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2018 | OriginalPaper | Buchkapitel

FTScMES: A New Mutation Execution Strategy Based on Failed Tests’ Mutation Score for Fault Localization

verfasst von : André Assis Lôbo de Oliveira, Celso G. Camilo Jr, Eduardo Noronha de Andrade Freitas, Auri Marcelo Rizzo Vincenzi

Erschienen in: Computer and Information Sciences

Verlag: Springer International Publishing

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Abstract

Fault localization has been one of the most expensive activity in the whole debugging process. The spectrum-based fault localization (SBFL) is the most studied and evaluated technique. Other approach is the mutation-based fault localization technique (MBFL) that needs to execute the test suite on a large amount of mutants increasing its cost. Efforts from research community have been performed in order to achieve solutions reducing such cost and keeping a minimum quality. Current mutation execution strategies are evaluated considering artificial faults. However, recent researches show that some MBFL techniques exhibit low efficacy fault localization when evaluated on real faults. In this paper, we propose a new mutation execution strategy based on failed tests’ mutation score, called (FTScMES), aiming to increase the efficacy on fault localization reducing the cost of mutants execution. FTScMES uses only the set of failed test cases to execute mutants and bases on mutation score concept to compute the suspiciousness statements. The experiments were conducted considering 221 real faults, comparing the efficacy of localization of FTScMES against 5 baselines from the literature. We found that FTScMES outperforms the baselines reducing the cost in 90% on average with a high efficacy of ranking defective code.

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Literatur
2.
Zurück zum Zitat Abreu, R., Zoeteweij, P., c. Van Gemund, A.J.: An evaluation of similarity coefficients for software fault localization. In: 2006 12th Pacific Rim International Symposium on Dependable Computing (PRDC 2006), pp. 39–46, December 2006 Abreu, R., Zoeteweij, P., c. Van Gemund, A.J.: An evaluation of similarity coefficients for software fault localization. In: 2006 12th Pacific Rim International Symposium on Dependable Computing (PRDC 2006), pp. 39–46, December 2006
3.
Zurück zum Zitat Abreu, R., Zoeteweij, P., van Gemund, A.J.C.: On the accuracy of spectrum-based fault localization. In: Proceedings of the Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION, pp. 89–98. TAICPART-MUTATION 2007. IEEE Computer Society, Washington, DC, USA (2007) Abreu, R., Zoeteweij, P., van Gemund, A.J.C.: On the accuracy of spectrum-based fault localization. In: Proceedings of the Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION, pp. 89–98. TAICPART-MUTATION 2007. IEEE Computer Society, Washington, DC, USA (2007)
4.
Zurück zum Zitat Campos, J., Riboira, A., Perez, A., Abreu, R.: Gzoltar: an eclipse plug-in for testing and debugging. In: 2012 Proceedings of the 27th IEEE/ACM International Conference on Automated Software Engineering, pp. 378–381, September 2012. https://doi.org/10.1145/2351676.2351752 Campos, J., Riboira, A., Perez, A., Abreu, R.: Gzoltar: an eclipse plug-in for testing and debugging. In: 2012 Proceedings of the 27th IEEE/ACM International Conference on Automated Software Engineering, pp. 378–381, September 2012. https://​doi.​org/​10.​1145/​2351676.​2351752
5.
Zurück zum Zitat Gong, P., Zhao, R., Li, Z.: Faster mutation-based fault localization with a novel mutation execution strategy. In: 2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), pp. 1–10, April 2015 Gong, P., Zhao, R., Li, Z.: Faster mutation-based fault localization with a novel mutation execution strategy. In: 2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), pp. 1–10, April 2015
6.
Zurück zum Zitat Jones, J.A., Harrold, M.J.: Empirical evaluation of the tarantula automatic fault-localization technique. In: Proceedings of the IEEE/ACM International Conference on Automated Software Engineering, pp. 273–282 (2005) Jones, J.A., Harrold, M.J.: Empirical evaluation of the tarantula automatic fault-localization technique. In: Proceedings of the IEEE/ACM International Conference on Automated Software Engineering, pp. 273–282 (2005)
7.
8.
Zurück zum Zitat Just, R., Jalali, D., Ernst, M.D.: Defects4J: a database of existing faults to enable controlled testing studies for Java programs. In: Proceedings of the 2014 International Symposium on Software Testing and Analysis, ISSTA 2014, pp. 437–440. San Jose, CA, USA, July 2014. (tool demo) Just, R., Jalali, D., Ernst, M.D.: Defects4J: a database of existing faults to enable controlled testing studies for Java programs. In: Proceedings of the 2014 International Symposium on Software Testing and Analysis, ISSTA 2014, pp. 437–440. San Jose, CA, USA, July 2014. (tool demo)
9.
Zurück zum Zitat Liu, Y., Li, Z., Wang, L., Hu, Z., Zhao, R.: Statement-oriented mutant reduction strategy for mutation based fault localization. In: 2017 IEEE International Conference on Software Quality, Reliability and Security (QRS), pp. 126–137, July 2017 Liu, Y., Li, Z., Wang, L., Hu, Z., Zhao, R.: Statement-oriented mutant reduction strategy for mutation based fault localization. In: 2017 IEEE International Conference on Software Quality, Reliability and Security (QRS), pp. 126–137, July 2017
10.
Zurück zum Zitat Moon, S., Kim, Y., Kim, M., Yoo, S.: Ask the mutants: mutating faulty programs for fault localization. In: Proceedings of the 2014 IEEE International Conference on Software Testing, Verification, and Validation, ICST 2014, pp. 153–162. IEEE Computer Society, Washington, DC, USA (2014) Moon, S., Kim, Y., Kim, M., Yoo, S.: Ask the mutants: mutating faulty programs for fault localization. In: Proceedings of the 2014 IEEE International Conference on Software Testing, Verification, and Validation, ICST 2014, pp. 153–162. IEEE Computer Society, Washington, DC, USA (2014)
12.
Zurück zum Zitat Papadakis, M., Traon, Y.L.: Using mutants to locate “unknown” faults. In: 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation (ICST), pp. 691–700, April 2012 Papadakis, M., Traon, Y.L.: Using mutants to locate “unknown” faults. In: 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation (ICST), pp. 691–700, April 2012
13.
Zurück zum Zitat Papadakis, M., Le Traon, Y.: Effective fault localization via mutation analysis: a selective mutation approach. In: Proceedings of the 29th Annual ACM Symposium on Applied Computing, SAC 2014, pp. 1293–1300. ACM, New York (2014) Papadakis, M., Le Traon, Y.: Effective fault localization via mutation analysis: a selective mutation approach. In: Proceedings of the 29th Annual ACM Symposium on Applied Computing, SAC 2014, pp. 1293–1300. ACM, New York (2014)
15.
Zurück zum Zitat Sohn, J., Yoo, S.: FLUCCS: Using code and change metrics to improve fault localization. In: Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2017, pp. 273–283. ACM, New York (2017). https://doi.org/10.1145/3092703.3092717 Sohn, J., Yoo, S.: FLUCCS: Using code and change metrics to improve fault localization. In: Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2017, pp. 273–283. ACM, New York (2017). https://​doi.​org/​10.​1145/​3092703.​3092717
16.
18.
Zurück zum Zitat Wong, W.E., Gao, R., Li, Y., Abreu, R., Wotawa, F.: A survey on software fault localization. IEEE Trans. Softw. Eng. 42(8), 707–740 (2016)CrossRef Wong, W.E., Gao, R., Li, Y., Abreu, R., Wotawa, F.: A survey on software fault localization. IEEE Trans. Softw. Eng. 42(8), 707–740 (2016)CrossRef
Metadaten
Titel
FTScMES: A New Mutation Execution Strategy Based on Failed Tests’ Mutation Score for Fault Localization
verfasst von
André Assis Lôbo de Oliveira
Celso G. Camilo Jr
Eduardo Noronha de Andrade Freitas
Auri Marcelo Rizzo Vincenzi
Copyright-Jahr
2018
DOI
https://doi.org/10.1007/978-3-030-00840-6_20