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02.12.2016 | Original Paper

In situ hard X-ray transmission microscopy for material science

verfasst von: Ken Vidar Falch, Daniele Casari, Marco Di Michiel, Carsten Detlefs, Anatoly Snigireva, Irina Snigireva, Veijo Honkimäki, Ragnvald H. Mathiesen

Erschienen in: Journal of Materials Science | Ausgabe 6/2017

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Abstract

Hard X-ray transmission microscopy based on refractive X-ray optics can be employed as a tool in material science to investigate buried-in microstructures in two or three dimensions with spatial resolution approaching 100 nm. Switching from monochromatic to radiation with a broader bandwidth, frame rates down to a few milliseconds can be realized, opening new possibilities for in situ studies of microstructure evolution and response to external fields at spatiotemporal resolutions that go well beyond previous benchmarks, demonstrated by ~200 nm resolution tomograms of eutectic microstructures acquired in less than 2 s. The microscope can also be operated in Zernike phase contrast mode, which expands the range of possible applications to cases which otherwise would produce only very faint contrast. A few possible application areas for the microscope are illustrated by a selection of material science test cases.

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Metadaten
Titel
In situ hard X-ray transmission microscopy for material science
verfasst von
Ken Vidar Falch
Daniele Casari
Marco Di Michiel
Carsten Detlefs
Anatoly Snigireva
Irina Snigireva
Veijo Honkimäki
Ragnvald H. Mathiesen
Publikationsdatum
02.12.2016
Verlag
Springer US
Erschienen in
Journal of Materials Science / Ausgabe 6/2017
Print ISSN: 0022-2461
Elektronische ISSN: 1573-4803
DOI
https://doi.org/10.1007/s10853-016-0643-8

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