Skip to main content
Top

2018 | OriginalPaper | Chapter

Unusual Conductance Characteristics in Single Electron Transistor

Authors : Arkadeep Paul, Ritabrata Chakraborty, Arpan Deyasi, Shrabani Nayak

Published in: Industry Interactive Innovations in Science, Engineering and Technology

Publisher: Springer Singapore

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

Dependence of conductance on equivalent circuit parameters in single electron transistor is analytically computed for electrical performance estimation. Distorted conductance profiles are obtained when a few passive components exceeds threshold limit, and negative spikes are also possible, as revealed from simulation. Steady-state master equation is solved with appropriate boundary conditions when source and drains are connected via quantum dot, which ensures tunneling process. Fermi Golden Rule is applied to calculate probabilistic values of all stochastic processes and effect of source and drain resistances and capacitances as well as gate capacitance are considered for determining conductance. Simulated findings are important for practical application of SET as infrared detector and charge sensor.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
2.
go back to reference Yano, K., Ishii, T., Hashimoto, T., Kobayashi, T., Murai, F., Seki, K.: Room-temperature single-electron memory. IEEE Trans. Electron Devices 41, 1628–1638 (1994)CrossRef Yano, K., Ishii, T., Hashimoto, T., Kobayashi, T., Murai, F., Seki, K.: Room-temperature single-electron memory. IEEE Trans. Electron Devices 41, 1628–1638 (1994)CrossRef
3.
go back to reference Astafiev, O., Antonov, V., Kutsuwa, T., Komiyama, S.: Single electron transistors as far-infrared photon detectors. In: Device Research Conference 145–147 (2001) Astafiev, O., Antonov, V., Kutsuwa, T., Komiyama, S.: Single electron transistors as far-infrared photon detectors. In: Device Research Conference 145–147 (2001)
4.
go back to reference Knobel, R.G., Cleland, A.N.: Nanometre-scale displacement sensing using a single electron transistor. Nature 424, 291–293 (2003)CrossRef Knobel, R.G., Cleland, A.N.: Nanometre-scale displacement sensing using a single electron transistor. Nature 424, 291–293 (2003)CrossRef
5.
go back to reference Berman, D., Zhitenev, N.B., Ashoori, R.C., Smitha, H.I., Melloch, M.R.: Single-electron transistor as a charge sensor for semiconductor applications. J. Vac. Sci. Technol. B 15, 2844–2847 (1997)CrossRef Berman, D., Zhitenev, N.B., Ashoori, R.C., Smitha, H.I., Melloch, M.R.: Single-electron transistor as a charge sensor for semiconductor applications. J. Vac. Sci. Technol. B 15, 2844–2847 (1997)CrossRef
6.
go back to reference Degawa, K., Aoki, T., Higuchi, T., Inokawa, H., Takahashi, A.: A single-electron-transistor logic gate family and its application—part i: basic components for binary, multiple-valued and mixed-mode logic. In: 34th International Symposium on Multiple-Valued Logic, pp. 262–268 (2004) Degawa, K., Aoki, T., Higuchi, T., Inokawa, H., Takahashi, A.: A single-electron-transistor logic gate family and its application—part i: basic components for binary, multiple-valued and mixed-mode logic. In: 34th International Symposium on Multiple-Valued Logic, pp. 262–268 (2004)
7.
go back to reference Uchida, K.: Analytical single-electron transistor (SET) model for design and analysis of realistic SET circuits. Jpn. J. Appl. Phys. Part 1 39, 2321–2324 (2000)CrossRef Uchida, K.: Analytical single-electron transistor (SET) model for design and analysis of realistic SET circuits. Jpn. J. Appl. Phys. Part 1 39, 2321–2324 (2000)CrossRef
8.
go back to reference Inokawa, H., Takahashi, Y.: A compact analytical model for asymmetric single-electron transistors. IEEE Trans. Electron Devices 50(2), 455–461 (2003) Inokawa, H., Takahashi, Y.: A compact analytical model for asymmetric single-electron transistors. IEEE Trans. Electron Devices 50(2), 455–461 (2003)
9.
go back to reference Le Royer, C.: Accurate modeling of quantum-dot based multi-tunnel junction memory. In: Proceeding of ESSDERC, pp. 403–406 (2002) Le Royer, C.: Accurate modeling of quantum-dot based multi-tunnel junction memory. In: Proceeding of ESSDERC, pp. 403–406 (2002)
10.
go back to reference Lientschnig, G., Weymann, I., Hadley, P.: Simulating hybrid circuits of single-electron transistors and field-effect transistors. Jpn. J. Appl. Phys. Part 1 42, 6467–6472 (2003)CrossRef Lientschnig, G., Weymann, I., Hadley, P.: Simulating hybrid circuits of single-electron transistors and field-effect transistors. Jpn. J. Appl. Phys. Part 1 42, 6467–6472 (2003)CrossRef
11.
go back to reference Mahapatra, S., Vaish, V., Wasshuber, C., Banerjee, K., Ionescu, A.M.: Analytical modeling of single electron transistor for hybrid CMOS-SET analog IC design. IEEE Trans. Electron Devices 51, 1772–1782 (2004)CrossRef Mahapatra, S., Vaish, V., Wasshuber, C., Banerjee, K., Ionescu, A.M.: Analytical modeling of single electron transistor for hybrid CMOS-SET analog IC design. IEEE Trans. Electron Devices 51, 1772–1782 (2004)CrossRef
12.
go back to reference Shahhoseini, A., Saghafi, K., Moravvej-Farshi, M.K., Faez, R.: An analytic model for kink effect in i–v characteristics of single electron transistor. Iran. J. Electr. Electron. Eng. 5, 234–243 (2009)MATH Shahhoseini, A., Saghafi, K., Moravvej-Farshi, M.K., Faez, R.: An analytic model for kink effect in i–v characteristics of single electron transistor. Iran. J. Electr. Electron. Eng. 5, 234–243 (2009)MATH
13.
go back to reference Hasaneen, E.-S.A.M., Wahab, M.A.A., Ahamed, M.G.: Exact analytical model of single electron transistor for practical ic design. Microelectron. Reliab. 51, 733–745 (2011) Hasaneen, E.-S.A.M., Wahab, M.A.A., Ahamed, M.G.: Exact analytical model of single electron transistor for practical ic design. Microelectron. Reliab. 51, 733–745 (2011)
14.
go back to reference Bohm, D.: Quantum Theory, Prentice Hall, Jan (1989) Bohm, D.: Quantum Theory, Prentice Hall, Jan (1989)
Metadata
Title
Unusual Conductance Characteristics in Single Electron Transistor
Authors
Arkadeep Paul
Ritabrata Chakraborty
Arpan Deyasi
Shrabani Nayak
Copyright Year
2018
Publisher
Springer Singapore
DOI
https://doi.org/10.1007/978-981-10-3953-9_9