Skip to main content
Disciplines
Automotive Business IT + Informatics Construction + Real Estate Electrical Engineering + Electronics Energy + Sustainability Insurance + Risk Finance + Banking Management + Leadership Marketing + Sales Mechanical Engineering + Materials
Events
DE
EN
Books
Journals
Topic Page
Marketing
Start single access now
Access for companies
EXTENDED SEARCH
Log in
Top
Published in:
Methodology of Detection for Power Cable Insulation Defects Based on DC Voltage Withstand Test Read chapter Read first chapter

2014 | OriginalPaper | Chapter

The Design of Passive Intermodulation Test System Applied in LTE 2600

Authors : Gong Lin, Chenghua Wang, Wenjue You, Yunqiang Wan

Published in: Unifying Electrical Engineering and Electronics Engineering

Publisher: Springer New York

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

For the purpose of measuring the passive intermodulation (PIM) products caused by the nonlinearities of passive devices, this chapter proposes a design of PIM test system which can be applied in long-term evolution (LTE) 2600. By reflecting the combined signals generated by two power amplifiers, the test system is able to capture and analyze PIM products accurately. Furthermore, the test system is composed of transmitter, receiver, and control system. By adopting advanced RISC machines11 (ARM11)—S3C6410, the test system achieves an excellent performance. Finally, experimental results show that the test system has good reliability and accuracy.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

inform now
previous chapter Mobile Cloud Forwarding Service in Delay Tolerant Networks
next chapter Adaptive Modulation with Antenna Selection and Imperfect Feedback in Rayleigh Fading Channel
Literature
1.
Deats B, Hartman R (1997) Measuring the passive-IM performance of RF cable assemblies. Microw RF 36:108
2.
Bolli P, Selleri S, Pelosi G (2002) Passive intermodulation on large reflector antennas. J Antennas Propag Mag 44:13–20CrossRef
3.
Chou C, Sun CT (1996) A computer-network-supported cooperative distance learning system for technical communication education. IEEE Trans Prof Commun 39:205–214
4.
Sanford J (1993) Passive intermodulation considerations in antenna design. IEEE Antennas Propag Soc Int Symp Dig 3:1651–1654CrossRef
5.
Henrie J, Christinason A, Chappell WJ (2008) Prediction of passive intermodulation from coaxial connectors in microwave networks. J IEEE Trans Microw Theory Technol 56:209CrossRef
6.
Lui PL (1990) Passive intermodulation interference in communication systems. Electron Commun Eng J 2(3):109CrossRef
7.
Abeta S (2010) Toward LTE commercial launch and future plan for LTE enhancements (LTE-advanced). Proceedings of the IEEE Symposium on Communication System (ICCS 2010), IEEE Press, pp 146–150. doi: 10.1109/ICCS.2010.5686367.118
Metadata
Title
The Design of Passive Intermodulation Test System Applied in LTE 2600
Authors
Gong Lin
Chenghua Wang
Wenjue You
Yunqiang Wan
Copyright Year
2014
Publisher
Springer New York
Book
Unifying Electrical Engineering and Electronics Engineering

Print ISBN: 978-1-4614-4980-5

Electronic ISBN: 978-1-4614-4981-2

Copyright Year: 2014

DOI
https://doi.org/10.1007/978-1-4614-4981-2_166