1992 | OriginalPaper | Buchkapitel
Fault Modeling
verfasst von : Kenneth M. Butler, M. Ray Mercer
Erschienen in: Assessing Fault Model and Test Quality
Verlag: Springer US
Enthalten in: Professional Book Archive
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Fault models for electronic circuits are abstractions of mechanisms which could cause the device of interest to fail. As we have seen, the quality of a test set is strongly correlated with the “quality” of the fault model used. In this chapter, we review the fundamentals of fault modeling for digital circuits and discuss the characteristics of the models used in this research.