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2015 | OriginalPaper | Buchkapitel

12. Higher Resolution Scanning Probe Methods for Magnetic Imaging

verfasst von : S. N. Piramanayagam, Binni Varghese

Erschienen in: Surface Science Tools for Nanomaterials Characterization

Verlag: Springer Berlin Heidelberg

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Abstract

With the emergence of nanotechnology, the feature size of devices is getting smaller and smaller and the demand for higher resolution imaging tools is growing. For the visualization of magnetic domains of nanostructures and thin films, magnetic force microscopy is the feasible and most utilized technique. The resolution of MFM is about 20–30 nm in the current instruments and efforts to improve the resolution in the sub-10 nm range are in progress. In this chapter, an overview of key research findings of several researchers and recent advances in the direction of improving the MFM resolution is provided.

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Vorheriges Kapitel Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy

Nächstes Kapitel Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy

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Titel: Higher Resolution Scanning Probe Methods for Magnetic Imaging
verfasst von: S. N. Piramanayagam
Binni Varghese
Verlag: Springer Berlin Heidelberg
Buch: Surface Science Tools for Nanomaterials Characterization
Print ISBN: 978-3-662-44550-1

Electronic ISBN: 978-3-662-44551-8

Copyright-Jahr: 2015
DOI: https://doi.org/10.1007/978-3-662-44551-8_12

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