Fault-Tolerance in Imaging-Oriented Systolic Arrays

Image Processing often involves convolutions and Fourier Transforms (DFT and FFT): these specific operations are well implemented by means of a systolic multi-pipeline structure.Practical implementations require large pipelines, adopting highly integrated circuits that are prone to production defects and run-time faults; efficient fault-tolerance through reconfiguration is then required.Still, the basic problem of concurrent (or semi-concurrent) testing must be solved prior to any reconfiguration step. Here, we prove how these structures allow to perform testing by a simple technique (based on the classical LSSD method) so that added circuits required due to testing functions is kept very limited.