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1981 | OriginalPaper | Chapter

X-Ray Spectral Measurement: WDS and EDS

Authors : Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin

Published in: Scanning Electron Microscopy and X-Ray Microanalysis

Publisher: Springer US

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Chemical analysis in the scanning electron microscope and electron microprobe is performed by measuring the energy and intensity distribution of the x-ray signal generated by a focused electron beam. The subject of x-ray production has already been introduced in the chapter on electronbeam-specimen interactions (Chapter 3), which describes the mechanisms for both characteristic and continuum x-ray production. This chapter is concerned with the methods for detecting and measuring these signals as well as converting them into a useful form for qualitative and quantitative analysis.

Metadata
Title
X-Ray Spectral Measurement: WDS and EDS
Authors
Joseph I. Goldstein
Dale E. Newbury
Patrick Echlin
David C. Joy
Charles Fiori
Eric Lifshin
Copyright Year
1981
Publisher
Springer US
DOI
https://doi.org/10.1007/978-1-4613-3273-2_5

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