Test Technology Newsletter

The article presents a detailed summary of past and upcoming events in the field of electronic-based circuits and system testing. It highlights the IEEE European Test Symposium (ETS’21), which focused on scientific results and industry highlights, and the International Symposium on On-Line Testing and Robust System Design (IOLTS’21), emphasizing the importance of design for robustness in modern electronic systems. Additionally, it previews the 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’21) and the International Test Conference (ITC 2021), both of which offer platforms for presenting and discussing advancements in testing, reliability, and security. The article also includes an invitation for input from the test community and information on becoming a TTTC member.