compd. 690, 720–729 (2017)CrossRef
9.
go back to reference N. Bai, X. Chen, Z. Fang, Effect of strain rate and temperature on the tensile properties of tin-based lead-free solder alloys. J. Electron. Mater. 37(7), 1012–1019 (2008)CrossRef N. Bai, X. Chen, Z. Fang, Effect of strain rate and temperature on the tensile properties of tin-based lead-free solder alloys. J. Electron. Mater. 37(7), 1012–1019 (2008)CrossRef
10.
go back to reference T.F. Song, X.S. Jiang, Z.Y. Shao, D.F. Mo, D.G. Zhu, Interracial microstructure and mechanical properties of diffusion-bonded joints of titanium TC4 (Ti-6Al-4V) and Kovar (Fe-29Ni-17Co) alloys. J. Iron Steel Res. Int. 24(10), 1023–1031 (2017)CrossRef T.F. Song, X.S. Jiang, Z.Y. Shao, D.F. Mo, D.G. Zhu, Interracial microstructure and mechanical properties of diffusion-bonded joints of titanium TC4 (Ti-6Al-4V) and Kovar (Fe-29Ni-17Co) alloys. J. Iron Steel Res. Int. 24(10), 1023–1031 (2017)CrossRef
11.
go back to reference W. Zhu, J. Chen, C. Jiang, C. Hao, J. Zhang, Effects of Ti thickness on microstructure and mechanical properties of alumina-Kovar joints brazed with Ag-Pd/Ti filler. Ceram. Int. 40(4), 5699–5705 (2014)CrossRef W. Zhu, J. Chen, C. Jiang, C. Hao, J. Zhang, Effects of Ti thickness on microstructure and mechanical properties of alumina-Kovar joints brazed with Ag-Pd/Ti filler. Ceram. Int. 40(4), 5699–5705 (2014)CrossRef
12.
go back to reference J. Wei, B. Deng, X. Gao, J. Yan, X. Chen, Interface structure characterization of Fe36Ni alloy with ultrasonic soldering. J. Alloys Compd. 576, 386–392 (2013)CrossRef J. Wei, B. Deng, X. Gao, J. Yan, X. Chen, Interface structure characterization of Fe36Ni alloy with ultrasonic soldering. J. Alloys Compd. 576, 386–392 (2013)CrossRef
13.
go back to reference J.W. Yoon, S.B. Jung, Investigation of interfacial reaction between Au-Sn solder and Kovar for hermetic sealing application. Microelectron. Eng. 84(11), 2634–2639 (2007)CrossRef J.W. Yoon, S.B. Jung, Investigation of interfacial reaction between Au-Sn solder and Kovar for hermetic sealing application. Microelectron. Eng. 84(11), 2634–2639 (2007)CrossRef
14.
go back to reference J.W. Yoon, H.S. Chun, S.B. Jung, Liquid-state and solid-state interfacial reactions of fluxless-bonded Au-20Sn/ENIG solder joint. J. Alloys Compd. 469(1), 108–115 (2009)CrossRef J.W. Yoon, H.S. Chun, S.B. Jung, Liquid-state and solid-state interfacial reactions of fluxless-bonded Au-20Sn/ENIG solder joint. J. Alloys Compd. 469(1), 108–115 (2009)CrossRef
15.
go back to reference H.J. Lin, T.H. Chuang, Intermetallic reactions in reflowed and aged Sn-9Zn solder ball grid array packages with Au/Ni/Cu and Ag/Cu pads. J. Electron. Mater. 35(1), 154–164 (2006)CrossRef H.J. Lin, T.H. Chuang, Intermetallic reactions in reflowed and aged Sn-9Zn solder ball grid array packages with Au/Ni/Cu and Ag/Cu pads. J. Electron. Mater. 35(1), 154–164 (2006)CrossRef
16.
go back to reference B.L. Young, J.G. Duh, G.Y. Jang, Compound formation for electroplated Ni and electroless Ni in the under-bump metallurgy with Sn-58Bi solder during aging. J. Electron. Mater. 32(12), 1463–1473 (2003)CrossRef B.L. Young, J.G. Duh, G.Y. Jang, Compound formation for electroplated Ni and electroless Ni in the under-bump metallurgy with Sn-58Bi solder during aging. J. Electron. Mater. 32(12), 1463–1473 (2003)CrossRef
17.
go back to reference H.T. Lee, S.Y. Hu, T.F. Hong, Y.F. Chen, The shear strength and fracture behavior of Sn-Ag-xSb solder joints with Au/Ni-P/Cu UBM. J. Electron. Mater. 37(6), 867–873 (2008)CrossRef H.T. Lee, S.Y. Hu, T.F. Hong, Y.F. Chen, The shear strength and fracture behavior of Sn-Ag-xSb solder joints with Au/Ni-P/Cu UBM. J. Electron. Mater. 37(6), 867–873 (2008)CrossRef
18.
go back to reference Z. Huber, J. Wojewoda-Budka, L. Litynska-Dobrzynska, N. Sobczak, P. Zieba, Microstructure and chemistry of the SAC/ENIG interconnections. Mater. Chem. Phys. 139(1), 276–280 (2013)CrossRef Z. Huber, J. Wojewoda-Budka, L. Litynska-Dobrzynska, N. Sobczak, P. Zieba, Microstructure and chemistry of the SAC/ENIG interconnections. Mater. Chem. Phys. 139(1), 276–280 (2013)CrossRef
19.
go back to reference J.W. Yoon, B.I. Noh, S.B. Jung, Interfacial reaction between Au-Sn solder and Au/Ni-metallized Kovar. J. Mater. Sci.: Mater. Electron. 22(1), 84–90 (2011) J.W. Yoon, B.I. Noh, S.B. Jung, Interfacial reaction between Au-Sn solder and Au/Ni-metallized Kovar. J. Mater. Sci.: Mater. Electron. 22(1), 84–90 (2011)
20.
go back to reference E.P. Lopez, P.T. Vianco, J.A. Rejent, Solderability testing of 95.5Sn-3.9Ag-0.6Cu solder on oxygen-free high-conductivity copper and Au-Ni-Plated kovar. J. Electron. Mater. 32(4), 254–260 (2003)CrossRef E.P. Lopez, P.T. Vianco, J.A. Rejent, Solderability testing of 95.5Sn-3.9Ag-0.6Cu solder on oxygen-free high-conductivity copper and Au-Ni-Plated kovar. J. Electron. Mater. 32(4), 254–260 (2003)CrossRef
21.
go back to reference Q. Li, Y.C. Chan, Z. Chen, Interfacial microstructure and hardness of nickel (Ni) nanoparticle-doped tin-silver-copper (Sn-Ag-Cu) solders on immersion silver (Ag)-plated copper (Cu) substrates. J. Mater. Sci.: Mater. Electron. 25(9), 1222–1227 (2014) Q. Li, Y.C. Chan, Z. Chen, Interfacial microstructure and hardness of nickel (Ni) nanoparticle-doped tin-silver-copper (Sn-Ag-Cu) solders on immersion silver (Ag)-plated copper (Cu) substrates. J. Mater. Sci.: Mater. Electron. 25(9), 1222–1227 (2014)
22.
go back to reference R.B. Cinque, J.W. Morris, The effect of gold-nickel metallization microstructure on fluxless soldering. J. Electron. Mater. 23(6), 533–539 (1994)CrossRef R.B. Cinque, J.W. Morris, The effect of gold-nickel metallization microstructure on fluxless soldering. J. Electron. Mater. 23(6), 533–539 (1994)CrossRef
23.
go back to reference W.M. Chen, S.K. Kang, C.R. Kao, Effects of Ti addition to Sn-Ag and Sn-Cu solders. J. Alloys Compd. 520(4), 244–249 (2012)CrossRef W.M. Chen, S.K. Kang, C.R. Kao, Effects of Ti addition to Sn-Ag and Sn-Cu solders. J. Alloys Compd. 520(4), 244–249 (2012)CrossRef
24.
go back to reference T.A. Powers, T.J. Singler, J.A. Clum, Role of tin content in the wetting of cu and au by tin-bismuth solders. J. Electron. Mater. 23(8), 773–778 (1994)CrossRef T.A. Powers, T.J. Singler, J.A. Clum, Role of tin content in the wetting of cu and au by tin-bismuth solders. J. Electron. Mater. 23(8), 773–778 (1994)CrossRef
25.
go back to reference T.K. Lee, S. Zhang, C.C. Wong, A.C. Tan, Dissolution and reaction between Au and molten eutectic PbSn solder. Mater. Sci. Eng.: A 427(1–2), 136–141 (2006)CrossRef T.K. Lee, S. Zhang, C.C. Wong, A.C. Tan, Dissolution and reaction between Au and molten eutectic PbSn solder. Mater. Sci. Eng.: A 427(1–2), 136–141 (2006)CrossRef
26.
go back to reference A. Sharif, Y.C. Chan, R.A. Islam, Effect of volume in interfacial reaction between eutectic Sn-Pb solder and Cu metallization in microelectronic packaging. Mater. Sci. Eng.: B 106(2), 120–125 (2004)CrossRef A. Sharif, Y.C. Chan, R.A. Islam, Effect of volume in interfacial reaction between eutectic Sn-Pb solder and Cu metallization in microelectronic packaging. Mater. Sci. Eng.: B 106(2), 120–125 (2004)CrossRef
27.
go back to reference S.K. Kang, W.K. Choi, M.J. Yim, D.Y. Shih, Studies of the mechanical and electrical properties of lead-free solder joints. J. Electron. Mater. 31(11), 1292–1303 (2002)CrossRef S.K. Kang, W.K. Choi, M.J. Yim, D.Y. Shih, Studies of the mechanical and electrical properties of lead-free solder joints. J. Electron. Mater. 31(11), 1292–1303 (2002)CrossRef
28.
go back to reference J.W.R. Teo, Microstructure and failure mode of Sn-37Pb soldered in laser diode packages. Intermetallics 16(2), 293–298 (2008)CrossRef J.W.R. Teo, Microstructure and failure mode of Sn-37Pb soldered in laser diode packages. Intermetallics 16(2), 293–298 (2008)CrossRef
29.
go back to reference B. Lee, H. Jeon, S.J. Jeon, K.W. Kwon, H.J. Lee, A Study on the breakdown mechanism of an electroless-plated Ni(P) diffusion barrier for Cu/Sn/Cu 3D interconnect bonding structures. J. Electron. Mater. 41(1), 109–114 (2012)CrossRef B. Lee, H. Jeon, S.J. Jeon, K.W. Kwon, H.J. Lee, A Study on the breakdown mechanism of an electroless-plated Ni(P) diffusion barrier for Cu/Sn/Cu 3D interconnect bonding structures. J. Electron. Mater. 41(1), 109–114 (2012)CrossRef
30.
go back to reference C.Y. Liu, S.J. Wang, Prevention of spalling by the self-formed reaction barrier layer on controlled collapse chip connections under bump metallization. J. Electron. Mater. 32(1), L1–L3 (2003)CrossRef C.Y. Liu, S.J. Wang, Prevention of spalling by the self-formed reaction barrier layer on controlled collapse chip connections under bump metallization. J. Electron. Mater. 32(1), L1–L3 (2003)CrossRef
31.
go back to reference K.J. Puttlitz, G.T. Galyon, Impact of the ROHS Directive on high-performance electronic systems. J. Mater. Sci. 18, 347–365 (2007) K.J. Puttlitz, G.T. Galyon, Impact of the ROHS Directive on high-performance electronic systems. J. Mater. Sci. 18, 347–365 (2007)
32.
go back to reference D.H. Jung, A. Sharma, K.H. Kim, Y.C. Choo, J.P. Jung, Effect of current density and plating time on Cu electroplating in TSV and low alpha solder bumping. J. Mater. Eng. Perform. 24(3), 1107–1115 (2015)CrossRef D.H. Jung, A. Sharma, K.H. Kim, Y.C. Choo, J.P. Jung, Effect of current density and plating time on Cu electroplating in TSV and low alpha solder bumping. J. Mater. Eng. Perform. 24(3), 1107–1115 (2015)CrossRef
33.
go back to reference M.J. Starink, R.C. Thomson, The effect of high temperature exposure n dendritic segregation in a conventionally cast Ni based superalloy. J. Mater. Sci. 26(23), 5603–5608 (2001)CrossRef M.J. Starink, R.C. Thomson, The effect of high temperature exposure n dendritic segregation in a conventionally cast Ni based superalloy. J. Mater. Sci. 26(23), 5603–5608 (2001)CrossRef
34.
go back to reference B.S. Lee, Y.H. Ko, J.H. Bang, C.W. Lee, Interfacial reactions and mechanical strength of Sn-3.0Ag-0.5Cu/Ni/Cu and Au-20Sn/Ni/Cu solder joints for power electronics applications. Microelectron. Reliab. 71, 119–125 (2017)CrossRef B.S. Lee, Y.H. Ko, J.H. Bang, C.W. Lee, Interfacial reactions and mechanical strength of Sn-3.0Ag-0.5Cu/Ni/Cu and Au-20Sn/Ni/Cu solder joints for power electronics applications. Microelectron. Reliab. 71, 119–125 (2017)CrossRef
35.
go back to reference B. Lee, H. Jeon, K.W. Kwon, H.J. Lee, Employment of a bi-layer of Ni(P)/Cu as a diffusion barrier in a Cu/Sn/Cu bonding structure for three-dimensional interconnects. Acta Mater. 61(18), 6736–6742 (2013)CrossRef B. Lee, H. Jeon, K.W. Kwon, H.J. Lee, Employment of a bi-layer of Ni(P)/Cu as a diffusion barrier in a Cu/Sn/Cu bonding structure for three-dimensional interconnects. Acta Mater. 61(18), 6736–6742 (2013)CrossRef
36.
go back to reference S.J. Wang, C.Y. Liu, Retarding growth of Ni3P crystalline layer in Ni(P) substrate by reacting with Cu-bearing Sn(Cu) solders. Scr. Mater. 49(9), 813–818 (2003)CrossRef S.J. Wang, C.Y. Liu, Retarding growth of Ni3P crystalline layer in Ni(P) substrate by reacting with Cu-bearing Sn(Cu) solders. Scr. Mater. 49(9), 813–818 (2003)CrossRef
37.
go back to reference J.Y. Tsai, C.W. Chang, C.E. Ho, Y.L. Lin, C.R. Kao, Microstructure evolution of gold-tin eutectic solder on Cu and Ni substrates. J. Electron. Mater. 35(1), 65–71 (2006)CrossRef J.Y. Tsai, C.W. Chang, C.E. Ho, Y.L. Lin, C.R. Kao, Microstructure evolution of gold-tin eutectic solder on Cu and Ni substrates. J. Electron. Mater. 35(1), 65–71 (2006)CrossRef
38.
go back to reference A. Kumar, M. He, Z. Chen, Barrier properties of thin Au/Ni–P under bump metallization for Sn–3.5Ag solder. Surf. Coat. Technol. 198(1), 283–286 (2005)CrossRef A. Kumar, M. He, Z. Chen, Barrier properties of thin Au/Ni–P under bump metallization for Sn–3.5Ag solder. Surf. Coat. Technol. 198(1), 283–286 (2005)CrossRef
39.
go back to reference Y. Li, K. Luo, A.B. Lim, Z. Chen, Improving the mechanical performance of Sn57.6Bi0.4Ag solder joints on Au/Ni/Cu pads during aging and electromigration through the addition of tungsten (W) nanoparticle reinforcement. Mater. Sci. Eng.: A 669, 291–303 (2016)CrossRef Y. Li, K. Luo, A.B. Lim, Z. Chen, Improving the mechanical performance of Sn57.6Bi0.4Ag solder joints on Au/Ni/Cu pads during aging and electromigration through the addition of tungsten (W) nanoparticle reinforcement. Mater. Sci. Eng.: A 669, 291–303 (2016)CrossRef
40.
go back to reference S.F. Choudhury, L. Ladani, Local shear stress-strain response of Sn-3.5Ag/Cu solder joint with high fraction of intermetallic compounds: experimental analysis. J. Alloys Compd. 680, 665–676 (2016)CrossRef S.F. Choudhury, L. Ladani, Local shear stress-strain response of Sn-3.5Ag/Cu solder joint with high fraction of intermetallic compounds: experimental analysis. J. Alloys Compd. 680, 665–676 (2016)CrossRef
41.
go back to reference K.E. Yazzie, H.X. Xie, J.J. Williams, N. Chawla, On the relationship between solder-controlled and intermetallic compound (IMC)-controlled fracture in Sn-based solder joints. Scr. Mater. 66(8), 586–589 (2012)CrossRef K.E. Yazzie, H.X. Xie, J.J. Williams, N. Chawla, On the relationship between solder-controlled and intermetallic compound (IMC)-controlled fracture in Sn-based solder joints. Scr. Mater. 66(8), 586–589 (2012)CrossRef
42.
go back to reference I. Shohji, T. Yoshida, T. Takahashi, S. Hioki, Tensile properties of Sn-Ag based lead-free solders and strain rate sensitivity. Mater. Sci. Eng.: A 366(1), 50–55 (2004)CrossRef I. Shohji, T. Yoshida, T. Takahashi, S. Hioki, Tensile properties of Sn-Ag based lead-free solders and strain rate sensitivity. Mater. Sci. Eng.: A 366(1), 50–55 (2004)CrossRef
43.
go back to reference H. Fei, K. Yazzie, N. Chawla, H. Jiang, Modeling fracture of Sn-Rich (Pb-Free) solder joints under mechanical shock conditions. J. Electron. Mater. 41(8), 2089–2099 (2012)CrossRef H. Fei, K. Yazzie, N. Chawla, H. Jiang, Modeling fracture of Sn-Rich (Pb-Free) solder joints under mechanical shock conditions. J. Electron. Mater. 41(8), 2089–2099 (2012)CrossRef
44.
go back to reference K.E. Yazzie, H.E. Fei, H. Jiang, N. Chawla, Rate-dependent behavior of Sn alloy-Cu couples: effects of microstructure and composition on mechanical shock resistance. Acta Mater. 60(10), 4336–4348 (2012)CrossRef K.E. Yazzie, H.E. Fei, H. Jiang, N. Chawla, Rate-dependent behavior of Sn alloy-Cu couples: effects of microstructure and composition on mechanical shock resistance. Acta Mater. 60(10), 4336–4348 (2012)CrossRef
45.
go back to reference T. An, F. Qin, Effects of the intermetallic compound microstructure on the tensile behavior of Sn3.0Ag0.5Cu/Cu solder joint under various strain rates. Microelectron. Reliab. 54(5), 932–938 (2014)CrossRef T. An, F. Qin, Effects of the intermetallic compound microstructure on the tensile behavior of Sn3.0Ag0.5Cu/Cu solder joint under various strain rates. Microelectron. Reliab. 54(5), 932–938 (2014)CrossRef
46.
go back to reference W. Chen, S. Xue, H. Wang, J. Wang, Z. Han, Investigation on properties of Ga to Sn-9Zn lead-free solder. J. Mater. Sci.: Mater. Electron. 21(5), 496–502 (2010) W. Chen, S. Xue, H. Wang, J. Wang, Z. Han, Investigation on properties of Ga to Sn-9Zn lead-free solder. J. Mater. Sci.: Mater. Electron. 21(5), 496–502 (2010)
47.
go back to reference H.T. Lee, H.S. Lin, C.S. Lee, P.W. Chen, Reliability of Sn–Ag–Sb lead-free solder joints. Mater. Sci. Eng.: A 407(1), 36–44 (2005)CrossRef H.T. Lee, H.S. Lin, C.S. Lee, P.W. Chen, Reliability of Sn–Ag–Sb lead-free solder joints. Mater. Sci. Eng.: A 407(1), 36–44 (2005)CrossRef
48.
go back to reference X. Hu, Y. Li, Y. Liu, Z. Min, Microstructure and shear strength of Sn37Pb/Cu solder joints subjected to isothermal aging. Microelectron. Reliab. 54(8), 1575–1582 (2014)CrossRef X. Hu, Y. Li, Y. Liu, Z. Min, Microstructure and shear strength of Sn37Pb/Cu solder joints subjected to isothermal aging. Microelectron. Reliab. 54(8), 1575–1582 (2014)CrossRef
49.
go back to reference F. Lang, H. Tanaka, O. Munegata, T. Taguchi, T. Narita, The effect of strain rate and temperature on the tensile properties of Sn-3.5Ag solder. Mater. Charact. 54(3), 223–229 (2005)CrossRef F. Lang, H. Tanaka, O. Munegata, T. Taguchi, T. Narita, The effect of strain rate and temperature on the tensile properties of Sn-3.5Ag solder. Mater. Charact. 54(3), 223–229 (2005)CrossRef
Metadata
Title
Synergetic effect of strain rate and electroplated Cu film for shear strength of solder/Kovar joints
Authors
Xiaowu Hu
Nifa Bao
Zhixian Min
Publication date
23-11-2018
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 2/2019
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-0413-2

Other articles of this Issue 2/2019

Journal of Materials Science: Materials in Electronics 2/2019 Go to the issue