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Erschienen in: Journal of Intelligent Manufacturing 1/2017

24.08.2014

Heuristic particle swarm optimization approach for test point selection with imperfect test

verfasst von: Sen Deng, Bo Jing, Hongliang Zhou

Erschienen in: Journal of Intelligent Manufacturing | Ausgabe 1/2017

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Abstract

The problem of near-optimal test point set selection with imperfect test is solved by using the heuristic particle swarm optimization (HPSO) algorithm. First, to describe the uncertainty of each test, the testability analysis model and such indexes as fault detection rate, fault isolation rate, and false alarm rate are redefined. A heuristic function is then established to evaluate the detection isolation capability and uncertainty of the test point, which can provide heuristic information to improve the searching efficiency of particle swarm optimization (PSO). The heuristic function and least test cost principle are used as bases to design a fitness function of PSO algorithm for test point selection. Finally, the HPSO algorithm is proposed to select the optimal test point set for two practical systems. Simulation and experiment results show that the method can determine the global optimal test point accurately and effectively while meeting the requirements of testability indexes with least cost.

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Metadaten
Titel
Heuristic particle swarm optimization approach for test point selection with imperfect test
verfasst von
Sen Deng
Bo Jing
Hongliang Zhou
Publikationsdatum
24.08.2014
Verlag
Springer US
Erschienen in
Journal of Intelligent Manufacturing / Ausgabe 1/2017
Print ISSN: 0956-5515
Elektronische ISSN: 1572-8145
DOI
https://doi.org/10.1007/s10845-014-0960-1

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