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Erschienen in: Journal of Materials Science: Materials in Electronics 23/2017

21.08.2017

Fabrication and characterization of glass and glass-ceramic from rice husk ash as a potent material for opto-electronic applications

verfasst von: Chee Sun Lee, Khamirul Amin Matori, Sidek Hj. Ab Aziz, Halimah Mohamed Kamari, Ismayadi Ismail, Mohd Hafiz Mohd Zaid

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 23/2017

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Abstract

Zinc silicate (ZnO–SiO2) glass system were fabricated using melt-quench method with zinc oxide (ZnO) and white rice husk ash (WRHA) with compositions of (ZnO)x(WRHA)1−x where (x = 0.55, 0.60, 0.65 and 0.70 wt%). Energy Dispersive X-ray Fluorescence (EDXRF), X-ray diffraction (XRD), Fourier Transform Infrared (FTIR) spectroscopy and UV–Visible (UV–Vis) absorption spectroscopy were used to investigate the structural and optical properties of the samples. From XRD measurement, only one sample is glass and others were in crystalline form as WRHA is used to replace silica (SiO2). This is because WRHA possess nucleating agents in its composition and this causes the samples to be highly crystalline. ZnO in the other hand is a highly crystalline material and encourages the formation of crystalline phase in the samples. FTIR analysis shows that the non-bridging oxygen’s (NBO’s) are formed as the amount of ZnO in the samples increases. The optical band gap shows that the optical band gap rises due to direct forbidden transition. ZnO–SiO2 glass system has variety of applicable characteristic because it possesses high level of chemical inertness for variety of chemical applications and it also gives various color emission which can be used in the plasma display panels (PDPs) and cathode-ray phosphor.

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Metadaten
Titel
Fabrication and characterization of glass and glass-ceramic from rice husk ash as a potent material for opto-electronic applications
verfasst von
Chee Sun Lee
Khamirul Amin Matori
Sidek Hj. Ab Aziz
Halimah Mohamed Kamari
Ismayadi Ismail
Mohd Hafiz Mohd Zaid
Publikationsdatum
21.08.2017
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 23/2017
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-017-7699-3

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