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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 1/2016

04-09-2015

X-ray reflectivity and topography of the solvent-treated P3HT:PCBM thin films

Authors: S. Khodakarimi, M. H. Hekmatshoar, F. Abbasi

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2016

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Abstract

P3HT:PCBM (poly(3-hexylthiophene):[6,6]-phenyl C61 butyric acid methyl ester) thin films are widely used as an active layer in organic solar cells. The influence of solvent (1,8-diiodooctane) was studied on electron density and topography of thin spin-coated P3HT:PCBM films. The structural properties were studied by grazing incidence X-ray diffraction technique. It was found that the crystallinity of the investigated films was significantly increased after solvent treatment. Using X-ray reflectivity (XRR) analysis, data from P3HT:PCBM/air and P3HT:PCBM/glass interfaces were collected and compared with a theoretical model. The electron density, film thickness, and interface roughness were determined with a few angstroms accuracy by simulating the XRR curves. The XRR data were then analyzed using a scheme based on the distorted-wave Born approximation. It was found that the addition of diiodooctane did not change the absorption coefficient but changed electron density and roughness. The XRR simulation results were in good agreement with the experimental results obtained from AFM measurements.
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Literature
1.
M. Tolan, X-Ray Scattering from Soft-Matter Thin Films Materials Science and Basic Research (Springer, Berlin, 1999), p. 148
2.
A. Ng, X. Liu, C.H. To, A.B. Djurisic, J.A. Zapien, W.K. Chan, Annealing of P3HT:PCBM blend film-the effect on its optical properties. Appl. Mater. Interf. 5, 4247–4259 (2013)CrossRef
3.
Q. Wu, M. Bhattacharya, L.M.J. Moore, S.E. Morgan, Air processed P3HT:PCBM photovoltaic cells: morphology correlation to annealing, degradation, and recovery. J. Polym. Sci. Part B Polym. Phys. 52, 1511–1520 (2014)CrossRef
4.
G.L. Monroy, M.J. Bedzyk, S. Chattopadhyay, Characterization of polystyrene thin films using X-ray reflectivity. Nanoscape 8, 18–21 (2011)
5.
U. Zhokhavets, T. Erb, H. Hoppe, G. Gobsch, N.S. Sariciftci, Effect of annealing of poly(3-hexylthiophene)/fullerene bulk heterojunction composites on structural and optical properties. Thin Solid Films 496, 679–682 (2006)CrossRef
6.
T. Sakurai, T. Yamanari, M. Kubota, S. Toyoshima, T. Taima, K. Saito, Y. Yoshida, K. Akimoto, Comparative study on structural properties of poly(3-hexylthiophene) and poly(3-hexylthiophene):6,6-phenyl-C61 butyric acid methyl ester thin films using synchrotron X-ray diffraction. Jpn. J. Appl. Phys. 49(1S), 01AC01 (2010)
7.
Sh. Tiwari, S. Tiwari, R. Prakash, S.K. Balasubramanian, Study of electrical properties of poly-3-alkylthiophen (P3AT) derivatives P3HT, P3BT and P3DDT based field effect transistors. in Annual IEEE India Conference (INDICON), 2013
8.
ChN Kempf, K.A. Smith, S.L. Pesek, X. Li, R. Verduzco, Amphiphilic poly(alkylthiophene) block copolymers prepared via externally initiated GRIM and click coupling. Polym. Chem. 4, 2158–2163 (2013)CrossRef
9.
J. Als-Nielson, D. McMorrow, Elements of Modern X-Ray Physics (Wiley, Chichester, 2002)
10.
A. Gibauda, C. Sella, M. Maaza, L. Sung, J.A. Dura, S.K. Satija, Neutron and X-ray reflectivity analysis of ceramic-metal materials. Thin Solid Films 340, 153–158 (1999)CrossRef
11.
M. Rajua, S. Chaudhary, D.K. Pandya, Magnetic annealing of the ion-beam sputtered IrMn/CoFeB bilayers–positive exchange bias and coercivity behaviour. Eur. Phys. J. B86, 491 (2013)CrossRef
12.
P. Schiebel, Determination of the Rocking Curve and Reflection Efficiency of a Quartz Crystal X-ray Imager, B.Sc. Thesis, Ohio State University, 2012
13.
A. Glavic, Multiferroicity in Oxide Thin Films and Heterostructures, Ph.D. Thesis, Forschungszentrum Jülich GmbH, 2012
14.
K.L. Salcedo, C.A. Rodríguez, F.A. Perez, H. Riascos, Morphological study of Palladium thin films deposited by sputtering. J. Phys. Conf. Ser. 274, 012120 (2011)CrossRef
15.
P. Poulopoulos, B. Lewitz, A. Straub, S.D. Pappas, S.A. Droulias, S. Baskoutas, P. Fumagalli, Band-gap tuning at the strong quantum confinement regime in magnetic semiconductor EuS thin films. Appl. Phys. Lett. 100, 211910 (2012)CrossRef
16.
O. Anderson, G.H.O. Daalderop, K. Bange, X-ray reflectivity investigations of glass surfaces produced by float and draw techniques. Mikrochim. Acta 125, 63–67 (1997)CrossRef
17.
S. Banerjee, M.K. Sanyal, A. Datta, X-ray-reflectivity study of Ge–Si–Ge films. Phys. Rev. B54, 16377–16380 (1996)CrossRef
18.
S.B. Kirschner, N.P. Smith, K.A. Wepasnick, H.E. Katz, B.J. Kirby, J.A. Borchersd, D.H. Reich, X-ray and neutron reflectivity and electronic properties of PCBM poly(bromo)styrene blends and bilayers with poly(3-hexylthiophene). J. Mater. Chem. 22, 4364–4370 (2012)CrossRef
19.
L.G. Parratt, Surface studies of solids by total reflection of X-rays. Phys. Rev. 95, 359–369 (1954)CrossRef
20.
N. Suresh, D.M. Phase, A. Gupta, S.M. Chaudhari, Electron density fluctuations at interfaces in Nb/Si bilayer, trilayer, and multilayer films: an X-ray reflectivity study. J. Appl. Phys. 87, 7946–7958 (2000)CrossRef
21.
M.K. Sanyal, S.K. Sinha, A. Gibaud, K.G. Huang, B.L. Carvalho, M. Rafailovich, J. Sokolov, X. Zhaoand, W. Zhao, Fourier reconstruction of density profiles of thin films using anomalous X-ray reflectivity. Europhys. Lett. 21, 691–696 (1993)CrossRef
22.
M.K. Sanyal, J.K. Basu, A. Datta, S. Banerjee, Determination of small fluctuations in electron density profiles of thin films: layer formation in a polystyrene film. Europhys. Lett. 36, 265–270 (1996)CrossRef
23.
M. Björck, G. Andersson, GenX: an extensible X-ray reflectivity refinement program utilizing differential evolution. J. Appl. Crystallogr. 40, 1174–1178 (2007)CrossRef
24.
H. Lidbaum, H. Raanaei, ETh Papaioannou, K. Leifer, B. Hjörvarsson, Structural- and magnetic properties of Co68Fe24Zr8/Al2O3 multilayers. J. Cryst. Growth 312, 580–586 (2010)CrossRef
25.
J.U. Lee, J.W. Jung, T. Emrick, T.P. Russel, W.H. Jo, Morphology control of a polythiophene–fullerene bulk heterojunction for enhancement of the high-temperature stability of solar cell performance by a new donor–acceptor diblock copolymer. Nanotechnology 21, 105201 (2010)CrossRef
26.
P.G. Karagiannidis, S. Kassavetis, C. Pitsalidis, S. Logothetidis, Thermal annealing effect on the nanomechanical properties and structure of P3HT:PCBM thin films. Thin Solid Films 519, 4105–4109 (2011)CrossRef
27.
Y.M. Chang, L. Wang, Efficient poly(3-hexylthiophene)-based bulk heterojunction solar cells fabricated by an annealing-free approach. J. Phys. Chem. C 112, 17716–17720 (2008)CrossRef
28.
E.D. Gomez, K.P. Barteau, H. Wang, M.F. Toneyc, Y. Loo, Correlating the scattered intensities of P3HT and PCBM to the current densities of polymer solar cells. Chem. Commun. 47, 436–438 (2011)CrossRef
29.
W. Zhou, J. Shi, L. Lv, L. Chen, Y. Chen, A mechanistic investigation of morphology evolution in P3HT–PCBM films induced by liquid crystalline molecules under external electric field. Phys. Chem. Chem. Phys. 17, 387–397 (2015)CrossRef
30.
M. Nasiri, F. Abbasi, Effect of 1,8-diiodooctane on the performance of P3HT:PCBM solar cells. J. Sol. Energy Eng. 137, 034506 (2015)CrossRef
31.
L.H. Nguyen, H. Hoppe, T. Erb, S. Günes, G. Gobsch, N.S. Sariciftci, Effects of annealing on the nanomorphology and performance of poly(alkylthiophene):fullerene bulk-heterojunction solar cells. Adv. Funct. Mater. 17, 1071–1078 (2007)CrossRef
32.
H.W. Tsai, Z. Pei, T.H. Huang, P.W. Li, Y.J. Chan, A conductor/insulator/semiconductor polymer solar cell by an ultra-thin polymer insulator. Org. Electron. 11, 1796–1801 (2010)CrossRef
33.
X. Huang, J. Peng, K. Lu, Z. Liu, Z. Wu, J. Yuan, J. Lu, H.-Q. Wang, W. Ma, Enhanced performance for polymer/fullerene solar cells by using bromobenzene/1,8-diiodooctane co-solvent. Appl. Phys. Lett. 104, 211602 (2014)CrossRef
Metadata
Title
X-ray reflectivity and topography of the solvent-treated P3HT:PCBM thin films
Authors
S. Khodakarimi
M. H. Hekmatshoar
F. Abbasi
Publication date
04-09-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 1/2016
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-3735-3

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