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Integrating Materials and Manufacturing Innovation
Erschienen in: Integrating Materials and Manufacturing Innovation 2/2017

Open Access 01.06.2017 | Research

Extraction of Process-Structure Evolution Linkages from X-ray Scattering Measurements Using Dimensionality Reduction and Time Series Analysis

verfasst von: David B. Brough, Abhiram Kannan, Benjamin Haaland, David G. Bucknall, Surya R. Kalidindi

Erschienen in: Integrating Materials and Manufacturing Innovation | Ausgabe 2/2017

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Abstract

The rapid development of robust, reliable, and reduced-order process-structure evolution linkages that take into account hierarchical structure are essential to expedite the development and manufacturing of new materials. Towards this end, this paper lays a theoretical framework that injects the established time series analysis into the recently developed materials knowledge systems (MKS) framework. This new framework is first presented and then demonstrated on an ensemble dataset obtained using small-angle X-ray scattering on semi-crystalline linear low density polyethylene films from a synchrotron X-ray scattering experiment.
Vorheriger Artikel Acquisition of Real-Time Operation Analytics for an Automated Serial Sectioning System
Nächster Artikel Context Aware Machine Learning Approaches for Modeling Elastic Localization in Three-Dimensional Composite Microstructures
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Metadaten
Titel
Extraction of Process-Structure Evolution Linkages from X-ray Scattering Measurements Using Dimensionality Reduction and Time Series Analysis
verfasst von
David B. Brough
Abhiram Kannan
Benjamin Haaland
David G. Bucknall
Surya R. Kalidindi
Publikationsdatum
01.06.2017
Verlag
Springer International Publishing
Erschienen in
Integrating Materials and Manufacturing Innovation / Ausgabe 2/2017
Print ISSN: 2193-9764
Elektronische ISSN: 2193-9772
DOI
https://doi.org/10.1007/s40192-017-0093-4

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