Weitere Kapitel dieses Buchs durch Wischen aufrufen
The evolution of CMOS technology and the increased market pressures have set stricter reliability requirements when designing integrated circuits. As one of the dominant unreliability sources, wearout needs to be addressed in a more efficient and effective way. This book has introduced one promising approach which can reverse the effect of wearout through active accelerated recovery techniques. Even if our focus has been mainly on digital CMOS circuits, we believe that similar methods can also be applied to new emerging technologies and can be integrated with the proposed wearout mitigation infrastructure. In this chapter, we preview several such directions that are inspired by self-healing. We believe that instrumenting recovery can be an effective design dimension for securing resilience of future electronic systems.
Bitte loggen Sie sich ein, um Zugang zu diesem Inhalt zu erhalten
Sie möchten Zugang zu diesem Inhalt erhalten? Dann informieren Sie sich jetzt über unsere Produkte:
Geoffrey W Burr, Robert M Shelby, Abu Sebastian, Sangbum Kim, Seyoung Kim, Severin Sidler, Kumar Virwani, Masatoshi Ishii, Pritish Narayanan, Alessandro Fumarola, et al. Neuromorphic computing using non-volatile memory. Advances in Physics: X, 2(1):89–124, 2017.
Bert L Allen and A Rahim Forouhi. Eprom with ultraviolet radiation transparent silicon nitride passivation layer, May 12 1987. US Patent 4,665,426.
S Sarma, N Dutt, N Venkatasubramanian, A Nicolau, and P Gupta. Cyberphysical system-on-chip (cpsoc): Sensor actuator rich self-aware computational platform. University of California Irvine, Tech. Rep. CECS TR-13-06, 2013.
David Brooks and Margaret Martonosi. Dynamic thermal management for high-performance microprocessors. In High-Performance Computer Architecture, 2001. HPCA. The Seventh International Symposium on, pages 171–182. IEEE, 2001.
- Future Directions in Self-healing
Mircea R. Stan
- Chapter 7