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2016 | OriginalPaper | Buchkapitel

7. In Situ SXS and XAFS Measurements of Electrochemical Interface

verfasst von : Toshihiro Kondo, Takuya Masuda, Kohei Uosaki

Erschienen in: X-ray and Neutron Techniques for Nanomaterials Characterization

Verlag: Springer Berlin Heidelberg

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Abstract

In this chapter, we focus on structural studies at electrode/electrolyte solution interfaces by means of surface x-ray scattering (SXS) and x-ray absorption fine structure (XAFS) measurements using synchrotron radiation (SR) light as an x-ray source. After describing the importance of these techniques for structural studies at the electrode/electrolyte interface as an introduction, we explain the fundamental principles and experimental methodologies of these techniques. Finally, we describe trends in the development of these techniques and review the latest topics.

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Metadaten
Titel
In Situ SXS and XAFS Measurements of Electrochemical Interface
verfasst von
Toshihiro Kondo
Takuya Masuda
Kohei Uosaki
Copyright-Jahr
2016
Verlag
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-662-48606-1_7

    Marktübersichten

    Die im Laufe eines Jahres in der „adhäsion“ veröffentlichten Marktübersichten helfen Anwendern verschiedenster Branchen, sich einen gezielten Überblick über Lieferantenangebote zu verschaffen.