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2008 | OriginalPaper | Buchkapitel

21. Geometric Moiré

verfasst von : Bongtae Han, Prof., Daniel Post, Ph.D

Erschienen in: Springer Handbook of Experimental Solid Mechanics

Verlag: Springer US

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Abstract

Our goal in this chapter is to review the fundamental concepts of geometric moiré that are usually addressed in the study of optical methods of experimental mechanics and engineering practice. Moiré methods can measure the in-plane and out-of-plane components of displacement. Herein emphasis is placed on the measurement of deformations that occur when a body is subjected to applied forces or temperature changes. An additional goal is to build a foundation for easy assimilation of the concepts of high-sensitivity moiré interferometry presented in the next chapter. Much of this chapter is excerpted from [21.1,2] with the kind permission of Springer Science and Business Media, and from [21.3].

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Literatur
21.1.
Zurück zum Zitat D. Post, B. Han, P. Ifju: High Sensitivity Moiré: Experimental Analysis for Mechanics and Materials (Springer, New York 1994) D. Post, B. Han, P. Ifju: High Sensitivity Moiré: Experimental Analysis for Mechanics and Materials (Springer, New York 1994)
21.2.
Zurück zum Zitat D. Post, B. Han, P. Ifju: Moiré methods for engineering and science – moiré interferometry and shadow moiré. In: Photomechanics, ed. by P.K. Rastogi (Springer, New York 2000) D. Post, B. Han, P. Ifju: Moiré methods for engineering and science – moiré interferometry and shadow moiré. In: Photomechanics, ed. by P.K. Rastogi (Springer, New York 2000)
21.3.
Zurück zum Zitat C.W. Han: Shadow Moire Using Non-zero Talbot Distance and Application of Diffraction Theory to Moire Interferometry. Ph.D. Thesis (University of Maryland, Maryland 2005) C.W. Han: Shadow Moire Using Non-zero Talbot Distance and Application of Diffraction Theory to Moire Interferometry. Ph.D. Thesis (University of Maryland, Maryland 2005)
21.4.
Zurück zum Zitat A.J. Durelli, V.J. Parks: Moiré Analysis of Strain (Prentice-Hall, Englewood Cliffs 1970) A.J. Durelli, V.J. Parks: Moiré Analysis of Strain (Prentice-Hall, Englewood Cliffs 1970)
21.5.
Zurück zum Zitat G. Mesmer: The interference screen method for isopachic patterns, Proc. Soc. Exp. Stress Anal. XIII(2), 21–26 (1956) G. Mesmer: The interference screen method for isopachic patterns, Proc. Soc. Exp. Stress Anal. XIII(2), 21–26 (1956)
21.6.
21.7.
Zurück zum Zitat J.B. Allen, D.M. Meadows: Removal of unwanted patterns from moiré contour maps by grid translation techniques, Appl. Opt. 10, 210–212 (1971)CrossRef J.B. Allen, D.M. Meadows: Removal of unwanted patterns from moiré contour maps by grid translation techniques, Appl. Opt. 10, 210–212 (1971)CrossRef
21.8.
Zurück zum Zitat M. Halioua, R.S. Krishnamurthy, H. Liu, F.P. Chiang: projection moiré with moving gratings for automated 3-D topography, Appl. Opt. 22, 850–855 (1983)CrossRef M. Halioua, R.S. Krishnamurthy, H. Liu, F.P. Chiang: projection moiré with moving gratings for automated 3-D topography, Appl. Opt. 22, 850–855 (1983)CrossRef
21.9.
Zurück zum Zitat K. Patorski: The self-imaging phenomenon and its applications. In: Progress in Optics, Vol. XXVII, ed. by E. Wolf (North-Holland, Amsterdam 1989) K. Patorski: The self-imaging phenomenon and its applications. In: Progress in Optics, Vol. XXVII, ed. by E. Wolf (North-Holland, Amsterdam 1989)
21.10.
Zurück zum Zitat M. Testorf, J. Jahns, N. Khilo, A. Goncharenko: Talbot effect for oblique angle of light propagation, Opt. Commun. 129, 167–172 (1996)CrossRef M. Testorf, J. Jahns, N. Khilo, A. Goncharenko: Talbot effect for oblique angle of light propagation, Opt. Commun. 129, 167–172 (1996)CrossRef
21.11.
Zurück zum Zitat K. Verma, D. Columbus, B. Han: Development of real time/variable sensitivity warpage measurement technique and its application to plastic ball grid array package, IEEE Trans. Electron. Packag. Manuf. 22, 63–70 (1999)CrossRef K. Verma, D. Columbus, B. Han: Development of real time/variable sensitivity warpage measurement technique and its application to plastic ball grid array package, IEEE Trans. Electron. Packag. Manuf. 22, 63–70 (1999)CrossRef
21.12.
Zurück zum Zitat B. Han: Thermal stresses in microelectronics subassemblies: Quantitative characterization using photomechanics methods, J. Therm. Stress. 26, 583–613 (2003)CrossRef B. Han: Thermal stresses in microelectronics subassemblies: Quantitative characterization using photomechanics methods, J. Therm. Stress. 26, 583–613 (2003)CrossRef
21.13.
Zurück zum Zitat C.-W. Han, B. Han: Contrast of shadow moiré at high order Talbot distances, Opt. Eng. 44, 1–6 (2005) C.-W. Han, B. Han: Contrast of shadow moiré at high order Talbot distances, Opt. Eng. 44, 1–6 (2005)
21.14.
Zurück zum Zitat C. Han, B. Han: High sensitivity shadow moiré using nonzero-order Talbot distance, Exp. Mech. 46, 543–554 (2006)CrossRef C. Han, B. Han: High sensitivity shadow moiré using nonzero-order Talbot distance, Exp. Mech. 46, 543–554 (2006)CrossRef
21.15.
Zurück zum Zitat C.-W. Han, B. Han: Error analysis of phase shifting technique when applied to shadow moiré, Appl. Opt. 45, 1124–1133 (2006)CrossRef C.-W. Han, B. Han: Error analysis of phase shifting technique when applied to shadow moiré, Appl. Opt. 45, 1124–1133 (2006)CrossRef
21.16.
Zurück zum Zitat B. Han: Interferometric methods with enhanced sensitivity by optical/digital fringe multiplication, Appl. Opt. 32(25), 4713–4718 (1993)CrossRef B. Han: Interferometric methods with enhanced sensitivity by optical/digital fringe multiplication, Appl. Opt. 32(25), 4713–4718 (1993)CrossRef
21.17.
Zurück zum Zitat J. Huntley: Automated fringe pattern analysis in experimental mechanics: A review, J. Strain Anal. 33(2), 105–125 (1998)CrossRef J. Huntley: Automated fringe pattern analysis in experimental mechanics: A review, J. Strain Anal. 33(2), 105–125 (1998)CrossRef
21.18.
Zurück zum Zitat P. Hariharan: Quasi-heterodyne hologram interferometry, Opt. Eng. 24(4), 632–638 (1985)MathSciNet P. Hariharan: Quasi-heterodyne hologram interferometry, Opt. Eng. 24(4), 632–638 (1985)MathSciNet
Metadaten
Titel
Geometric Moiré
verfasst von
Bongtae Han, Prof.
Daniel Post, Ph.D
Copyright-Jahr
2008
Verlag
Springer US
DOI
https://doi.org/10.1007/978-0-387-30877-7_21

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