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1998 | OriginalPaper | Buchkapitel

Failure analysis

verfasst von : Dr. Sten Hellström

Erschienen in: ESD — The Scourge of Electronics

Verlag: Springer Berlin Heidelberg

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By failure analysis it is possible to find out what has happened to a component that does not function properly and why. Only the failure mechanisms being known the cause of failure can be eliminated. Thus avoiding future problems. The more severe the consequences of a failure is the more important it is to deduce the causes.

Metadaten
Titel
Failure analysis
verfasst von
Dr. Sten Hellström
Copyright-Jahr
1998
Verlag
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-642-80302-4_5

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