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Journal of Electronic Materials
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31-01-2019 | Topical Collection: International Conference on Thermoelectrics 2018

The Importance of Considering Parasitic Heat Losses When Modeling TEG Performance for High-Temperature Applications

Authors: R. Schwurack, S. Unz, M. Beckmann

Published in: Journal of Electronic Materials | Issue 4/2019

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Metadata
Title
The Importance of Considering Parasitic Heat Losses When Modeling TEG Performance for High-Temperature Applications
Authors
R. Schwurack
S. Unz
M. Beckmann
Publication date
31-01-2019
Publisher
Springer US
Published in
Journal of Electronic Materials / Issue 4/2019
Print ISSN: 0361-5235
Electronic ISSN: 1543-186X
DOI
https://doi.org/10.1007/s11664-019-06974-5

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