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Modeling and Design for Reliability of Analog Integrated Circuits in Nanometer CMOS Technologies Read chapter Read first chapter

2011 | OriginalPaper | Chapter

Towards EPC-Compatible Organic RFID Tags

Authors : Kris Myny, Soeren Steudel, Peter Vicca, Steve Smout, Monique J. Beenhakkers, Nick A.J.M. van Aerle, François Furthner, Bas van der Putten, Ashutosh K. Tripathi, Gerwin H. Gelinck, Jan Genoe, Wim Dehaene, Paul Heremans

Published in: Analog Circuit Design

Publisher: Springer Netherlands

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Abstract

In this chapter, fully integrated organic RFID tags are demonstrated. These tags are inductively-coupled at a base frequency of 13.56 MHz and can be read out at distances up to 10 cm, which is the expected readout distance for proximity readers. We also demonstrate next generation transponder chips, fabricated in a dual-gate technology. The additional gate, backgate, is used to control the threshold voltage and allows integration into more robust unipolar, dual-VT transponder chips. Finally, we realized an 8-bit transponder chip having data rates that are EPC-compatible. This has been achieved in our thin-film transistor technology by introducing a high-k Al2O3 gate dielectric, by scaling the channel lengths down to 2 mm and by reducing the overlap capacitance of the parasitic source-gate and drain-gate capacitors.

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previous chapter Printed Electronics—First Circuits, Products, and Roadmap
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Metadata
Title
Towards EPC-Compatible Organic RFID Tags
Authors
Kris Myny
Soeren Steudel
Peter Vicca
Steve Smout
Monique J. Beenhakkers
Nick A.J.M. van Aerle
François Furthner
Bas van der Putten
Ashutosh K. Tripathi
Gerwin H. Gelinck
Jan Genoe
Wim Dehaene
Paul Heremans
Copyright Year
2011
Publisher
Springer Netherlands
Book
Analog Circuit Design

Print ISBN: 978-94-007-0390-2

Electronic ISBN: 978-94-007-0391-9

Copyright Year: 2011

DOI
https://doi.org/10.1007/978-94-007-0391-9_18