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Circuits, Systems, and Signal Processing
Published in:

18-07-2024

Two-Step Single-Slope ADC Utilizing Differential Ramps for CMOS Image Sensors

Authors: Dongxing Fang, Kaiming Nie, Ziyang Zhang, Jiangtao Xu

Published in: Circuits, Systems, and Signal Processing | Issue 10/2024

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Abstract

This paper presents a two-step single-slope (TS-SS) analog-to-digital converter (ADC) for CMOS image sensors (CIS). The proposed TS-SS ADC divides the pixel signal into small and large signal regions using a precomparator. When quantizing large pixel signals, the TS-SS ADC enters accelerated mode, which leverages the differential topology of the ramp generator to speed up quantization. The accelerated mode reduces the row cycle, resulting in a 31.3% reduction at 320 MHz clock from 27.3 to 18.75 µs. The designed 12-bit TS-SS ADC was designed in a 110 nm 1P4M CMOS technology, and its linearity was verified by process corner post-simulation and Monte Carlo simulation.
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Metadata
Title
Two-Step Single-Slope ADC Utilizing Differential Ramps for CMOS Image Sensors
Authors
Dongxing Fang
Kaiming Nie
Ziyang Zhang
Jiangtao Xu
Publication date
18-07-2024
Publisher
Springer US
Published in
Circuits, Systems, and Signal Processing / Issue 10/2024
Print ISSN: 0278-081X
Electronic ISSN: 1531-5878
DOI
https://doi.org/10.1007/s00034-024-02767-2

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