Introduction
Classification of Models
Phase Transformation Model
\( c_{\gamma } = \frac{{\left( {c_{0} - X_{f} c_{\alpha } } \right)}}{{1 - X_{f} }}\,X_{f0} = \frac{{c_{\gamma \alpha } - c_{0} }}{{c_{\gamma \alpha } - c_{\alpha } }} \)
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\( c_{\gamma \alpha } = 4. 7 7 9 6 8- 0. 0 0 5 7 8 2T \)
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\( c_{\gamma \beta } = - 0. 8 5 6 3 3+ 0. 0 0 2 1 6 7T \)
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\( B_{s} = a_{20} - 425[{\text{C}}] - 42.5[{\text{Mn}}] - 31.5[{\text{Ni}}] - 70[{\text{Cr}}] \)
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\( M_{s} = a_{26} - a_{27} c_{\gamma } \)
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\( X_{m} = 1 - \exp \left[ { - 0.011\left( {M_{s} - T} \right)} \right] \)
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\( F_{m} = \left( {1 - F_{f} - F_{p} - F_{b} } \right)X_{m} \)
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Parameter | Ferrite | Pearlite | Bainite |
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k = f(T) |
\( k = \frac{{a_{5} }}{{D_{\gamma } }}\exp \left[ { - \left( {\frac{{T - Ae_{3} - \frac{400}{{D_{\gamma } }} + a_{6} }}{{a_{8} }}} \right)^{{a_{7} }} } \right] \)
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\( k = a_{12} \)
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\( k = a_{23} \exp \left( {a_{22} - a_{21} T} \right) \)
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Incubation time | — |
\( \tau_{P} = \frac{{a_{9} }}{{\left( {Ae_{1} - T} \right)^{{a_{11} }} }}\exp \left[ {\frac{{a_{10} }}{{R\left( {T + 273} \right)}}} \right] \)
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\( \tau_{b} = \frac{{a_{17} }}{{\left( {B_{s} - T} \right)^{{a_{19} }} }}\exp \left[ {\frac{{a_{18} }}{{R\left( {T + 273} \right)}}} \right] \)
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Experiment and Identification
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1039 | 4.861 | 2.866 | 2.119 | 0.699 | 148.2 | 55.35 |
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2.141 | 75.01 | 2.124 | 0.579 | 1.0 | 1.285 | 1600 |
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64.64 | 3.495 | 715.8 | 2.485 | 0.374 | 2.5 | 4.038 |
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435.0 | 2.326 | 9636 | 79.4 | 0.229 |
Continuous Annealing
Simplified Multiscale Model
Idea of the RVE and SSRVE
Creation of the SSRVE
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Filtering: The first step of an analysis aims at phase and edge detection to obtain images with clearly separated phases. It is required to use one of the binarization algorithms as a preconditioner to get a resultant image containing only black and white areas. This procedure is applied not only in the case of multiphase metals but also in the case of alloys.[15] The presented approach of the SSRVE creation assumes that an analyzed phase is always black and the background is white.
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Segmentation: Before shape factors estimation, it is necessary to separate the inclusions from each other because some inclusions are usually joined together by thin artefacts related to ferrite grain boundaries, scratches, etc.[16] The separation is performed by using segmentation methods, which can be divided into four following groups[17]: convolution, nature inspired, diffusion based, and clustering based. Usually in the case of dual-phase micrographics, connected areas are processed subsequently by morphology-based image filtering methods, e.g., erosion or dilation, and by grain boundary detection algorithms to separate particular grains within each phase. The ferrite grain boundaries are not important in this application, and the whole analysis is focused in the inclusion phase. The shape coefficients, which characterize the inclusion, are calculated and used to design the SSRVE. The results of the segmentation of the microstructure investigated in the current work are presented in Figure 9.×
Simulation of Stamping
Discussion
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7-point SSRVE
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1072 elements—11 seconds
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1798 elements—14 seconds
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10-point SSRVE
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849 elements—10 seconds
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2262 elements—25 seconds
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13-point SSRVE
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813 elements—8 seconds
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1949 elements—20 seconds
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Original microstructure
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96,549 elements—308 seconds
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