Skip to main content
Fachgebiete
Automobil + Motoren Bauwesen + Immobilien Business IT + Informatik Elektrotechnik + Elektronik Energie + Nachhaltigkeit Finance + Banking Management + Führung Marketing + Vertrieb Maschinenbau + Werkstoffe Versicherung + Risiko
DE
EN
Bücher
Zeitschriften
Themenseiten
Organisationspsychologie Projektmanagement Marketing Smart Manufacturing
Weitere Formate
Podcasts Webinare Technik Webinare Wirtschaft Kongresse Veranstaltungskalender Awards
Jetzt Einzelzugang starten
Zugang für Unternehmen
Referenzkunden
SLX-Digitalkonferenz: Zukunftswerkstatt 2024

Mehr Umsatz mit Top-Kontakten

Am 7. Mai erfahren Sie, wie Vertriebsteams Leadgenerierung, Leadnurturing und Leadstrategien effizient steuern können.
Erweiterte Suche
Anmelden
nach oben
Erschienen in:
Atomic Resolution Transmission Electron Microscopy Kapitel lesen Erstes Kapitel lesen

2019 | OriginalPaper | Buchkapitel

3. In Situ Transmission Electron Microscopy

verfasst von : Frances M. Ross, Andrew M. Minor

Erschienen in: Springer Handbook of Microscopy

Verlag: Springer International Publishing

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

In situ transmission electron microscopy provides dynamic observations of the physical behavior of materials in response to external stimuli such as temperature, gas environment, stress, and electric or magnetic fields. The goal of these experiments is to provide insight into atomic or nanoscale phenomena that are not easily accessed by other methods to inform our understanding of materials properties. In this chapter, we aim to demonstrate how in situ microscopy has enhanced our understanding of dynamic phenomena associated with phase transformations, catalysis, crystal growth, liquid-phase processes, electrical and mechanical properties, magnetism, and ferroelectricity. We also address dynamic processes induced by the electron beam, whether intentional or not. In many cases, in situ research is driven by developments in novel instrumentation and testing methodologies. We discuss how advances in aberration correction, sample preparation and manipulation, detector development, and data analysis enable new types of in situ experiments and provide fundamental insight into dynamic materials phenomena.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Jetzt informieren

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Jetzt informieren
Vorheriges Kapitel Scanning Transmission Electron Microscopy
Nächstes Kapitel Cryo-Electron Tomography
Literatur
R. Ramachandramoorthy, R. Bernal, H.D. Espinosa: ACS Nano 9, 4675–4685 (2015)
T. Xu, L. Sun: Small 11, 3247–3262 (2015)
M.L. Taheri, E.A. Stach, I. Arslan, P.A. Crozier, B.C. Kabius, T. LaGrange, A.M. Minor, S. Takeda, M. Tanase, J.B. Wagner, R. Sharma: Ultramicroscopy 170, 86–95 (2016)
G. Dehm, J.M. Howe, J. Zweck: In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science (Wiley, Hoboken 2012)
F.M. Ross (Ed.): Liquid Cell Electron Microscopy (Cambridge Univ. Press, Cambridge 2016)
T. Brintlinger, Y. Qi, K.H. Baloch, D. Goldhaber-Gordon, J. Cumings: Nano Lett. 8, 582 (2008)
M. Mecklenburg, W.A. Hubbard, E.R. White, R. Dhall, S.B. Cronin, S. Aloni, B.C. Regan: Science 347, 629–632 (2015)
T.J. Konno, R. Sinclair: Philos. Mag. B 71, 179–199 (1995)
M.A. Parker, R. Sinclair: Nature 322, 531–533 (1986)
R. Sinclair, M.A. Parker, K.B. Kim: Ultramicroscopy 23, 383–395 (1987)
T.J. Konno, R. Sinclair: Philos. Mag. B 66, 749–765 (1992)
T.J. Konno, R. Sinclair: Philos. Mag. B 71, 163–178 (1995)
T.J. Konno, R. Sinclair: Acta Metall. Mater. 43, 471–484 (1995)
R. Sinclair, T. Itoh, R. Chin: Microsc. Microanal. 8, 288–304 (2002)
R. Hull, J. Bean: Mater. Res. Soc. Bull. 19(6), 32–37 (1994)
E.A. Stach, R. Hull, J.C. Bean, K.S. Jones, A. Nejim: Microsc. Microanal. 4, 294–307 (1998)
M.T. Janish, W.M. Mook, C.B. Carter: Scr. Mater. 96, 21–24 (2014)
H.-J. Lee, A.G. Ramirez: Appl. Phys. Lett. 85, 1146 (2004)
H.-J. Lee, H. Ni, D.T. Wu, A.G. Ramirez: Appl. Phys. Lett. 87, 124102 (2005)
C.J. Alvarez, Y. Liu, R.L. Leonard, J.A. Johnson, A.K. Petford-Long: J. Am. Ceram. Soc. 96, 3617–3621 (2013)
J.A. Aguiar, S. Wozny, T.G. Holesinger, T. Aoki, M.K. Patel, M. Yang, J.J. Berry, M. Al-Jassim, W. Zhou, K. Zhu: Energy Environ. Sci. 9, 2372–2382 (2016)
L. He, J.P. Chu, C.L. Li, C.M. Lee, Y.C. Chen, P.K. Liaw, P.M. Voyles: Thin Solid Films 561(87), 92 (2014)
B.J. Kooi, J.T.M. De Hosson: J. Appl. Phys. 95, 4714–4721 (2004)
M. Kaiser, L. van Pieterson, M.A. Verheijen: J. Appl. Phys. 96, 3193–3198 (2004)
B.J. Kooi, W.M.G. Groot, J.T.M. De Hosson: J. Appl. Phys. 95, 924–932 (2004)
A.K. Petford-Long, R.C. Doole, C.N. Afonso, J. Solis: J. Appl. Phys. 77, 607–613 (1995)
T. Missana, C.N. Afonso, A.K. Petford-Long, R.C. Doole: Philos. Mag. A 79, 2577–2590 (1999)
R. Sinclair: Mater. Res. Soc. Bull. 19(6), 26–31 (1994)
B. Blanpain, J.-M. Legresy, J.W. Mayer: J. Phys. Colloq. 51(C-4), 131–137 (1990)
S.-W. Nam, H.-S. Chung, Y.C. Lo, L. Qi, J. Li, Y. Lu, A.T.C. Johnson, Y. Jung, P. Nukala, R. Agarwal: Science 336, 1561–1566 (2012)
Y.-C. Wang, W. Zhang, L.-Y. Wang, Z. Zhuang, E. Ma, J. Li, Z.-W. Shan: NPG Asia Mater. 8, e291 (2016)
Z. Liu, Y. Bando, M. Mitome, J. Zhan: Phys. Rev. Lett. 93, 095504 (2004)
Y. Gao, Y. Bando: Nature 415, 599–599 (2002)
T. Kato, K. Nunome, Y. Morimoto, K. Nishimura, H. Saka: Philos. Mag. Lett. 80, 187–192 (2000)
Y. Senda, K. Sasaki, H. Saka: Philos. Mag. 84, 2635–2649 (2004)
T.E.A. Zerrouk, M. Hamichi, J.D.H. Pilkington, J.A. Venables: Phys. Rev. B 50, 8946–8949 (1994)
J.M. Howe: Philos. Mag. A 74, 761–775 (1996)
H. Nishizawa, F. Hori, R. Oshima: J. Cryst. Growth 236, 51–58 (2002)
G.A. Storaska, K.T. Moore, J.M. Howe: Philos. Mag. 84, 2619–2634 (2004)
S.E. Donnelly, R.C. Birtcher, C.W. Allen, I. Morrison, K. Furuya, M. Song, K. Mitsuishi, U. Dahmen: Science 296, 507–510 (2002)
S.H. Oh, Y. Kauffmann, C. Scheu, W.D. Kaplan, M. Rühle: Science 310, 661–663 (2005)
M. Gandman, Y. Kauffmann, C.T. Koch, W.D. Kaplan: Phys. Rev. Lett. 110, 086106 (2013)
S. Arai, S. Tsukimoto, S. Muto, H. Saka: Microsc. Microanal. 6, 358–361 (2000)
S. Arai, S. Tsukimoto, H. Saka: J. Electron Microsc. 52, 79–84 (2003)
K. Sasaki, H. Saka: Mater. Res. Soc. Symp. Proc. 466, 185–190 (1997)
T. Kamino, K. Sasaki, H. Saka: Microsc. Microanal. 3, 393–408 (1997)
H. Saka, S. Arai, S. Tsukimoto, K. Sasaki: Mater. Sci. Forum 294–296, 617–620 (1999)
F. Niekiel, P. Schweizer, S.M. Kraschewski, B. Butz, E. Spiecker: Acta Mater. 90, 118–132 (2015)
R.-M. Keller, W. Sigle, S.P. Baker, O. Kraft, E. Arzt: Mater. Res. Soc. Symp. Proc. 436, 221–226 (1997)
R. Dannenberg, E. Stach, J.R. Grozac, B.J. Dresser: Thin Solid Films 379, 133–138 (2000)
B. Kaouache, P. Gergaud, O. Thomas, O. Bostrom, M. Legros: Microelectron. Eng. 70, 447–454 (2003)
R.C. Hugo, R.G. Hoagland: Scr. Mater. 38, 523–529 (1998)
R.C. Hugo, R.G. Hoagland: Scr. Mater. 41, 1341–1346 (1999)
K.L. Merkle, L.J. Thompson, F. Phillipp: Phys. Rev. Lett. 88, 225501 (2002)
D.L. Medlin, G.H. Campbell, C.R. Carter: Acta Mater. 46, 5135–5142 (1998)
K.L. Merkle, L.J. Thompson: Mater. Lett. 48, 188–193 (2001)
K.L. Merkle, L.J. Thompson, F. Phillipp: Philos. Mag. Lett. 82, 589–597 (2002)
M.L. Bowers, C. Ophus, A. Gautam, F. Lançon, U. Dahmen: Phys. Rev. Lett. 116, 106102 (2016)
A. Gautam, C. Ophus, F. Lançon, P. Denes, U. Dahmen: Ultramicroscopy 151, 78–84 (2015)
G. Lucadamo, D.L. Medlin: Acta Mater. 50, 3045–3055 (2002)
J.C. Jiang, X.Q. Pan: Philos. Mag. Lett. 80, 271–279 (2000)
D. Schryvers, Y. Ma: Mater. Lett. 23, 105–111 (1995)
Y. Gao, Y.Q. Liu, K.H. Wu: Mater. Res. Soc. Symp. Proc. 404, 171–176 (1996)
X.-G. Ma, K. Komvopoulos: J. Mater. Res. 20, 1808–1813 (2005)
D. Schryvers, M. Yandouzi, L. Toth: Thin Solid Films 326, 126–133 (1998)
Q. Ding, Z. Shen, S. Xiang, H. Tian, J. Li, Z. Zhang: J. Alloys Compd. 651, 255–258 (2015)
S. Gao, Y. Zhou, C.-F. Li, Z.-Q. Liu, T. Jin: J. Alloys Compd. 671, 458–464 (2016)
Q. Zhang, Y. Chang, L. Cu, Y. Luo, B. Ge: Scr. Mater. 126, 55–57 (2017)
J.M. Howe, W.T. Reynolds Jr., V.K. Vasudevan: Z. Metallkd. 95, 275–278 (2004)
J. Dutkiewicz, M. Bartsch, S. Miura, U. Messerschmidt, H. Kato: J. Phys. IV Colloq. 5(C2), 275–280 (1995)
X.D. Han, R. Wang, Z. Zhang, D.Z. Yang: Mater. Lett. 30, 23–28 (1997)
B. Jiang, T. Tadakit, H. Mori, T.Y. Hsu: Mater. Trans. JIM 38, 1072-77–1078–1082 (1997)
X. Gao, J.F. Nie: Scr. Mater. 57, 655–658 (2007)
T. Tamiya, D. Shindo, Y. Murakami, Y. Bando, K. Otsuka: Mater. Trans. JIM 39, 714–723 (1998)
W. Cai, Y. Murakami, K. Otsuka: Mater. Sci. Eng. A 273–275, 186–189 (1999)
Y. Murakami, D. Shindo: Philos. Mag. Lett. 81, 631–638 (2001)
S. Ii, M. Nishida, Y. Murakami, D. Shindo: J. Phys. IV Proc. 112, 1035–1038 (2003)
L.E. Tanner, A.R. Pelton, G. Van Tendeloo, D. Schryvers, M.E. Wall: Scr. Metall. Mater. 24, 1731–1736 (1990)
J. Ye, R.K. Mishra, A. Pelton, A.M. Minor: Acta Mater. 58, 490–498 (2010)
H. Guo, K. Chen, Y. Oh, K. Wang, C. Dejoie, S.A. Syed Asif, O.L. Warren, Z.W. Shan, J. Wu, A.M. Minor: Nano Lett. 11, 3207–3213 (2011)
T. Kuninori, E. Sukedai, H. Hashimoto: Mater. Trans. JIM 37, 1404–1407 (1996)
D. Schryvers, D.E. Lahjouji, B. Slootmaekers, P.L. Potapov: Scr. Mater. 35, 1235–1241 (1996)
H. Matsumoto, E. Sukedai, H. Hashimoto: Mater. Trans. JIM 40, 1436–1443 (1999)
F.M. Ross, R.R. Kola, R. Hull, J.C. Bean: Mater. Res. Soc. Symp. Proc. 318, 697–702 (1993)
T.L. Morkved, W.A. Lopes, J. Hahm, S.J. Sibener, H.M. Jaeger: Polymer 39, 3871–3875 (1998)
A.W. Grant, Q.-H. Hu, B. Kasemo: Nanotechnology 15, 1175–1181 (2004)
H. Tanaka, T.J. Konno, R. Sinclair, N. Hirashita: J. Appl. Phys. 78, 4982–4987 (1995)
H. Tanaka, N. Hirashita, R. Sinclair: Jpn. J. Appl. Phys. 35(2), L479 (1996)
H. Tanaka, N. Hirashita, R. Sinclair: Jpn. J. Appl. Phys. 37(1), 4284–4287 (1998)
M.V. Sidorov, B. Kardynal, D.J. Smith: Microsc. Microanal. 4, 317–324 (1998)
C. Hayzelden, J.L. Batstone: J. Appl. Phys. 73, 8279–8231 (1993)
V. Teodorescu, L. Nistor, H. Bender, A. Steegen, A. Lauwers, K. Maex, J. Van Landuyt: J. Appl. Phys. 90, 167–174 (2001)
C. Ghica, L. Nistor, H. Bender, A. Steegen, A. Lauwers, K. Maex, J. Van Landuyt: J. Mater. Res. 16, 701–708 (2001)
L.M. Gignac, V. Svilan, L.A. Clevenger, C. Cabral, C. Lavoie: Mater. Res. Soc. Symp. Proc. 441, 225–230 (1997)
C.-Y. Wen, F. Spaepen: Philos. Mag. 87(35), 5581–5599 (2007)
Y.-C. Chou, W.-W. Wu, S.-L. Cheng, B.-Y. Yoo, N. Myung, L.J. Chen, K.N. Tu: Nano Lett. 8, 2194–2199 (2008)
Y.-C. Chou, W.-W. Wu, L.J. Chen, K.N. Tu: Nano Lett. 9, 2337–2342 (2009)
Y.-C. Chou, W. Tang, C.-J. Chiou, K. Chen, A.M. Minor, K.N. Tu: Nano Lett. 15, 4121–4128 (2015)
F.M. Ross: IBM J. Res. Dev. 44, 489–501 (2000)
M.H. Wang, L.J. Chen: J. Appl. Phys. 71, 5918–5925 (1992)
R. Sinclair, T. Yamashita, M.A. Parker, K.B. Kim, K. Holloway, A.F. Schwartzman: Acta Cryst. A 44, 965–975 (1988)
J.M. Gibson, J.L. Batstone, R.T. Tung: Appl. Phys. Lett. 51, 45–47 (1987)
F.M. Ross, P.A. Bennett, R.M. Tromp, J. Tersoff, M. Reuter: Micron 30, 21–32 (1999)
H.P. Sun, Y.B. Chen, X.Q. Pan, D.Z. Chi, R. Nath, Y.L. Foo: Appl. Phys. Lett. 86, 71904 (2005)
R. Nath, C.W. Soo, C.B. Boothroyd, M. Yeadon, D.Z. Chi, H.P. Sun, Y.B. Chen, X.Q. Pan, Y.L. Foo: Appl. Phys. Lett. 86, 201908 (2005)
M. Tanaka, M. Han, M. Takeguchi, K. Furuya: Philos. Mag. 84, 2699–2709 (2004)
M.W. Kleinschmit, M. Yeadon, J.M. Gibson: Appl. Phys. Lett. 75, 3288–3290 (1999)
R.K.K. Chong, M. Yeadon, W.K. Choi, E.A. Stach, C.B. Boothroyd: Appl. Phys. Lett. 82, 1833–1835 (2003)
K. He, S. Zhang, J. Li, X. Yu, Q. Meng, Y. Zhu, E. Hu, K. Sun, H. Yun, X.-Q. Yang, Y. Zhu, H. Gan, Y. Mo, E.A. Stach, C.B. Murray, D. Su: Nat. Commun. 7, 11441 (2016)
J.Y. Huang, L. Zhong, C.M. Wang, J.P. Sullivan, W. Xu, L.Q. Zhang, S.X. Mao, N.S. Hudak, X.H. Liu, A. Subramanian, H. Fan, L. Qi, A. Kushima, J. Li: Science 330, 1515–1520 (2010)
M. Wang, D. Golberg, Y. Bando: Adv. Mater. 22, 4071–4075 (2010)
F. Wang, H.-C. Yu, M.-H. Chen, L. Wu, N. Pereira, K. Thornton, A. Van der Ven, Y. Zhu, G.G. Amatucci, J. Graetz: Nat. Commun. 3, 1201 (2012)
X.H. Liu, J.W. Wang, S. Huang, F. Fan, X. Huang, Y. Liu, S. Krylyuk, J. Yoo, S.A. Dayeh, A.V. Davydov, S.X. Mao, S.T. Picraux, S. Zhang, J. Li, T. Zhu, J.Y. Huang: Nat. Nanotechnol. 7, 749–756 (2012)
M. Gu, Z.G. Wang, J.G. Connell, D.E. Perea, L.J. Lauhon, F. Gao, C.M. Wang: ACS Nano 7, 6303 (2013)
K. Yamamoto, Y. Iriyama, T. Hirayama: Microscopy 66, 50–61 (2017)
X.H. Liu, Y. Liu, A. Kushima, S. Zhang, T. Zhu, J. Li, J.Y. Huang: Adv. Energy Mater. 2, 722–741 (2012)
C.M. Wang: J. Mater. Res. 30, 326–339 (2014)
M.T. Janish, D.T. Mackay, Y. Liu, K.L. Jungjohann, C.B. Carter, M.G. Norton: J. Mater. Sci. 51, 589–602 (2016)
C.-M. Wang, H.-G. Liao, F.M. Ross: MRS Bulletin 40, 46–52 (2015)
Z. Xu, Y. Bando, W. Wang, X. Bai, D. Golberg: ACS Nano 4, 2515–2522 (2010)
T. Fujii, M. Arita, Y. Takahashi, I. Fujiwara: Appl. Phys. Lett. 98, 212104 (2011)
Y. Yang, W. Lu, Y. Yao, J. Sun, C. Gu, L. Gu, Y. Wang, X. Duan, R. Yu: Sci. Rep. 4, 3890 (2014)
X. Tian, S. Yang, M. Zeng, L. Wang, J. Wei, Z. Xu, W. Wang, X. Bai: Adv. Mater. 26, 3649–3654 (2014)
W.A. Hubbard, A. Kerelsky, G. Jasmin, E.R. White, J. Lodico, M. Mecklenburg, B.C. Regan: Nano Lett. 15, 3983–3987 (2015)
Y. Yang, P. Gao, S. Gaba, T. Chang, X. Pan, W. Lu: Nat. Commun. 3, 732 (2012)
Y.-T. Huang, S.-Y. Yu, C.-L. Hsin, C.-W. Huang, C.-F. Kang, F.-H. Chu, J.-Y. Chen, J.-C. Hu, L.-T. Chen, J.-H. He, W.-W. Wu: Anal. Chem. 85, 3955–3960 (2013)
J. Norpoth, S. Mildner, M. Scherff, J. Hoffmann, C. Jooss: Nanoscale 6, 9852–9862 (2014)
M. Duchamp, V. Migunov, A.H. Tavabi, A. Mehonic, M. Buckwell, M. Munde, A.J. Kenyon, R.E. Dunin-Borkowski: Resolut. Discov. 1, 27–33 (2016)
K. D’Aquila, Y. Liu, H. Iddir, A.K. Petford-Long: Phys. Status Solidi Rapid Res. Lett. 9, 301–306 (2015)
R.J. Kamaladasa, A.A. Sharma, Y.-T. Lai, W. Chen, P.A. Salvador, J.A. Bain, M. Skowronski, Y.N. Picard: Microsc. Microanal. 21, 140–153 (2015)
K. Baek, S. Park, J. Park, Y.-M. Kim, H. Hwang, S.H. Oh: Nanoscale 9, 582–593 (2017)
H. Gabrisch, L. Kjeldgaard, E. Johnson, U. Dahmen: Acta Mater. 49, 4259 (2001)
U. Dahmen, S. Hagege, F. Faudot, T. Radetic, E. Johnson: Philos. Mag. 84, 2651–2662 (2004)
H. Gabrisch, L. Kjeldgaard, A. Vaernholt Olesen, E. Johnson, U. Dahmen: Mater. Res. Soc. Symp. Proc. 580, 257–264 (2000)
L.H. Zhang, E. Johnson, U. Dahmen: Mater. Res. Soc. Symp. Proc. 821, 181–186 (2004)
P. Bhattacharya, V. Bhattacharya, K. Chattopadhyay: J. Electron Microsc. 48(Suppl.), S1047–S1054 (1999)
E. Johnson, A. Johansen, C. Nelson, U. Dahmen: J. Electron Microsc. 51(Suppl.), S201–S209 (2002)
M. Legros, B. Kaouache, P. Gergaud, O. Thomas, G. Dehm, T.J. Balk, E. Arzt: Philos. Mag. 85, 3541–3552 (2005)
E. Johnson, M.T. Levinsen, S. Steenstrupt, S. Prokofjev, V. Zhilin, U. Dahmen, T. Radetic: Philos. Mag. 84, 2663–2673 (2004)
J.M. Howe: Mater. Trans. JIM 39, 3–23 (1998)
W.E. Benson, J.M. Howe: Philos. Mag. A 75, 1641–1663 (1997)
T. Isshiki, M. Ohta, K. Nishio, M. Shiojiri: Thin Solid Films 271, 84–87 (1995)
B.J. Kooi, J.T.M. De Hosson: Mater. Res. Soc. Symp. Proc. 654, AA4.1.1 (2001)
J.M. Howe, T.M. Murray, K.T. Moore, A.A. Csontos, M.M. Tsai, A. Garg, W.E. Benson: Microsc. Microanal. 4, 235–247 (1998)
S.K. Malladi, Q. Xu, M.A. van Huis, F.D. Tichelaar, K.J. Batenburg, E. Yücelen, B. Dubiel, A. Czyrska-Filemonowicz, H.W. Zandbergen: Nano Lett. 14, 384–389 (2014)
D.J. Smith, A.K. Petford-Long, L.R. Wallenberg, J.-O. Bovin: Science 233, 872–875 (1986)
S. Iijima, T. Ichihashi: Phys. Rev. Lett. 56, 616–619 (1986)
A.S. Barnard, N.P. Young, A.I. Kirkland, M.A. van Huis, H. Xu: ACS Nano 3, 1431–1436 (2009)
J.M. Howe: Interfaces in Materials (Wiley, New York 1997)
A.O. Yalcin, Z. Fan, B. Goris, W.-F. Li, R.S. Koster, C.-M. Fang, A. van Blaaderen, M. Casavola, F.D. Tichelaar, S. Bals, G. Van Tendeloo, T.J.H. Vlugt, D. Vanmaekelbergh, H.W. Zandbergen, M.A. van Huis: Nano Lett. 14(6), 3661–3667 (2014)
A.O. Yalcin, B. Goris, R.J.A. van Dijk-Moes, Z. Fan, A.K. Erdamar, F.D. Tichelaar, T.J.H. Vlugt, G. Van Tendeloo, S. Bals, D. Vanmaekelbergh, H.W. Zandbergen, M.A. van Huis: Chem. Commun. 51, 3320–3323 (2015)
K. Chatterjee, J.M. Howe, W.C. Johnson, M. Murayama: Acta Mater. 52, 2923–2935 (2004)
Y. Li, Z. Lia, F. Fang, X. Wang, L. Li, J. Zhu: Appl. Phys. Lett. 105, 182901 (2014)
H. Yasuda, K. Mitsuishi, H. Mori: Phys. Rev. B 64, 094101 (2001)
J.G. Lee, H. Mori, H. Yasuda: Phys. Rev. B 65, 132106 (2002)
H. Yasuda, H. Mori, K. Furuya: Philos. Mag. Lett. 80, 181–186 (2000)
J.G. Lee, H. Mori: Philos. Mag. 84, 2675–2686 (2004)
J.G. Lee, H. Mori: Phys. Rev. Lett. 93, 235501 (2004)
T. Yokota, J.M. Howe, W.A. Jesser, M. Murayama: J. Appl. Phys. 95, 5756–5761 (2004)
H. Yasuda, H. Mori, J.G. Lee: Phys. Rev. B 70, 214105 (2004)
A. Figuerola, M. van Huis, M. Zanella, A. Genovese, S. Marras, A. Falqui, H.W. Zandbergen, R. Cingolani, L. Manna: Nano Lett. 10(8), 3028–3036 (2010)
F. Banhart, E. Hernandez, M. Terrones: Phys. Rev. Lett. 90, 185502 (2003)
A.K. Schaper, F. Phillipp, H. Hou: J. Mater. Res. 20, 1844–1850 (2005)
G.A. Storaska, J.M. Howe: Mater. Sci. Eng. A 368, 183–190 (2004)
T. Daiming, C.L. Ren, R. Lv, W.J. Yu, P.X. Hou, M. Wang, X. Wei, Z. Xu, N. Kawamoto, Y. Bando, M. Mitome, C. Liu, H.M. Cheng, D. Golberg: Nano Lett. 15(8), 4922–4927 (2015)
M.A. van Huis, L.T. Kunneman, K. Overgaag, Q. Xu, G. Pandraud, H.W. Zandbergen, D. Vanmaekelbergh: Nano Lett. 8, 3959–3963 (2008)
A.P. Lange, A. Samanta, H. Majidi, S. Mahajan, J. Ging, T.Y. Olson, K. van Benthem, S. Elhadj: Acta Mater. 120, 364 (2016)
T. Kamino, T. Yaguchi, M. Ukiana, Y. Yasutomi, H. Saka: Mater. Trans. JIM 36, 73–75 (1995)
T. Vystavel, G. Palasantzas, S.A. Koch, J.T.M. De Hosson: Appl. Phys. Lett. 83, 3909–3911 (2003)
T. Vystavel, G. Palasantzas, S.A. Koch, J.T.M. De Hosson: Appl. Phys. Lett. 82, 197–199 (2003)
S.B. Simonsen, I. Chorkendorff, S. Dahl, M. Skoglundh, J. Sehested, S. Helveg: J. Am. Chem. Soc. 132, 7968–7975 (2010)
A.T. DeLaRiva, T.W. Hansen, S.R. Challa, A.K. Datye: J. Catal. 308, 291–305 (2013)
M. Yeadon, J.C. Yang, R.S. Averback, J.W. Bullard, D.L. Olynick, J.M. Gibson: Appl. Phys. Lett. 71, 1631–1633 (1997)
C.G. Zimmermann, M. Yeadon, K. Nordlund, J.M. Gibson, R.S. Averback, U. Herr, K. Samwer: Phys. Rev. Lett. 83, 1163–1166 (1999)
P.M. Mortensen, T.W. Hansen, J.B. Wagner, A.D. Jensen: Ultramicroscopy 152, 1–9 (2015)
T.W. Hansen, J.B. Wagner (Eds.): Controlled Environment Transmission Electron Microscopy: Principles and Practice (Springer, Cham 2016)
J.R. Jinschek: Chem. Commun. 50, 2696 (2014)
H. Poppa: J. Vac. Sci. Technol. A 22, 1931–1947 (2004)
H. Minoda, K. Yagi, F.-J. Meyer zu Heringdorf, A. Meier, D. Kahler, M. Horn von Hoegen: Phys. Rev. B 59, 2363–2375 (1999)
T. Kamino, T. Yaguchi, M. Tomita, H. Saka: Philos. Mag. A 75, 105–114 (1997)
K. Takayanagi, Y. Tanishiro, S. Takahashi, M. Takahashi: Surf. Sci. 164, 367–392 (1985)
Y. Oshima, T. Hirata, T. Yokoyama, H. Hirayama, K. Takayanagi: Surf. Sci. 465, 81–89 (2000)
J. Liu, M. Takeguchi, M. Tanaka, H. Yasuda, K. Furuya: J. Electron Microsc. 50, 541–544 (2001)
L.D. Marks, E. Bengu, C. Collazo-Davila, D. Grozea, E. Landree, C. Leslie, W. Sinkler: Surf. Rev. Lett. 5, 1087–1106 (1998)
C. Collazo-Davila, D. Grozea, L.D. Marks: Phys. Rev. Lett. 80, 1678–1681 (1998)
K. Aoki, H. Minoda, Y. Tanishiro, K. Yagi: Surf. Rev. Lett. 5, 653–663 (1998)
H. Minoda, K. Yagi: Surf. Sci. 437, L761–6 (1999)
A.V. Latyshev, D.A. Nasimov, V.N. Savenko, A.L. Aseev: Thin Solid Films 367, 142–148 (2000)
M. Gajdardziska-Josifovska, R. Plass, M.A. Schofield, D.R. Giese, R. Sharma: J. Electron Microsc. 51(Suppl.), S13–S26 (2002)
M. Gajdardziska-Josifovska, M.H. Malay, D.J. Smith: Surf. Rev. Lett. 4, 655–669 (1997)
Y. Homma, P. Finnie: J. Cryst. Growth 237-239, 28–34 (2002)
L.D. Marks: Phys. Rev. Lett. 51, 1000 (1983)
J.-O. Bovin, R. Wallenberg, D.J. Smith: Nature 317, 47–49 (1985)
M. Mitome, K. Takayanagi, Y. Tanishiro: Phys. Rev. B 42, 7238–7241 (1990)
D.J. Smith, M. Gajdardziska-Josifovska, P. Lu, M.R. McCartney, J. Podbrdsky, P.R. Swann, J.S. Jones: Ultramicroscopy 49, 26–36 (1993)
X.G. Ning, M. Avalos-Borja, H.Q. Ye: J. Appl. Phys. 79, 125–128 (1996)
W. Yuan, Y. Wang, H. Li, H. Wu, Z. Zhang, A. Selloni, C. Sun: Nano Lett. 16, 132–137 (2016)
H. Koizumi, Y. Oshima, Y. Kondo, K. Takayanagi: Ultramicroscopy 88, 17–24 (2001)
Y. Kondo, K. Takayanagi: Science 289, 606–608 (2000)
Y. Oshima, Y. Kondo, K. Takayanagi: J. Electron Microsc. 52, 49–55 (2003)
Y. Oshima, A. Onga, K. Takayanagi: Phys. Rev. Lett. 91, 205503 (2003)
Y. Oshima, H. Koizumi, K. Mouri, H. Hirayama, K. Takayanagi, Y. Kondo: Phys. Rev. B 65(121401), 1–4 (2002)
N. Tanaka, H. Kimata, T. Takashima, T. Kizuka: Surf. Rev. Lett. 5, 723–729 (1998)
J.C. Yang, D. Evan, L. Tropia: Appl. Phys. Lett. 81, 241–243 (2002)
F.M. Ross, J.M. Gibson: Phys. Rev. Lett. 68, 1782–1785 (1992)
J.C. Yang, A.B. Kolasa, J.M. Gibson, M. Yeadon: Appl. Phys. Lett. 73, 2841–2843 (1998)
G. Zhou, J.C. Yang: Phys. Rev. Lett. 89, 106101 (2002)
G. Zhou, J.C. Yang: Surf. Sci. 531, 359–367 (2003)
L. Wang, J.C. Yang: J. Mater. Res. 20, 1902–1909 (2005)
W. Harlow, H. Ghassemi, M.L. Taheri: J. Nucl. Mater. 474, 126–133 (2016)
X. Li, S. Cheng, S. Deng, X. Wei, J. Zhu, Q. Chen: Sci. Rep. 7, 40911 (2017)
S. Rackauskas, H. Jiang, J.B. Wagner, S.D. Shandakov, T.W. Hansen, E.I. Kauppinen, A.G. Nasibulin: Nano Lett. 14, 5810–5813 (2014)
M. Ichikawa: J. Phys. Condens. Matter 11, 9861–9870 (1999)
F.M. Ross, J.M. Gibson, R.D. Twesten: Surf. Sci. 310, 243–266 (1994)
M.J. Sayagues, J.L. Hutchison: J. Solid State Chem. 163, 137–143 (2002)
M.J. Sayagues, J.L. Hutchison: J. Solid State Chem. 124, 116–122 (1996)
P.L. Gai, K. Kourtakis: Science 267, 661 (1995)
L. Diebolt, R. Sharma, M. McKelvy, W.S. Glaunsinger: Mat. Res. Soc. Proc. 404, 183–188 (1995)
M.V. Sidorov, M.J. McKelvy, R. Sharma, W.S. Glaunsinger: J. Solid State Chem. 141, 330–337 (1998)
M.J. McKelvy, R. Sharma, A.V.G. Chizmeshya, R.W. Carpenter, K. Streib: Chem. Mater. 13, 921–926 (2001)
R. Sharma, P.A. Crozier, Z.C. Kang, L. Eyring: Philos. Mag. 84, 2731–2747 (2004)
K. Karki, Y. Huang, S. Hwang, A.D. Gamalski, M.S. Whittingham, G. Zhou, E.A. Stach: ACS Appl. Mater. Interfaces 8, 27762–27771 (2014)
H. Ghassemi, W. Harlow, O. Mashtalir, M. Beidaghi, M.R. Lukatskaya, Y. Gogotsi, M.L. Taheri: J. Mater. Chem. A 2, 14339–14343 (2014)
Q. Jeangros, T.W. Hansen, J.B. Wagner, R.E. Dunin-Borkowski, C. Hébert, J. Van herle, A. Hessler-Wyser: Chem. Commun. 50, 1808–1810 (2014)
Q. Jeangros, T.W. Hansen, J.B. Wagner, R.E. Dunin-Borkowski, C. Hébert, J. Van Herle, A. Hessler-Wyser: Ultramicroscopy 169, 11–21 (2016)
R. Sharma, D. Naedele, E. Schweda: Chem. Mater. 13, 4014–4018 (2001)
R. Sharma, M.J. McKelvy, H. Bearat, A.V.G. Chizmeshya, R.W. Carpenter: Philos. Mag. 84, 2711–2729 (2004)
M. Gajdardziska-Josifovska, R. Sharma: Microsc. Microanal. 11, 524–533 (2005)
J.R. Jinschek, S. Helveg: Micron 11, 1156–1168 (2012)
R.-J. Liu, P.A. Crozier, C.M. Smith, D.A. Hucul, J. Blackson, G. Salaita: Microsc. Microanal. 10, 77–85 (2004)
P.L. Hansen, J.B. Wagner, S. Helveg, J.R. Rostrup-Nielsen, B.S. Clausen, H. Topsoe: Science 295, 2053–2055 (2002)
P.L. Gai, B.C. Smith, G. Owen: Nature 348, 430–432 (1990)
P.L. Gai: Adv. Mater. 10, 1259–1263 (1998)
P.L. Gai, K. Kourtakis, S. Ziemecki: Microsc. Microanal. 6, 335–342 (2000)
P.L. Gai: Top. Catal. 21, 161–173 (2002)
T.W. Hansen, J.B. Wagner, P.L. Hansen, S. Dahl, H. Topsoe, C.J.H. Jacobsen: Science 294, 1508–1510 (2001)
R. Sharma: Microsc. Microanal. 7, 494–506 (2001)
R. Sharma: J. Mater. Res. 20, 1695–1707 (2005)
S. Takeda, Y. Kuwauchi, H. Yoshida: Ultramicroscopy 151, 178–190 (2015)
E.D. Boyes, P.L. Gai: Ultramicroscopy 67, 219–232 (1997)
H. Topsøe: J. Catal. 216, 155–164 (2003)
J.C. Yang, M.W. Small, R.V. Grieshaber, R.G. Nuzzo: Chem. Soc. Rev. 41, 8179–8194 (2012)
T.W. Hansen, J.B. Wagner: ACS Catalysis 4, 1673–1685 (2014)
P.A. Crozier, T.W. Hansen: MRS Bulletin 40, 38–45 (2015)
F. Tao, P.A. Crozier: Chem. Rev. 116, 3487–3539 (2016)
J.F. Creemer, S. Helveg, G.H. Hoveling, S. Ullmann, A.M. Molenbroek, P.M. Sarro, H.W. Zandbergen: Ultramicroscopy 108, 993–998 (2008)
S. Giorgio, S. Sao Joao, S. Nitsche, D. Chaudanson, G. Sitja, C.R. Henry: Ultramicroscopy 106, 503–507 (2006)
L.F. Allard, S.H. Overbury, W.C. Bigelow, M.B. Katz, D.P. Nackashi, J. Damiano: Microsc. Microanal. 18, 656–666 (2012)
T. Yokosawa, T. Alan, G. Pandraud, B. Dam, H. Zandbergen: Ultramicroscopy 112, 47–52 (2012)
S.B. Vendelbo, C.F. Elkjær, H. Falsig, I. Puspitasari, P. Dona, L. Mele, B. Morana, B.J. Nelissen, R. van Rijn, J.F. Creemer, P.J. Kooyman, S. Helveg: Nat. Mater. 13, 884–890 (2014)
S. Zhang, C. Chen, M. Cargnello, P. Fornasiero, R.J. Gorte, G.W. Graham, X. Pan: Nat. Commun. 6, 7778 (2015)
S. Zhang, P.N. Plessow, J.J. Willis, S. Dai, M. Xu, G.W. Graham, M. Cargnello, F. Abild-Pedersen, X. Pan: Nano Lett. 16, 4528–4534 (2016)
L. Dubau, J. Nelayah, S. Moldovan, O. Ersen, P. Bordet, J. Drnec, T. Asset, R. Chattot, F. Maillard: ACS Catalysis 6, 4673–4684 (2016)
H.L. Xin, K. Niu, D.H. Alsem, H. Zheng: Microsc. Microanal. 19, 1558–1568 (2014)
Y.A. Wu, L. Li, Z. Li, A. Kinaci, M.K.Y. Chan, Y. Sun, J.R. Guest, I. McNulty, T. Rajh, Y. Liu: ACS Nano 10, 3738–3746 (2016)
S.B. Vendelbo, P.J. Kooyman, J.F. Creemer, B. Morana, L. Mele, P. Dona, B.J. Nelissen, S. Helveg: Ultramicroscopy 133, 72–79 (2013)
S. Chenna, P.A. Crozier: ACS Catalysis 2, 2395–2402 (2012)
B.K. Miller, T.M. Barker, P.A. Crozier: Ultramicroscopy 156, 18–22 (2015)
Y. Li, D. Zakharov, S. Zhao, R. Tappero, U. Jung, A. Elsen, PhBaumann, R.G. Nuzzo, E.A. Stach, A.I. Frenkel: Nat. Commun. 6, 7583 (2015)
K. Yoshida, J. Yamasaki, N. Tanaka: Appl. Phys. Lett. 84, 2542–2544 (2004)
F. Cavalca, A.B. Laursen, B.E. Kardynal, R.E. Dunin-Borkowski, S. Dahl, J.B. Wagner, T.W. Hansen: Nanotechnology 23, 075705 (2012)
B.K. Miller, P.A. Crozier: Microsc. Microanal. 19, 461–469 (2013)
L. Zhang, B.K. Miller, P.A. Crozier: Nano Lett. 13, 679–684 (2013)
P. Crozier, V. Oleshko, A. Westwood, R. Cantrell: In situ environmental transmission electron microscopy of gas phase ziegler-natta catalytic polymerization of propylene. In: Proc. Electron Microsc. Anal. Inst. Phys. Conf. Ser. (2001) pp. 393–396
P.L. Gai: Microsc. Microanal. 8, 21–28 (2002)
F. Banhart: J. Appl. Phys. 81, 3440–3445 (1997)
R. Sharma, Z. Iqbal: Appl. Phys. Lett. 84, 990–992 (2004)
R. Sharma, P. Rez, M.M.J. Treacy, J. Stuart: J. Electron Microsc. 54, 231–237 (2005)
S. Helveg, C. Lopez-Cartes, J. Sehested, P.L. Hansen, B.S. Clausen, J.R. Rostrup-Nielsen, F. Abild-Pedersen, J.K. Norskov: Nature 427, 426–429 (2004)
H. Yoshida, S. Takeda, T. Uchiyama, H. Kohno, Y. Homma: Nano Lett. 8, 2082–2086 (2008)
X. Feng, S.W. Chee, R. Sharma, K. Liu, X. Xie, Q. Li, S. Fan, K. Jiang: Nano Res. 4, 767 (2011)
V. Balakrishnan, M. Bedewy, E.R. Meshot, S.W. Pattinson, E.S. Polsen, F. Laye, D.N. Zakharov, E.A. Stach, A.J. Hart: ACS Nano 10, 11496–11504 (2016)
A.R. Harutyunyan, G. Chen, T.M. Paronyan, E.M. Pigos, O.A. Kuznetsov, K. Hewaparakrama, S.M. Kim, D. Zakharov, E.A. Stach, G.U. Sumanasekera: Science 326, 116–120 (2009)
J. Wu, S. Helveg, S. Ullmann, Z. Peng, A.T. Bell: J. Catal. 338, 295–304 (2016)
J. Kling, T.W. Hansen, J.B. Wagner: Carbon 99, 261–266 (2016)
J.A. Rodríguez-Manzo, M. Terrones, H. Terrones, H.W. Kroto, L. Sun, F. Banhart: Nat. Nanotechnol. 2, 307 (2007)
D.-M. Tang, C. Liu, W.-J. Yu, L.-L. Zhang, P.-X. Hou, J.-C. Li, F. Li, Y. Bando, D. Golberg, H.-M. Cheng: ACS Nano 8, 292–301 (2014)
A.P. Burden, J.L. Hutchison: Carbon 36, 1167–1173 (1998)
H. Abe, S. Yamamoto, A. Miyashita: J. Electron Microsc. 51, 183–187 (2002)
D. Ugarte: Nature 359, 707–709 (1992)
M. Terrones, F. Banhart, N. Grobert, J.-C. Charlier, H. Terrones, P.M. Ajayan: Phys. Rev. Lett. 89(075505), 1–4 (2002)
M. Terrones, H. Terrones, F. Banhart, J.-C. Charlier, P.M. Ajayan: Science 288, 1226–1229 (2000)
Q. Ru, M. Okamoto, Y. Kondo, K. Takayanagi: Chem. Phys. Lett. 259, 425–431 (1996)
K. Niihara, T. Sekino, A. Nakahira, T. Kamino, T. Yaguchi: Mater. Lett. 27, 121–124 (1996)
F. Banhart: Rep. Prog. Phys. 62, 1181–1221 (1999)
E. Bengu, L.D. Marks: Phys. Rev. Lett. 86, 2385–2387 (2001)
V.V. Roddatis, V.L. Kuznetsov, Y.V. Butenko, D.S. Su, R. Schlogl: Phys. Chem. Chem. Phys. 4, 1964–1967 (2002)
H.E. Troiani, A. Camacho-Bragado, V. Armendariz, J.L. Gardea Torresday, M.J. Yacaman: Chem. Mater. 15, 1029–1031 (2003)
A. Gloter, K. Suenaga, H. Kataura, R. Fujii, T. Kodama, H. Nishikawa, I. Ikemoto, K. Kikuchi, S. Suzuki, Y. Achiba, S. Iijima: Chem. Phys. Lett. 390, 462–466 (2004)
M.S. Wang, J.Y. Wang, Q. Chen, L.M. Peng: Adv. Funct. Mater. 15, 1825–1831 (2005)
F.M. Ross, J. Tersoff, R.M. Tromp: Phys. Rev. Lett. 80, 984–987 (1998)
M. Hammar, F.K. LeGoues, J. Tersoff, M.C. Reuter, R.M. Tromp: Surf. Sci. 349, 129–144 (1996)
T. Kizuka, N. Tanaka: Phys. Rev. B 56, R10079–82 (1997)
T. Kizuka, N. Tanaka: Philos. Mag. Lett. 76, 289–297 (1997)
J. Drucker, R. Sharma, K. Weiss, J. Kouvetakis: J. Appl. Phys. 77, 2846–2848 (1995)
M. Krishnamurthy, J.S. Drucker, J.A. Venables: Mater. Res. Soc. Symp. Proc. 202, 77–82 (1991)
H. Minoda, K. Yagi: J. Cryst. Growth 163, 48–53 (1996)
S. Maruno, H. Nakahara, S. Fujita, H. Watanabe, Y. Kusumi, M. Ichikawa: Rev. Sci. Instrum. 68, 116–119 (1997)
F.K. LeGoues, M. Hammar, M.C. Reuter, R.M. Tromp: Surf. Sci. 349, 249–266 (1996)
F.K. LeGoues, M.C. Reuter, J. Tersoff, M. Hammar, R.M. Tromp: Phys. Rev. Lett. 73, 300–303 (1994)
F.K. LeGoues, J. Tersoff, M.C. Reuter, M. Hammar, R. Tromp: Appl. Phys. Lett. 67, 2317–2319 (1995)
S. Maruno, S. Fujita, H. Watanabe, Y. Kusumi, M. Ichikawa: Appl. Phys. Lett. 68, 2213–2215 (1996)
A. Portavoce, M. Kammler, R. Hull, M.C. Reuter, M. Copel, F.M. Ross: Phys. Rev. B 70(9), 195306–195301 (2004)
F.M. Ross, R.M. Tromp, M.C. Reuter: Science 286, 1931–1934 (1999)
E.A. Stach, R. Hull, R.M. Tromp, M.C. Reuter, M. Copel, F.K. LeGoues, J.C. Bean: J. Appl. Phys. 83, 1931–1937 (1998)
E.A. Stach, R. Hull, R.M. Tromp, F.M. Ross, M.C. Reuter, J.C. Bean: Philos. Mag. A 80, 2159–2200 (2000)
A.I. Persson, M.W. Larsson, S. Stenstrom, B.J. Ohlsson, L. Samuelson, L.R. Wallenberg: Nat. Mater. 3, 677–681 (2004)
F.M. Ross: Rep. Prog. Phys. 73, 114501–114522 (2010)
Y.-C. Chou, F. Panciera, M.C. Reuter, E.A. Stach, F.M. Ross: Chem. Commun. 52, 5686–5689 (2016)
A.D. Gamalski, J. Tersoff, E.A. Stach: Nano Lett. 16, 2283 (2016)
F. Lenrick, M. Ek, K. Deppert, L. Samuelson, L.R. Wallenberg: Nano Res. 7, 1188–1194 (2014)
Y. Wu, P. Yang: J. Am. Chem. Soc. 123, 3165 (2001)
G. Zhou, J.C. Yang, F. Xu, J.A. Barnard, Z. Zhang: Mater. Res. Soc. Symp. Proc. 737, F6.3 (2002)
E.A. Stach, P.J. Pauzauskie, T. Kuykendall, J. Goldberger, R. He, P. Yang: Nano Lett. 3, 867 (2003)
F.M. Ross, J. Tersoff, M.C. Reuter: Phys. Rev. Lett. 95, 146104 (2005)
J.B. Hannon, S. Kodambaka, F.M. Ross, R.M. Tromp: Nature 440, 69–71 (2006)
C.-Y. Wen, M.C. Reuter, J. Bruley, J. Tersoff, S. Kodambaka, E.A. Stach, F.M. Ross: Science 326, 1247–1250 (2009)
C.-Y. Wen, M.C. Reuter, D. Su, E.A. Stach, F.M. Ross: Nano Lett. 15, 1654–1659 (2015)
F. Panciera, Y.-C. Chou, M.C. Reuter, D. Zakharov, E.A. Stach, S. Hofmann, F.M. Ross: Nat. Mater. 14, 820–825 (2015)
D. Jacobsson, F. Panciera, J. Tersoff, M.C. Reuter, S. Lehmann, S. Hofmann, K.A. Dick, F.M. Ross: Nature 531, 317–322 (2016)
F. Panciera, M.M. Norton, S.B. Alam, S. Hofmann, K. Mølhave, F.M. Ross: Nat. Commun. 7, 12271 (2016)
A. Klamchuen, M. Suzuki, K. Nagashima, H. Yoshida, M. Kanai, F. Zhuge, Y. He, G. Meng, S. Kai, S. Takeda, T. Kawai, T. Yanagida: Nano Lett. 15, 6406–6412 (2015)
G. Meng, T. Yanagida, H. Yoshida, K. Nagashima, M. Kanai, F. Zhuge, Y. He, A. Klamchuen, S. Rahong, X. Fang, S. Takeda, T. Kawai: Nanoscale 6, 7033–7038 (2014)
F.M. Ross, M. Kammler, M.E. Walsh, M.C. Reuter: Microsc. Microanal. 10, 105–111 (2004)
M. Kammler, R. Hull, M.C. Reuter, F.M. Ross: Appl. Phys. Lett. 82, 1093–1095 (2003)
A. Portavoce, R. Hull, F.M. Ross: Nanoscale lateral control of Ge quantum dot nucleation sites on Si(001) using focused ion beam implantation. In: Lateral Alignment of Epitaxial Quantum Dots, Nanoscience and Technology, ed. by O.G. Schmidt (Springer, Berlin 2005) pp. 397–428
M. Gherasimova, R. Hull, M.C. Reuter, F.M. Ross: Appl. Phys. Lett. 93, 023106 (2008)
B.J. Kim, J. Tersoff, S. Kodambaka, M.C. Reuter, E.A. Stach, F.M. Ross: Science 322, 1070–1073 (2008)
J. Cumings, E. Olsson, A.K. Petford-Long, Y. Zhu: MRS Bulletin 33(2), 101–106 (2008)
Q. Chen, L.M. Peng: Ultramicroscopy 111, 948–954 (2011)
S. Canepa, S.B. Alam, D.-T. Ngo, F.M. Ross, K. Mølhave: In situ TEM electrical measurements. In: Controlled Atmosphere Transmission Electron Microscopy, ed. by T.W. Hansen, J.B. Wagner (Springer, Cham 2016) pp. 281–300
E.H. Darlington, U. Valdre: J. Phys. E 8, 321–324 (1975)
A.C. Twitchett, R.E. Dunin-Borkowski, R.F. Broom, P.A. Midgley: J. Phys. Condens. Matter 16, 181–192 (2004)
A.C. Twitchett, R.E. Dunin-Borkowski, P.A. Midgley: Phys. Rev. Lett. 88, 238302 (2002)
A.C. Twitchett, R.E. Dunin-Borkowski, R.J. Hallifax, R.F. Broom, P.A. Midgley: Microsc. Microanal. 11, 66–78 (2009)
K.D. Johnson, V.P. Dravid: Microsc. Microanal. 5, 428–436 (1999)
K.D. Johnson, V.P. Dravid: Interface Sci. 8, 189–198 (2000)
M.A. Verheijen, J.J.T.M. Donkers, J.F.P. Thomassen, J.J. van den Broek, R.A.F. van der Rijt, M.J.J. Dona, C.M. Smit: Rev. Sci. Instrum. 75, 426–429 (2004)
W.E. King, K.L. Merkle, M. Meshii: Phys. Rev. B 23, 6319–6334 (1981)
K. Haga, W.E. King, K.L. Merkle, M. Meshii: Nucl. Instrum. Methods Phys. Res. B 16, 134–142 (1986)
J.T. Lau, J.A. Prybyla, S.K. Theiss: Appl. Phys. Lett. 76, 164–166 (2000)
F.M. Ross, R. Hull, D. Bahnck, J.C. Bean, L.J. Peticolas, C.A. King: Appl. Phys. Lett. 62, 1426–1428 (1993)
D.T. Mathes, R. Hull, K.D. Choquette, K.M. Geib, A.A. Allerman, J.K. Guenter, B. Hawkins, R.A. Hawthorne: Proceedings SPIE 4994, 67–82 (2003)
Q. Jeangros, M. Duchamp, J. Werner, M. Kruth, R.E. Dunin-Borkowski, B. Niesen, C. Ballif, A. Hessler-Wyser: Nano Lett. 16, 7013–7018 (2016)
Z. Xu, Y. Bando, L. Liu, W. Wang, X. Bai, D. Golberg: ACS Nano 5, 4401–4406 (2011)
Y. Lu, C.A. Merchant, M. Drndic, A.T.C. Johnson: Nano Lett. 11, 5184–5188 (2011)
J.A. Rodríguez-Manzo, Z.J. Qi, A. Crook, J.-H. Ahn, A.T.C. Johnson, M. Drndić: ACS Nano 10, 4004–4010 (2016)
J.C. Doan, S. Lee, S.-H. Lee, P.A. Flinn, J.C. Bravman, T.N. Marieb: J. Appl. Phys. 89, 7797–7808 (2001)
W.C. Shih, A.L. Green: Mater. Res. Soc. Symp. Proc. 356, 417 (1994)
J.A. Prybyla, S.P. Riege, S.P. Grabowski, A.W. Hunt: Appl. Phys. Lett. 73, 1083–1085 (1998)
S.P. Riege, J.A. Prybyla, A.W. Hunt: Appl. Phys. Lett. 69, 2367–2369 (1996)
H.B. Heersche, G. Lientschnig, K. O'Neill, H.S.J. van der Zant, H.W. Zandbergen: Appl. Phys. Lett. 91, 072107 (2007)
T. Kozlova, H.W. Zandbergen: Ultramicroscopy 158, 74–80 (2015)
R.W. Vook: Mater. Chem. Phys. 36, 199–216 (1994)
C.Y. Chang, R.W. Vook: Thin Solid Films 223, 23–30 (1993)
T. Kozlova, M. Rudneva, H.W. Zandbergen: Nanotechnology 24, 505708 (2013)
H. Okabayashi, H. Kitamura, M. Komatsu, H. Mori: Appl. Phys. Lett. 68, 1066–1068 (1996)
H. Mori, H. Okabayashi, M. Komatsu: Thin Solid Films 300, 25–29 (1997)
J. Nucci, S. Krämer, E. Arzt, C.A. Volkert: J. Mater. Res. 20, 1851–1859 (2005)
Q. Liu, J.H. Wu, K. Xu, A. Lu, Y. Bando, D. Golberg, J.Q. Hu: Nano Lett. 15, 2809–2816 (2015)
B.C. Regan, S. Aloni, R.O. Ritchie, U. Dahmen, A. Zettl: Nature 428, 924–927 (2004)
D. Erts, A. Løhmus, R. Lohmus, H. Olin: Appl. Phys. A 72, S71–S74 (2001)
J. Cumings, A. Zettl, M.R. McCartney, J.C.H. Spence: Phys. Rev. Lett. 88(056804), 1–4 (2002)
Z.L. Wang, R.P. Gao, W.A. de Heer, P. Poncharal: Appl. Phys. Lett. 80, 856–858 (2002)
T. Kuzumaki, Y. Horiike, T. Kizuka, T. Kona, C. Oshima, Y. Mitsuda: Diam. Relat. Mater. 13, 1907–1913 (2004)
C.H. Jin, J.Y. Wang, M.S. Wang, J. Su, L.M. Peng: Carbon 43, 1026–1031 (2005)
R. Gao, Z. Pan, Z.L. Wang: Appl. Phys. Lett. 78, 1757–1759 (2001)
X.D. Bai, E.G. Wang, P.X. Gao, Z.L. Wang: Nano Lett. 3, 1147–1150 (2003)
Z. Xu, X.D. Bai, E.G. Wang, Z.L. Wang: Appl. Phys. Lett. 87, 163106 (2005)
Z. Xu, X.D. Bai, E.G. Wang, Z.L. Wang: J. Phys. Condens. Matter 17, L507–L512 (2005)
J. Yamashita, H. Hirayama, Y. Ohshima, K. Takayanagi: Appl. Phys. Lett. 74, 2450–2452 (1999)
M. Kociak, K. Suenaga, K. Hirahara, Y. Saito, T. Nakahira, S. Iijima: Phys. Rev. Lett. 89, 155501 (2002)
P. Poncharal, C. Berger, Y. Yan, Z.L. Wang, W.A. de Heer: J. Phys. Chem. B 106, 12104–12118 (2002)
Q. Liu, R. Zou, Y. Bando, D. Golberg, J.Q. Hu: Prog. Mater. Sci. 70, 1–49 (2015)
J. Cumings, A. Zettl: Phys. Rev. Lett. 93(086801), 1–4 (2004)
K.E. Moore, O. Cretu, M. Mitome, D. Golberg: Carbon 107, 225–232 (2016)
J.Y. Huang, S. Chen, S.H. Jo, Z. Wang, D.X. Han, G. Chen, M.S. Dresselhaus, Z.F. Ren: Phys. Rev. Lett. 94, 236802 (2005)
P.M.F.J. Costa, U.K. Gautam, Y. Bando, D. Golberg: Nat. Commun. 2, 421–426 (2011)
M.W. Larsson, L.R. Wallenberg, A.I. Persson, L. Samuelson: Microsc. Microanal. 10, 41–46 (2004)
P.M.F.J. Costa, D. Golberg, G. Shen, M. Mitome, Y. Bando: J. Mater. Sci. 43, 1460–1470 (2008)
B. Liu, Y. Bando, M. Wang, D. Golberg: J. Nanosci. Nanotechnol. 10, 3945–3951 (2010)
Z. Xu, D. Golberg, Y. Bando: Nano Lett. 9, 2251–2254 (2009)
H. Ohnishi, Y. Kondo, K. Takayanagi: Nature 395, 780–783 (1998)
P. Poncharal, S. Frank, Z.L. Wang, W.A. de Heer: Eur. Phys. J. D 9, 77–79 (1999)
Z.L. Wang, R.P. Gao, Z.W. Pan, Z.R. Dai: Adv. Eng. Mater. 3, 657–661 (2001)
C. Kallesøe, C.-Y. Wen, T.J. Booth, O. Hansen, P. Bøggild, F.M. Ross, K. Mølhave: Nano Lett. 12, 2965–2970 (2012)
T. Kizuka, S. Uhmehara, S. Fujisawa: Jpn. J. Appl. Phys. 40(2), L71–L74 (2001)
T. Kizuka, H. Ohmi, T. Sumi, K. Kumazawa, S. Deguchi, M. Naruse, S. Fujisawa, S. Sasaki, A. Yabe, Y. Enomoto: Jpn. J. Appl. Phys. 40, L170–L173 (2001)
Y. Oshima, K. Mouri, H. Hirayama, K. Takayanagi: Surf. Sci. 531, 209–216 (2003)
C.S. Bonifacio, T.B. Holland, K. van Benthem: Acta Mater. 63, 140–149 (2014)
J.N. Chapman: J. Phys. D 17, 623–647 (1984)
R.E. Dunin-Borkowski, M.R. McCartney, D.J. Smith, S.S.P. Parkin: Ultramicroscopy 74, 61–73 (1998)
Y. Zhu, M. De Graef (Eds.): Magnetic Imaging and Its Applications to Materials (Academic Press, Cambridge 2001)
L.A. Rodríguez, C. Magén, E. Snoeck, C. Gatel, L. Marín, L. Serrano-Ramón, J.L. Prieto, M. Muñozi, P.A. Algarabel, L. Morellon, J.M. De Teresa, M.R. Ibarra: Ultramicroscopy 134, 144–154 (2013)
D.-T. Ngo, L.T. Kuhn: Nanosci. Nanotechnol. 7, 045001 (2016)
T. Uhlig, M. Heumann, J. Zweck: Ultramicroscopy 94, 193–196 (2003)
G. Yi, W.A.P. Nicholson, C.K. Lim, J.N. Chapman, S. McVitie, C.D.W. Wilkinson: Ultramicroscopy 99, 65–72 (2004)
J.W. Lau, M.A. Schofield, Y. Zhu: Ultramicroscopy 107, 396–400 (2007)
M. Arita, R. Tokuda, K. Hamada, Y. Takahashi: Mater. Trans. 55, 403–409 (2014)
H.S. Park, Y.-G. Park, Y. Gao, D. Shindo, M. Inoue: J. Appl. Phys. 97, 33908 (2005)
A.C.C. Yu, C.C.H. Lo, A.K. Petford-Long, D.C. Jiles, T. Miyazaki: J. Appl. Phys. 91, 780–784 (2002)
D.M. Donnet, V.G. Lewis, J.N. Chapman, K. O'Grady, H.W. van Kesteren: J. Phys. D 26, 1741–1745 (1993)
P. Thompson, O. Gutfleisch, J.N. Chapman, I.R. Harris: J. Phys. D 30, 1854–1860 (1997)
V.V. Volkov, Y. Zhu: J. Magn. Magn. Mater. 214, 204–216 (2000)
D.-T. Ngo, A. Hashimoto, S. McVitie, S. Saito, J.N. Chapman, M. Takahashi: J. Phys. D 44, 095001 (2011)
V.V. Volkov, Y. Zhu, M. Malac: Philos. Mag. 84, 2607–2617 (2004)
A. Kohn, C. Wang, A.K. Petford-Long, S.G. Wang, R.C.C. Ward: J. Appl. Phys. 103, 063918 (2008)
A.C.C. Yu, A.K. Petford-Long, K. O'Grady, T. Miyazaki: J. Appl. Phys. 91, 5234–5239 (2002)
C.K. Lim, J.N. Chapman, M. Rahman, A.B. Johnston, D.O. O'Donnell: J. Phys. D 35, 2344–2351 (2002)
C.K. Lim, J.N. Chapman, M. Rahman, A.B. Johnston, D.O. O'Donnell: J. Appl. Phys. 95, 1510–1515 (2004)
X. Portier, A.K. Petford-Long, T.C. Anthony, J.A. Brug: Appl. Phys. Lett. 75, 1290–1292 (1999)
Y.G. Wang, A.K. Petford-Long: J. Appl. Phys. 92, 6699–6707 (2002)
R.E. Dunin-Borkowski, M.R. McCartney, B. Kardynal, D.J. Smith: Appl. Phys. Lett. 75, 2641–2643 (1999)
A.B. Johnston, J.N. Chapman, B. Khamsehpour, C.D.W. Wilkinson: J. Phys. D 29, 1419–1427 (1996)
S. McVitie, J.N. Chapman: Microsc. Microanal. 3, 146–153 (1997)
K.J. Kirk, J.N. Chapman, S. McVitie, P.R. Aitchison, C.D.W. Wilkinson: Appl. Phys. Lett. 75, 3683–3685 (1999)
A. Schneider, H. Hoffmann, J. Zweck: J. Magn. Magn. Mater. 257, 1–10 (2003)
M. Schneider, H. Hoffmann, S. Otto, T. Haug, J. Zweck: J. Appl. Phys. 92, 1466–1472 (2002)
M. Schneider, H. Hoffmann, J. Zweck: Appl. Phys. Lett. 79, 3113–3115 (2001)
X.X. Liu, J.N. Chapman, S. McVitie, C.D.W. Wilkinson: Appl. Phys. Lett. 84, 4406–4408 (2004)
J.W. Lau, M. Beleggia, M.A. Schofield, G.F. Neumark, Y. Zhu: J. Appl. Phys. 97, 10E702 (2005)
C. Phatak, A.K. Petford-Long, O. Heinonen: Phys. Rev. Lett. 108, 067205 (2012)
X. Portier, A.K. Petford-Long: Appl. Phys. Lett. 76, 754–756 (2000)
D. Petit, H.T. Zeng, J. Sampaio, E. Lewis, L. O'Brien, A.-V. Jausovec, D. Read, R.P. Cowburn, K.J. O’Shea, S. McVitie, J.N. Chapman: Appl. Phys. Lett. 97, 233102 (2010)
M. Tanase, A.K. Petford-Long, O. Heinonen, K.S. Buchanan, J. Sort, J. Nogués: Phys. Rev. B 79, 014436 (2009)
M. Tanase, A.K. Petford-Long: Microsc. Res. Tech. 72, 187–196 (2009)
S. Zhang, A.K. Petford-Long, O. Heinonen, C. Phatak: Appl. Phys. Lett. 105, 212409 (2014)
A.Y. Toporov, R.M. Langford, A.K. Petford-Long: Appl. Phys. Lett. 77, 3063–3065 (2000)
V. Brajuskovic, F. Barrows, C. Phatak, A.K. Petford-Long: Sci. Rep. 6, 34384 (2016)
S. Zhang, A.K. Petford-Long, C. Phatak: Sci. Rep. 6, 31248 (2016)
M.C. Hickey, D.-T. Ngo, S. Lepadatu, D. Atkinson, D. McGrouther, S. McVitie, C.H. Marrows: Appl. Phys. Lett. 97, 202505 (2010)
E.M. Hempe, M. Kläui, T. Kasama, D. Backes, F. Junginger, S. Krzyk, L.J. Heyderman, R. Dunin-Borkowski, U. Rudiger: Phys. Status Solidi A 204, 3922–3928 (2007)
X. Portier, A.K. Petford-Long, R.C. Doole, T.C. Anthony, J.A. Brug: Appl. Phys. Lett. 71, 2032–2034 (1997)
X. Portier, E.Y. Tsymbal, A.K. Petford-Long, T.C. Anthony, J.A. Brug: Phys. Rev. B 58, R591–R594 (1998)
X. Portier, A.K. Petford-Long, T.C. Anthony, J.A. Brug: J. Appl. Phys. 85, 4120–4126 (1999)
T. Haug, K. Perzlmaier, C.H. Back: Phys. Rev. B 79, 024414 (2009)
T. Asaka, Y. Anan, T. Nagai, S. Tsutsumi, H. Kuwahara, K. Kimoto, Y. Tokura, Y. Matsui: Phys. Rev. Lett. 89, 207203 (2002)
J.Q. He, V.V. Volkov, M. Beleggia, T. Asaka, J. Tao, M.A. Schofield, Y. Zhu: Phys. Rev. B 81, 094427 (2010)
J. Rajeswari, P. Huang, G.F. Mancini, Y. Murooka, T. Latychevskaia, D. McGrouther, M. Cantoni, E. Baldini, J.S. White, A. Magrez, T. Giamarchi, H.M. Rønnow, F. Carbone: Proc. Natl. Acad. Sci. 112, 14212–14217 (2015)
A. Tonomura, X. Yu, K. Yanagisawa, T. Matsuda, Y. Onose, N. Kanazawa, H.S. Park, Y. Tokura: Nano Lett. 12, 1673–1677 (2012)
N. Kawamoto, Y. Murakami, D. Shindo, K. Fukamichi: J. Appl. Phys. 100, 043913 (2006)
Y. Murakami, J.H. Yoo, D. Shindo, T. Atou, M. Kikuchi: Nature 423, 965–968 (2003)
J.H. Yoo, Y. Murakami, D. Shindo, T. Ohsuna: Philos. Mag. 84, 2597–2606 (2004)
J.H. Yoo, Y. Murakami, D. Shindo, T. Atou, M. Kikuchi: Phys. Rev. Lett. 93, 047204 (2004)
C. Phatak, A.K. Petford-Long, H. Zheng, J.F. Mitchell, S. Rosenkranz, M.R. Norman: Phys. Rev. B 92, 224418 (2015)
H.S. Park, Y. Murakami, D. Shindo, V.A. Chernenko, T. Kanomata: Appl. Phys. Lett. 83, 3752–3754 (2003)
C. Phatak, O. Heinonen, M. De Graef, A. Petford-Long: Nano Lett. 16, 4141–4148 (2016)
A. Budruk, C. Phatak, A.K. Petford-Long, M. De Graef: Acta Mater. 59, 4895–4906 (2011)
M. De Graef, M.A. Willard, M.E. McHenry, Y. Zhu: IEEE Trans. Magn. 37, 2663–2665 (2001)
Y. Murakami, D. Shindo, K. Oikawa, R. Kainuma, K. Ishida: Acta Mater. 50, 2173–2184 (2002)
A. Tonomura: J. Electron Micrsoc. 52, 11–19 (2003)
J.C. Loudon, P.A. Midgley: Ultramicroscopy 109, 700–729 (2009)
K. Harada, T. Matsuda, H. Kasai, O. Kamimura, A. Tonomura: Ultramicroscopy 67, 133–141 (1997)
A. Tonomura, H. Kasai, O. Kamimura, T. Matsuda, K. Harada, T. Yoshida, T. Akashi, J. Shimoyama, K. Kishio, T. Hanaguri, K. Kitazawa, T. Masui, S. Tajima, N. Koshizuka, P.L. Gammel, D. Bishop, M. Sasase, S. Okayasu: Phys. Rev. Lett. 88, 237001 (2002)
K. Harada, T. Matsuda, J. Bonevich, M. Igarashi, S. Kondo, G. Pozzi, U. Kawabe, A. Tonomura: Nature 360, 51–53 (1992)
J.E. Bonevich, K. Harada, T. Matsuda, H. Kasai, T. Yoshida, G. Pozzi, A. Tonomura: Phys. Rev. Lett. 70, 2952–2955 (1993)
A. Tonomura: J. Electron Microsc. 51(Suppl.), S3–S11 (2002)
S. Horiuchi, M. Cantoni, M. Uchida, T. Tsuruta, Y. Matsui: Appl. Phys. Lett. 73, 1293–1294 (1998)
T. Matsuda, K. Harada, H. Kasai, O. Kamimura, A. Tonomura: Science 271, 1393–1395 (1996)
K. Harada, O. Kamimura, H. Kasai, F. Matsuda, A. Tonomura, V.V. Moshchalkov: Science 274, 1167–1170 (1996)
K. Harada, H. Kasai, T. Matsuda, M. Yamasaki, A. Tonomura: J. Electron Microsc. 46, 227–232 (1997)
C.-H. Sow, K. Harada, A. Tonomura, G. Crabtree, D.G. Grier: Phys. Rev. Lett. 80, 2693–2696 (1998)
Y. Togawa, K. Harada, T. Akashi, H. Kasai, T. Matsuda, F. Nori, A. Maeda, A. Tonomura: Phys. Rev. Lett. 95, 87002 (2005)
K. Harada, H. Kasai, O. Kamimura, T. Matsuda, A. Tonomura, S. Okayasu, Y. Kazumata: Phys. Rev. B 53, 9400–9405 (1996)
Z. Akase, H. Kasai, S. Mamishin, D. Shindo, M. Morita, A. Tonomura: J. Appl. Phys. 111, 033912 (2012)
A. Tonomura, H. Kasai, O. Kamimura, T. Matsuda, K. Harada, Y. Nakayama, J. Shimoyama, K. Kishio, T. Hanaguri, K. Kitazawa, M. Sasase, S. Okayasu: Nature 412, 620–622 (2001)
T. Matsuda, O. Kamimura, H. Kasai, K. Harada, T. Yoshida, T. Akashi, A. Tonomura, Y. Nakayama, J. Shimoyama, K. Kishio, T. Hanaguri, K. Kitazawa: Science 294, 2136–2138 (2001)
A. Krishnan, M.M.J. Treacy, M.E. Bisher, P. Chandra, P.B. Littlewood: Am. Inst. Phys. Conf. Proc. 535, 191–200 (2000)
H.P. Xu, Q. Li, D. Feng, G.J. Shen, Q.C. Guan, J.Y. Wang: Ferroelectrics 146, 137–144 (1993)
F.-T. Huang, F. Xue, B. Gao, L.H. Wang, X. Luo, W. Cai, X.-Z. Lu, J.M. Rondinelli, L.Q. Chen, S.-W. Cheong: Nat. Commun. 7, 11602 (2016)
E. Snoeck, L. Normand, A. Thorel, C. Roucau: Phase Trans. A46, 77–88 (1994)
S.B. Ren, C.J. Lu, H.M. Shen, Y.N. Wang: Mater. Res. Soc. Symp. Proc. 404, 95–100 (1995)
A. Krishnan, M.E. Bisher, M.M.J. Treacy: Mater. Res. Soc. Symp. Proc. 541, 475–480 (1999)
A. Krishnan, M.M.J. Treacy, M.E. Bisher, P. Chandra, P.B. Littlewood: Integr. Ferroelectr. 43, 31–49 (2002)
M.-G. Han, M.S.J. Marshall, L. Wu, M.S. Schofield, T. Aoki, R. Twesten, J. Hoffman, F.J. Walter, C.H. Ahn, Y. Zhu: Nat. Commun. 5, 4693 (2014)
C.R. Winkler, A.R. Damodaran, J. Karthik, L.W. Martin, M.L. Taheri: Micron 43, 1121–1126 (2012)
H. Chang, S.V. Kalinin, S. Yang, P. Yu, S. Bhattacharya, P.P. Wu, N. Balke, S. Jesse, L.Q. Chen, R. Ramesh, S.J. Pennycook, A.Y. Borisevich: J. Appl. Phys. 110, 052014 (2011)
C.T. Nelson, P. Gao, J.R. Jokisaari, C. Heikes, C. Adamo, A. Melville, S.H. Baek, C.M. Folkman, B. Winchester, Y. Gu, Y. Liu, K. Zhang, E. Wang, J. Li, L.Q. Chen, C.B. Eom, D.G. Schlom, X. Pan: Science 334(6058), 968–971 (2011)
H. He, X. Tan: Appl. Phys. Lett. 85, 3187–3189 (2004)
H. He, X. Tan: Phys. Rev. B 72, 24102 (2005)
X.-Q. Pan, M.-S. Hu, M.-H. Yao, D. Feng: Phys. Status Solidi A 92, 57–68 (1985)
S. Mori, N. Yamamoto, Y. Koyama, Y. Uesu: Phys. Rev. B 55, 11212–11217 (1997)
M. Verwerft, G. Van Tendeloo, J. Van Landuyt, S. Amelinckx: Ferroelectrics 88, 27–36 (1988)
S. Barre, H. Mutka, C. Roucau, A. Litzler, J. Schneck, J.C. Toledano, S. Bouffard, F. Rullier-Albenque: Phys. Rev. B 43, 11154–11161 (1991)
X. Lin, C. Murray, V.P. Dravid: Statics and dynamics of charged interfaces in electroceramics. In: Microscopy and Microanalysis, ed. by G.W. Bailey, et al. (Springer, New York 1998) pp. 552–553
Z. Xu, X. Tan, P. Han, J.K. Shang: Appl. Phys. Lett. 76, 3732–3734 (2000)
X. Tan, Z. Xu, J.K. Shang, P. Han: Appl. Phys. Lett. 77, 1529–1531 (2000)
X.L. Tan, H. He, J.K. Shang: J. Mater. Res. 20, 1641–1653 (2005)
X. Tan, J.K. Shang: J. Appl. Phys. 96, 2805–2810 (2004)
X. Tan, J.K. Shang: J. Appl. Phys. 95, 635–639 (2004)
B. Baufeld, D. Baither, U. Messerschmidt, M. Bartsch, A.H. Foitzik, M. Ruhle: J. Am. Ceram. Soc. 80, 1699–1705 (1997)
J.X. Zhang, B. Xiang, Q. He, J. Seidel, R.J. Zeches, P. Yu, S.Y. Yang, C.H. Wang, Y.H. Chu, L.W. Martin, A.M. Minor, R. Ramesh: Nat. Nanotechnol. 6, 98–102 (2011)
P. Gao, C. Nelson, J. Jokisaari, J. Britson, C. Duan, M. Trassin, S.H. Baek, H. Guo, L. Li, Y. Wang, A.M. Minor, C.B. Eom, R. Ramesh, L.Q. Chen, X. Pan: Nat. Commun. 5, 4801 (2014)
B. Xiang, D.J. Hwang, J.B. In, S.B. Ryu, J.H. Yoo, O. Dubon, A.M. Minor, C.P. Grigoropoulos: Nano Lett. 12, 2524–2529 (2012)
C. Zhang, T. Wei, Z. Xu, X. Wang, J. Liu, S. Li, T. Daiming, D. Liu, L. Meiyong, Y. Bando, D. Golberg: Nanoscale 6, 8084–8090 (2014)
Y. Ohno: Appl. Phys. Express 5, 125204 (2012)
M. Picher, S. Mazzucco, S. Blankenship, R. Sharma: Ultramicroscopy 150, 10–15 (2015)
F.I. Allen, E. Kim, N.C. Andresen, G.P. Grigoropoulos, A.M. Minor: Ultramicroscopy 178, 33–37 (2017)
H.G.F. Wilsdorf: Rev. Sci. Instrum. 29, 323 (1958)
E.P. Butler, K.F. Hale: Dynamic Experiments in the Electron Microscope, Practical Methods of Electron Microscopy, Vol. 9 (North-Holland, Amsterdam 1981)
U. Messerschmidt, D. Baither, M. Bartsch, B. Baufeld, B. Geyer, S. Guder, A. Wasilkowska, A. Czyrska-Filemonowicz, M. Yamaguchi, M. Feuerbacher, K. Urban: Microsc. Microanal. 4, 226–234 (1998)
M. Komatsu, H. Mori, K. Iwasaki: J. Am. Ceram. Soc. 77, 839–842 (1994)
A.M. Minor, S.A. Syed Asif, Z.W. Shan, E.A. Stach, E. Cyrankowski, T.J. Wyrobek, O.L. Warren: Nat. Mater. 5, 697–702 (2006)
O.L. Warren, Z. Shan, S.A. Syed Asif, E.A. Stach, J.W. Morris Jr., A.M. Minor: Mater. Today 10(4), 59–60 (2007)
M. Legros: Small-scale plasticity. In: Mechanics of Nano-Objects, ed. by O. Thomas, A. Ponchet, S. Forest (Presse des Mines, Paris 2011)
Q. Yu, M. Legros, A.M. Minor: MRS Bulletin 40, 62–68 (2015)
U. Messerschmidt, D. Baither, B. Baufeld, M. Bartsch: Mater. Sci. Eng. A 233, 61–74 (1997)
H. Mori: Mater. Trans. JIM 39, 959–966 (1998)
F. Pettinari, A. Couret, D. Caillard, G. Molenat, N. Clement, A. Coujou: J. Microsc. 203, 47–56 (2001)
G. Vanderschaeve, C. Levade, D. Caillard: J. Microsc. 203, 72–83 (2001)
U. Messerschmidt, M. Bartsch: Mater. Chem. Phys. 81, 518–523 (2003)
S.H. Oh, M. Legros, D. Kiener, G. Dehm: Nat. Mater. 8, 95 (2009)
M.E. Kassner, M.A. Wall, M.A. Delos-Reyes: Metall. Mater. Trans. A 28, 595–609 (1997)
M. Komatsu, Y. Matsukawa, K. Yasunaga, M. Kiritani: Mater. Sci. Eng. A 350, 25–29 (2003)
Q. Yu, Z.-W. Shan, J. Li, X. Huang, L. Xiao, J. Sun, E. Ma: Nature 463(18), 335–338 (2010)
Q. Yu, L. Qi, K. Chen, R.K. Mishra, J. Li, A.M. Minor: Nano Lett. 12, 887–892 (2012)
Q. Yu, L. Qi, R.K. Mishra, J. Li, A.M. Minor: Proc. Natl. Acad. Sci. 110(33), 13289–13293 (2013)
J. Gemperlova, A. Jacques, A. Gemperle, T. Vystavel, N. Zarubova, M. Janecek: Mater. Sci. Eng. A 324, 183–189 (2002)
F. Lancon, J. Ye, D. Caliste, T. Radetic, A.M. Minor, U. Dahmen: Nano Lett. 10, 695–700 (2010)
R.C. Hugo, H. Kung, J.R. Weertman, R. Mitra, J.A. Knapp, D.M. Follstaedt: Acta Mater. 51, 1937–1943 (2003)
Z. Shan, E.A. Stach, J.M.K. Wiezorek, J.A. Knapp, D.M. Forstaedt, S.X. Mao: Science 305, 654–657 (2004)
G. Dehm, E. Arzt: Appl. Phys. Lett. 77, 1126–1128 (2000)
T.J. Balk, G. Dehm, E. Arzt: Acta Mater. 51, 4471–4485 (2003)
R.-M. Keller-Flaig, M. Legros, W. Sigle, A. Gouldstone, K.J. Hemker, S. Suresh, E. Arzt: J. Mater. Res. 14, 4673–4676 (1999)
M. Legros, K.J. Hemker, A. Gouldstone, S. Suresh, R.M. Keller-Flaig, E. Arzt: Acta Mater. 50, 3435–3452 (2002)
D. Häussler, M. Bartsch, M. Aindow, I.P. Jones, U. Messerschmidt: Philos. Mag. A 79, 1045–1071 (1999)
M. Legros, A. Couret, D. Caillard: Philos. Mag. 73, 61–99 (1996)
M. Legros, Y. Minonishi, D. Caillard: Philos. Mag. A 76, 995–1032 (1997)
M. Legros, D. Caillard: J. Microsc. 203, 90–98 (2001)
J. Malaplate, D. Caillard, A. Couret: Philos. Mag. 84, 3671–3687 (2004)
S. Zghal, A. Coujou, A. Couret: Philos. Mag. A 81, 345 (2001)
S.G. Pyo, N.J. Kim: J. Mater. Res. 20, 1888–1901 (2005)
D. Caillard, C. Vailhe, D. Farkas: Philos. Mag. A 79, 723–739 (1999)
S. Watanabe, Y. Haishi, T. Suda, S. Ohnuki, H. Takahashi, M. Kiritani: Radiat. Eff. Defects Solids 157, 101–108 (2002)
U. Messerschmidt, M. Bartsch, M. Feuerbacher, B. Geyer, K. Urban: Philos. Mag. A 79, 2123–2135 (1999)
U. Messerschmidt: J. Microsc. 203, 68–71 (2001)
D. Caillard, C. Roucau, L. Bresson, D. Gratias: Acta Mater. 50, 4499–4509 (2002)
F. Mompiou, D. Caillard, M. Feuerbacher: Philos. Mag. 84, 2777 (2004)
M. Bartsch, P. Schall, M. Feuerbacher, U. Messerschmidt: J. Mater. Res. 20, 1814–1824 (2005)
S. Guder, M. Bartsch, U. Messerschmidt: Philos. Mag. A 82, 2737–2754 (2002)
E. Snoeck, C. Roucau: Phys. Rev. B 45, 12720–12724 (1992)
E. Tochigi, E. Zepeda-alarcon, H.-R. Wenk, A.M. Minor: Phys. Chem. Miner. 41, 757–765 (2014)
H. Gottschalk, N. Hiller, S. Sauerland, P. Specht, H. Alexander: Phys. Status Solidi A 138, 547–555 (1993)
G. Vanderschaeve, C. Levade, D. Caillard: J. Phys. Condens. Matter 12, 10093–10103 (2000)
T. Kruml, D. Caillard, C. Dupas, J.-L. Martin: J. Phys. Condens. Matter 14, 12897–12902 (2002)
H.R. Kolar, J.C.H. Spence, H. Alexander: Phys. Rev. Lett. 77, 4031–4034 (1996)
J.C.H. Spence, H.R. Kolar, H.R. Hembree, C.J. Humphreys, J. Barnard, R. Datta, C. Koch, F.M. Ross, J.F. Justo: Philos. Mag. 86, 4781–4796 (2006)
J.S. Vetrano, S.M. Bruemmer, L.M. Pawlowski, I.M. Robertson: Mater. Sci. Eng. A 238, 101–107 (1997)
R. Haitenhauer, M. Bartsch, U. Messerschmidt, P. Haasen, P.-J. Wilbrandt: Philos. Mag. A 70, 447–461 (1994)
J.S. Vetrano, S.M. Bruemmer, I.M. Robertson: Mater. Res. Soc. Symp. Proc. 404, 177–182 (1995)
L.M. Dougherty, I.M. Robertson, J.S. Vetrano: Acta Mater. 51, 4367–4378 (2003)
D. Caillard, J.L. Martin, B. Jouffrey: Acta Metall. 28, 1059–1067 (1980)
B. Verhaeghe, F. Louchet, B. Doisneau-Cottignies, Y. Brechet, J.-P. Massoud: Philos. Mag. A 76, 1079–1091 (1997)
M. Janecek, F. Louchet, B. Doisneau-Cottignies, Y. Brechet: Philos. Mag. A 80, 1605–1619 (2000)
W. Zielinski, W. Swiatnicki, M. Barstch, U. Messerschmidt: Mater. Chem. Phys. 81, 476–479 (2003)
L. Thilly, M. Veron, O. Ludwig, F. Lecouturier, J.P. Peyrade, S. Askenazy: Philos. Mag. A 82, 925–942 (2002)
F. Louchet, J.-J. Blandin, M. Veron: Adv. Eng. Mater. 3, 608–612 (2001)
M.A. Wall, T.W. Barbee, T.P. Weihs: Mater. Res. Soc. Symp. Proc. 404, 43–48 (1995)
M.A. Wall, T.W. Barbee Jr.: Mater. Res. Soc. Symp. Proc. 480, 245–250 (1997)
X. Tan, T. Du, J.K. Shang: Appl. Phys. Lett. 80, 3946–3948 (2002)
N. Li, J. Wang, J.Y. Huang, A. Misra, X. Zhang: Scr. Mater. 63(4), 363–366 (2010)
Z.W. Shan, J. Li, Y.Q. Cheng, A.M. Minor, S.A. Syed Asif, O.L. Warren, E. Ma: Phys. Rev. B 77, 155419–155416 (2008)
J.T.M. De Hosson: Microsc. Res. Tech. 72, 250–260 (2009)
H. Guo, P.F. Yan, Y.B. Wang, J. Tan, Z.F. Zhang, M.L. Sui, E. Ma: Nat. Mater. 6, 735–739 (2007)
I.M. Robertson, D. Teter: Microsc. Res. Tech. 42, 260–269 (1998)
D.F. Teter, I.M. Robertson, H.K. Birnbaum: Acta Mater. 49, 4313–4323 (2001)
P. Sofronis, I.M. Robertson: Philos. Mag. A 82, 3405–3413 (2002)
K. Maeda, K. Suzuki, Y. Yamashita, Y. Mera: J. Phys. Condens. Matter 12, 10079–10091 (2000)
R. Hull, J.C. Bean, D. Bahnck, L.J. Peticolas Jr., K.T. Short, F.C. Unterwald: J. Appl. Phys. 70, 2052–2065 (1991)
R. Hull, J.C. Bean, C. Buescher: J. Appl. Phys. 66, 5837–5843 (1989)
D.M. Follstaedt, S.M. Myers, J.A. Floro, S.R. Lee: Nucl. Instrum. Methods Phys. Res. B 127/128, 375–378 (1997)
N. Hueging, M. Luysberg, K. Urban, D. Buca, S. Mantl: Appl. Phys. Lett. 86(3), 42112–42111 (2005)
H.P. Sun, X.Q. Pan, J.H. Haeni, D.G. Schlom: Appl. Phys. Lett. 85, 1967–1969 (2004)
S. Lavagne, C. Levade, G. Vanderschaeve: Proc. Microsc. Semicond. Mater. 12, 219–224 (2001)
G. Dehm, T. Wagner, T.J. Balk, E. Arzt, B.J. Inkson: J. Mater. Sci. Technol. 18, 113–117 (2002)
X.H. Liu, F.M. Ross, K.W. Schwarz: Phys. Rev. Lett. 85, 4088–4091 (2000)
M. Kammler, D. Chidambarrao, K.W. Schwarz, C.T. Black, F.M. Ross: Appl. Phys. Lett. 87, 133116 (2005)
T. Ohmura, A.M. Minor, E.A. Stach, J.W. Morris Jr.: J. Mater. Res. 19, 3626–3632 (2004)
N. Gane: Proc. Royal Soc. A 317, 367–391 (1970)
M.A. Wall, U. Dahmen: Microsc. Res. Tech. 42, 248–254 (1998)
E.A. Stach, T. Freeman, A.M. Minor, D.K. Owen, J. Cumings, M.A. Wall, T. Chraska, R. Hull, J.W. Morris Jr., A. Zettl, U. Dahmen: Microsc. Microanal. 7, 507–517 (2001)
A.M. Minor, J.W. Morris, E.A. Stach: Appl. Phys. Lett. 79, 1625–1627 (2001)
M.S. Bobji, C.S. Ramanujan, R.C. Doole, J.B. Pethica, B.J. Inkson: Mater. Res. Soc. Symp. Proc. 778, 105–110 (2003)
S. Ii, C. Iwamoto, K. Matsunaga, T. Yamamoto, M. Yoshiya, Y. Ikuhara: Philos. Mag. 84, 2767–2775 (2004)
A.M. Minor, E.T. Lilleodden, M. Jin, E.A. Stach, D.C. Chrzan, J.W. Morris: Philos. Mag. 85, S323–S330 (2005)
M. Jin, A.M. Minor, E.A. Stach, J.W. Morris Jr.: Acta Mater. 52, 5381–5387 (2004)
W.A. Soer, J.T.M. De Hosson, A.M. Minor, J.W. Morris Jr., E.A. Stach: Acta Mater. 52, 5783–5790 (2004)
K. Matsunaga, S. Ii, C. Iwamoto, T. Yamamoto, Y. Ikuhara: Nanotechnology 15, S376–S381 (2004)
S. Korte, W.J. Clegg: Acta Mater. 58(1), 59–66 (2010)
A.P. Merkle, L.D. Marks: Appl. Phys. Lett. 90, 064101 (2007)
T.D.B. Jacobs, R.W. Carpick: Nat. Nanotechnol. 8, 108–112 (2013)
T. Kizuka, N. Tanaka, S. Deguchi, M. Naruse: Microsc. Microanal. 4, 218–225 (1998)
T. Kizuka, K. Hosoki: Appl. Phys. Lett. 75, 2743–2745 (1999)
Y. Naitoh, K. Takayanagi, Y. Oshima, H. Hirayama: J. Electron Microsc. 49, 211–216 (2000)
T. Kizuka: Phys. Rev. Lett. 81(16), 4448–4451 (1998)
T. Kizuka: Phys. Rev. B 57, 11158–11163 (1998)
S. Fujisawa, T. Kizuka: Tribol. Lett. 15, 163 (2003)
D. Kiener, A.M. Minor: Nano Lett. 11, 3816–3820 (2011)
J.C.H. Spence, W. Lo, M. Kuwabara: Ultramicroscopy 33, 69–82 (1990)
W. Lo, J. Spence: Ultramicroscopy 48, 433 (1992)
S. Fujisawa, T. Kizuka: Jpn. J. Appl. Phys. 42(2), L1182 (2003)
H. Ohnishi, Y. Kondo, K. Takayanagi: Surf. Sci. 415, L1061–4 (1998)
X.D. Bai, P.X. Gao, Z.L. Wang, E.G. Wang: Appl. Phys. Lett. 82, 4806–4808 (2003)
M.A. Haque, M.T.A. Saif: Exp. Mech. 43, 248–255 (2003)
M.A. Haque, M.T.A. Saif: Proc. Natl. Acad. Sci. 101, 6335–6340 (2004)
M.A. Haque, M.T.A. Saif: J. Mater. Res. 20, 1769–1777 (2005)
K. Hattar, J. Han, M.T.A. Saif, I.M. Robertson: J. Mater. Res. 20, 1869–1877 (2005)
Z.W. Shan, R.K. Mishra, S.A.S. Asif, O.L. Warren, A.M. Minor: Nat. Mater. 7(2), 115–119 (2008)
J. Ye, R.K. Mishra, A.M. Minor: Scr. Mater. 59(9), 951–954 (2008)
J. Cumings, A. Zettl: Science 289, 602–604 (2000)
D. Kiener, P. Hosemann, S.A. Maloy, A.M. Minor: Nat. Mater. 10, 608–613 (2011)
D. Kiener, A.M. Minor: Acta Mater. 59, 1328–1337 (2011)
D. Kiener, P. Kaufmann, A.M. Minor: Adv. Eng. Mater. 14(11), 960–967 (2012)
M.B. Lowry, D. Kiener, M.M. LeBlanc, C. Chisholm, J.N. Florando, J.W. Morris, A.M. Minor: Acta Mater. 58(15), 5160–5167 (2010)
A. Krishnan, E. Dujardin, T.W. Ebbesen, P.N. Yianilos, M.M.J. Treacy: Phys. Rev. B 58, 14013–14019 (1998)
Z.L. Wang, Z.R. Dai, R. Gao, J.L. Gole: J. Electron Microsc. 51(Suppl.), S79–S85 (2002)
R. Gao, Z.L. Wang, Z. Bai, W.A. de Heer, L. Dai, M. Gao: Phys. Rev. Lett. 85, 622–625 (2000)
Z.W. Shan, G. Adesso, A. Cabot, M.P. Sherburne, S.A. Syed Asif, O.L. Warren, D.C. Chrzan, A.M. Minor, A.P. Alivisatos: Nat. Mater. 7(12), 947–952 (2008)
C. Chisholm, H. Bei, M. Lowry, J. Oh, S.A. Syed Asif, O.L. Warren, Z.W. Shan, E.P. George, A.M. Minor: Acta Mater. 60, 2258–2264 (2012)
D. Tang, C. Ren, M. Wang, X. Wei, N. Kawamoto, C. Liu, Y. Bando, M. Mitome, N. Fukata, D. Golberg: Nano Lett. 12, 1898–1904 (2012)
T. Kuzumaki, H. Sawada, H. Ichinose, Y. Horiike, T. Kizuka: Appl. Phys. Lett. 79, 4580–4582 (2001)
K. Asaka, T. Kizuka: Phys. Rev. B 72, 115431 (2005)
H. Hirayama, Y. Kawamoto, Y. Ohshima, K. Takayanagi: Appl. Phys. Lett. 79, 1169–1171 (2001)
Y.J. Suh, S.V. Prikhodko, A.K. Friedlander: Microsc. Microanal. 8, 497 (2004)
K. Suenaga, C. Colliex, S. Iijima: Appl. Phys. Lett. 78, 70–72 (2001)
N. De Jonge, F.M. Ross: Nat. Nanotechnol. 6, 695–704 (2011)
F.M. Ross: Science 350, aaa9886 (2015)
E. Jensen, K.R. Molhave: Encapsulated liquid cells for transmission electron microscopy. In: Liquid Cell Electron Microscopy, ed. by F.M. Ross (Cambridge Univ. Press, Cambridge 2016) pp. 35–55
J.M. Yuk, J. Park, P. Ercius, K. Kim, D.J. Hellebusch, M.F. Crommie, J.Y. Lee, A. Zettl, A.P. Alivisatos: Science 336, 61–64 (2012)
J. Shah: Philos. Mag. 84, 2749–2765 (2004)
A. Fukami, K. Fukushima, N. Kohyama: Observation technique for wet clay minerals using film-sealed environmental cell equipment attached to high-resolution electron microscope. In: Microstructure of Fine Grained Sediments from Mud to Shale, ed. by R.H. Bennett, W.R. Bryant, M.H. Hulbert (Springer, New York 1991) pp. 321–331
T.L. Daulton, B.J. Little, K. Lowe, J. Jones-Meehan: Microsc. Microanal. 7, 470–485 (2001)
K.H. Foo, W.-A. Chiou, A. Ishikawa, K. Fukushima, M. Meshii: Microsc. Microanal. 7(Suppl. 2), 1216–1217 (2001)
W.-A. Chiou, A. Ishikawa, K.H. Foo, H. Miyata, H. Tsukada, K. Fukushima: In-situ study of small particles in liquid environment. In: Proc. ICEM15, Vol. 1 (2002) pp. 937–938
H. Sugi, T. Akimoto, K. Sutoh, S. Chaen, N. Oishi, S. Suzuki: Proc. Natl. Acad. Sci. USA 94, 4378–4382 (1997)
H. Sugi, S. Chaen, T. Akimoto, H. Minoda, T. Miyakawa, Y. Miyauchi, M. Tanokura, S. Sugiura: Sci. Rep. 5, 15700 (2015)
M.E. Wise, G. Biskos, S.T. Martin, L.M. Russell, P.R. Buseck: Aerosol Sci. Technol. 39, 849–856 (2005)
K. Yoshida, A.N. Bright, M.R. Ward, L. Lari, X. Zhang, T. Hiroyama, E.D. Boyes, P.L. Gai: Nanotechnology 25, 425702 (2014)
P.L. Gai, M.A. Harmer: Nano Lett. 2, 771–774 (2002)
A. Radisic, P.M. Vereecken, J.B. Hannon, P.C. Searson, F.M. Ross: Nano Lett. 6, 238–242 (2006)
A.J. Leenheer, K.L. Jungjohann, K.R. Zavadil, J.P. Sullivan, C.T. Harris: ACS Nano 9, 4379–4389 (2015)
N. Hodnik, G. Dehm, K.J. Mayrhofer: Acc. Chem. Res. 49, 2015–2022 (2016)
M.J. Williamson, R.M. Tromp, P.M. Vereecken, R. Hull, F.M. Ross: Nat. Mater. 2, 532–536 (2003)
M.E. Holtz, Y. Yu, D. Gunceler, J. Gao, R. Sundararaman, K.A. Schwarz, T.A. Arias, H.D. Abruña, D.A. Muller: Nano Lett. 14, 1453–1459 (2014)
M. Gu, L.R. Parent, B.L. Mehdi, R.R. Unocic, M.T. McDowell, R.L. Sacci, W. Xu, J.G. Connell, P. Xu, P. Abellan, X. Chen, Y. Zhang, D.E. Perea, J.E. Evans, L.J. Lauhon, J.-G. Zhang, J. Liu, N.D. Browning, Y. Cui, I. Arsland, C.-M. Wang: Nano Lett. 13, 6106–6112 (2013)
R.L. Sacci, N.J. Dudney, K.L. More, L.R. Parent, I. Arslan, N.D. Browning, R.R. Unocic: Chem. Commun. 50, 2104–2107 (2014)
Z. Zeng, W.-I. Liang, H.-G. Liao, H.L. Xin, Y.-H. Chu, H. Zheng: Nano Lett. 14, 1745–1750 (2014)
R.L. Sacci, J.M. Black, N. Balke, N.J. Dudney, K.L. More, R.R. Unocic: Nano Lett. 15, 2011–2018 (2015)
E.R. White, S.B. Singer, V. Augustyn, W.A. Hubbard, M. Mecklenburg, B. Dunn, B.C. Regan: ACS Nano 6, 6308–6317 (2012)
B.L. Mehdi, J. Qian, E. Nasybulin, C. Park, D.A. Welch, R. Faller, H. Mehta, W.A. Henderson, W. Xu, C.M. Wang, J.E. Evans, J. Liu, J.-G. Zhang, K.T. Mueller, N.D. Browning: Nano Lett. 15, 2168–2173 (2015)
P. Abellan, B.L. Mehdi, L.R. Parent, M. Gu, C. Park, W. Xu, Y. Zhang, I. Arslan, J.-G. Zhang, C.-M. Wang, J.E. Evans, N.D. Browning: Nano Lett. 14, 1293–1299 (2014)
K.-Y. Niu, J. Park, H. Zheng, A.P. Alivisatos: Nano Lett. 13, 5715–5719 (2013)
J.M. Grogan, N.M. Schneider, F.M. Ross, H.H. Bau: Nano Lett. 14, 359–364 (2013)
S.W. Chee, S.H. Pratt, K. Hattar, D. Duquette, F.M. Ross, R. Hull: Chem. Commun. 51, 168–171 (2015)
X. Zhong, M.G. Burke, S. Schilling, S.J. Haigh, N.J. Zaluzec: Microsc. Microanal. 20(S3), 1514–1515 (2014)
H.-G. Liao, K. Niu, H. Zheng: Chem. Commun. 49, 11720–11727 (2013)
J.E. Evans, K.L. Jungjohann, N.D. Browning, I. Arslan: Nano Lett. 11(7), 2809–2813 (2011)
H. Zheng, R.K. Smith, Y.W. Jun, C. Kisielowski, U. Dahmen, A.P. Alivisatos: Science 324, 1309–1312 (2009)
T.J. Woehl, C. Park, J.E. Evans, I. Arslan, W.D. Ristenpart, N.D. Browning: Nano Lett. 14, 373–378 (2013)
D. Alloyeau, W. Dachraoui, Y. Javed, H. Belkahla, G. Wang, H. Lecoq, S. Ammar, O. Ersen, A. Wisnet, F. Gazeau, C. Ricolleau: Nano Lett. 15(4), 2574 (2015)
H.-G. Liao, D. Zherebetskyy, H. Xin, C. Czarnik, P. Ercius, H. Elmlund, M. Pan, L.-W. Wang, H. Zheng: Science 345, 916–919 (2014)
T.J. Woehl, J.E. Evans, I. Arslan, W.D. Ristenpart, N.D. Browning: ACS Nano 6, 8599–8610 (2012)
Y. Jiang, G. Zhu, F. Lin, H. Zhang, C. Jin, J. Yuan, D. Yang, Z. Zhang: Nano Lett. 14, 3761–3765 (2014)
J.M. Grogan, L. Rotkina, H.H. Bau: Phys. Rev. E 83, 061405 (2011)
J. Park, H. Zheng, W.C. Lee, P.L. Geissler, E. Rabani, A.P. Alivisatos: ACS Nano 6, 2078–2085 (2012)
M.H. Nielsen, J.R.I. Lee, Q.N. Hu, T.Y.J. Han, J.J. De Yoreo: Faraday Discuss. 159, 105–121 (2012)
L.R. Parent, D.B. Robinson, T.J. Woehl, W.D. Ristenpart, J.E. Evans, N.D. Browning, I. Arslan: ACS Nano 6, 3589–3596 (2012)
D.S. Li, M.H. Nielsen, J.R.I. Lee, C. Frandsen, J.F. Banfield, J.J. De Yoreo: Science 336, 1014–1018 (2012)
E.R. White, M. Mecklenburg, S.B. Singer, S. Aloni, B.C. Regan: Appl. Phys. Express 4, 055201 (2011)
U. Mirsaidov, C.-D. Ohl, P. Matsudaira: Soft Matter 8, 7108–7111 (2012)
U.M. Mirsaidov, H. Zheng, D. Bhattacharya, Y. Casana, P. Matsudaira: Proc. Natl. Acad. Sci. 109, 7187–7190 (2012)
D. Bhattacharya, M. Bosman, V.R.S.S. Mokkapati, F.Y. Leong, U. Mirsaidov: Microsc. Microanal. 20, 407–415 (2014)
D. Mattia, Y. Gogotsi: Microfluid. Nanofluid. 5, 289–305 (2008)
H. Zheng, S.A. Claridge, A.M. Minor, A.P. Alivisatos, U. Dahmen: Nano Lett. 9, 2460–2465 (2009)
A. Verch, M. Pfaff, N. de Jonge: Langmuir 31, 6956–6964 (2015)
J. Lu, Z. Aabdin, N.D. Loh, D. Bhattacharya, U. Mirsaidov: Nano Lett. 14, 2111–2115 (2014)
K. Tai, Y. Liu, S.J. Dillon: Microsc. Microanal. 20, 330–337 (2014)
N.M. Schneider, M.M. Norton, B.J. Mendel, J.M. Grogan, F.M. Ross, H.H. Bau: J. Phys. Chem. C 118, 22373–22382 (2014)
R.C. Birtcher, M.A. Kirk, K. Furuya, G.R. Lumpkin, M.O. Ruault: J. Mater. Res. 20, 1654–1683 (2005)
S. Jesse, A.Y. Borisevich, J.D. Fowlkes, A.R. Lupini, P.D. Rack, R.R. Unocic, B.G. Sumpter, S.V. Kalinin, A. Belianinov, O.S. Ovchinnikova: ACS Nano 10, 5600–5618 (2016)
G.M. Bond, I.M. Robertson, H.K. Birnbaum: Scr. Metall. 20, 653–658 (1986)
H. Yoshida, H. Omote, S. Takeda: Nanoscale 21, 13113–13118 (2014)
M. Shimojo, K. Mitsuishi, M. Tanaka, M. Han, K. Furuya: J. Microsc. 214, 76–79 (2004)
K. Furuya, K. Mitsuishi, M. Shimojo, M. Takeguchi: Rev. Adv. Mater. Sci. 5, 381–386 (2003)
M. Tanaka, F. Chu, M. Shimojo, M. Takeguchi, K. Mitsuishi, K. Furuya: Appl. Phys. Lett. 86, 183104 (2005)
M. Takeguchi, M. Shimojo, K. Furuya: Nanotechnology 16, 1321–1325 (2005)
W.F. van Dorp: Appl. Phys. A 117, 1615–1622 (2014)
R.F. Egerton, P. Li, M. Malac: Micron 35, 399–409 (2004)
H. Guo, K.V. Wang, Y. Deng, Y. Oh, S.A. Syed Asif, O.L. Warren, Z.W. Shan, J. Wu, A.M. Minor: Appl. Phys. Lett. 102(23), 231909–231014 (2013)
H. Guo, M.I. Khan, C. Cheng, W. Fan, C. Dames, J. Wu, A.M. Minor: Nat. Commun. 5, 4986 (2014)
H. Inui, H. Mori, A. Suzuki, H. Fujita: Philos. Mag. B 65, 1–14 (1992)
S. Takeda, J. Yamasaki: Phys. Rev. Lett. 83, 320–323 (1999)
H. Yasuda, H. Mori: J. Electron Microsc. 48, 581–584 (1999)
T.M. Smeeton, M.J. Kappers, J.S. Barnard, M.E. Vickers, C.J. Humphreys: Appl. Phys. Lett. 83, 5419–5421 (2003)
C. Chen, Z. Wang, F. Lichtenberg, Y. Ikuhara, J.G. Bednorz: Nano Lett. 15, 6469–6474 (2015)
D.K. Tappin, I.M. Robertson, H.K. Birnbaum: Phys. Rev. B 51, 14854–14860 (1995)
I. Jencic, M.W. Bench, I.M. Robertson, M.A. Kirk: J. Appl. Phys. 78, 974–982 (1995)
Y. Zhang, J. Lian, C.M. Wang, W. Jiang, R.C. Ewing, W.J. Weber: Phys. Rev. B 72, 094112 (2005)
S. Jesse, Q. He, A.R. Lupini, D.N. Leonard, M.P. Oxley, O. Ovchinnikov, R.R. Unocic, A. Tselev, M. Fuentes-Cabrera, B.G. Sumpter, S.J. Pennycook, S.V. Kalinin, A.Y. Borisevich: Small 11, 5895–5900 (2015)
X. Huang, T. Jones, H. Fan, M.-G. Willinger: Adv. Mater. Interfaces 3, 1600751 (2016)
K. Sun, L.M. Wang, R.C. Ewing, W.J. Weber: Philos. Mag. 85, 597–608 (2005)
S. Fujita, S. Maruno, H. Watanabe, M. Ichikawa: Appl. Phys. Lett. 69, 638–640 (1996)
G.S. Chen, C.B. Boothroyd, C.J. Humphreys: Philos. Mag. A 78, 491–506 (1998)
X.W. Du, M. Takeguchi, M. Tanaka, K. Furuya: Appl. Phys. Lett. 82, 1108–1110 (2003)
Y. Mera, K. Suzuki, K. Maeda: Physica B 340–342, 488–491 (2003)
D. Grozea, E. Landree, L.D. Marks: Appl. Phys. Lett. 71, 2301–2303 (1997)
N. Jiang: J. Phys. D 46, 305502 (2013)
A.W. Robertson, G.-D. Lee, K. He, Y. Fan, C.S. Allen, S. Lee, H. Kim, E. Yoon, H. Zheng, A.I. Kirkland, J.H. Warner: Nano Lett. 15, 5950–5955 (2015)
A. Hashimoto, K. Suenaga, A. Gloter, K. Urita, S. Iijima: Nature 430, 870–873 (2004)
J. Kotakoski, C. Mangler, J.C. Meyer: Nat. Commun. 5, 3991 (2014)
K. Urita, K. Suenaga, T. Sugai, H. Shinohara, S. Iijima: Phys. Rev. Lett. 94, 155502 (2005)
P.Y. Huang, S. Kurasch, J.S. Alden, A. Shekhawat, A.A. Alemi, P.L. McEuen, J.P. Sethna, U. Kaiser, D.A. Muller: Science 342, 2249227 (2013)
A.L. Gibb, N. Alem, J.-H. Chen, K.J. Erickson, J. Ciston, A. Gautam, M. Linck, A. Zettl: J. Am. Chem. Soc. 135, 6758–6761 (2013)
H.-P. Komsa, S. Kurasch, O. Lehtinen, U. Kaiser, A.V. Krasheninnikov: Phys. Rev. B 88, 035301 (2013)
K. Urita, Y. Sato, K. Suenaga, A. Gloter, A. Hashimoto, M. Ishida, T. Shimada, H. Shinohara, S. Iijima: Nano Lett. 4, 2451–2454 (2004)
T. Pham, A.L. Gibb, Z. Li, S.M. Gilbert, C. Song, S.G. Louie, A. Zettl: Nano Lett. 16, 7142–7147 (2016)
S.D. Berger, I.G. Salisbury, R.H. Milne, D. Imeson, C.J. Humphreys: Philos. Mag. B 55, 341–358 (1987)
C.A. Walsh: Philos. Mag. A 59, 227–246 (1989)
Q. Xu, M.-Y. Wu, G.F. Schneider, L. Houben, S.K. Malladi, C. Dekker, E. Yucelen, R.E. Dunin-Borkowski, H.W. Zandbergen: ACS Nano 7, 1566–1572 (2013)
X. Liu, T. Xu, X. Wu, Z. Zhang, J. Yu, H. Qiu, J.-H. Hong, C.-H. Jin, J.-X. Li, X.-R. Wang: Nat. Commun. 4, 1776 (2013)
J.A. Rodríguez-Manzo, A.V. Krasheninnikov, F. Banhart: Chem. Phys. Chem. 13, 2596 (2012)
L. Fedina, A. Gutakovskii, A. Aseev, J. van Landuyt, J. Vanhellemont: Philos. Mag. A 77, 423–435 (1998)
M. Kiritani: Radiat. Eff. Defects Solids 148, 233–267 (1999)
S. Arai, C. Morita, K. Arakawa, M. Kiritani: J. Electron Microsc. 44, 1–7 (1995)
K. Arakawa, Y. Satoh, S. Arai, M. Kiritani: Philos. Mag. A 80, 2041–2055 (2000)
S. Arai, Y. Satoh, K. Arakawa, C. Morita, M. Kiritani: J. Electron Microsc. 53, 21–27 (2004)
M. Horiki, S. Arai, Y. Satoh, M. Kiritani: J. Nucl. Mater. 255, 165–173 (1998)
M.A. Kirk, M.L. Jenkins, H. Fukushima: Mater. Res. Soc. Symp. Proc. 540, 521–526 (1999)
A. Arakawa, S. Arai, H. Orihara, K. Ono, M. Kiritani: J. Electron Microsc. 51(Suppl.), S225–S229 (2002)
J. Vanhellemont, A. Romano-Rodriguez, L. Fedina, J. Van Landuyt, A. Aseev: Mater. Sci. Techn. 11, 1194–1202 (1995)
L. Fedina, O. Lebedev, G. Van Tendeloo, J. Van Landuyt: Proc. Microsc. Semicond. Mater. 10, 55–58 (1997)
R.F. Klie, N. Browning: J. Electron Microsc. 50(Suppl.), 59 (2001)
Y. Ding, Y. Chen, K.C. Pradel, M. Liu, Z.L. Wang: J. Appl. Phys. 120, 214302 (2016)
H. Mori, H. Yasuda, H. Koyama, N. Sumida, H. Fujita: Nucl. Instrum. Methods Phys. Res. B 63, 291–296 (1992)
H. Yasuda, H. Mori, T. Sakata, M. Naka, H. Fujita: Philos. Mag. B 65, 1001–1009 (1992)
J.G. Lee, E. Taguchi, H. Mori: J. Electron Microsc. 51(Suppl.), S195–S200 (2002)
C. Levade, A. Faress, G. Vanderschaeve: Philos. Mag. A 69, 855–870 (1994)
M. Werner, E.R. Weber, M. Bartsch, U. Messerschmidt: Phys. Status Solidi A 150, 337–341 (1995)
I. Yonenaga, M. Werner, M. Bartsch, U. Messerschmidt, E.R. Weber: Phys. Status Solidi A 171, 35–40 (1999)
M. Inoue, K. Suzuki, H. Amasuga, Y. Mera, K. Maeda: J. Appl. Phys. 83, 1953–1957 (1998)
I. Yonenaga, P.D. Brown, C.J. Humphreys: Mater. Sci. Eng. A 253, 148–150 (1998)
K. Zheng, C. Wang, Y.-Q. Cheng, Y. Yue, X. Han, Z. Zhang, Z. Shan, S.X. Mao, M. Ye, Y. Yin, E. Ma: Nat. Commun. 1, 24 (2010)
R.C. Birtcher, S.E. Donnelly, M. Song, K. Furuya, K. Mitsuishi, C.W. Allen: Phys. Rev. Lett. 83, 1617–1620 (1999)
C.W. Allen, E.A. Ryan: Microsc. Res. Tech. 42, 255–259 (1998)
M.O. Ruault, F. Fortuna, H. Bernas, J. Chaumont, O. Kaitasov, V.A. Borodin: J. Mater. Res. 20, 1758–1768 (2005)
F. Chu, M. Song, K. Mitsuishi, H. Yasuda, K. Furuya: J. Electron Microsc. 51(Suppl.), S231–S234 (2002)
K. Ono, K. Arakawa, K. Hojou, M. Oohasi, R.C. Birtcher, S.E. Donnelly: J. Electron Microsc. 51(Suppl.), S245–S251 (2002)
T.L. Daulton, M.A. Kirk, L.E. Rehn: Philos. Mag. A 80, 809–842 (2000)
M.O. Ruault, F. Fortuna, H. Bernas, M.C. Ridgway, J.S. Williams: Appl. Phys. Lett. 81, 2617–2619 (2002)
Y. Chen, J. Li, K.Y. Yu, H. Wang, M.A. Kirk, M. Li, X. Zhang: Acta Mater. 111, 148–156 (2016)
J. Li, C. Fan, J. Ding, S. Xue, Y. Chen, Q. Li, H. Wang, X. Zhang: Sci. Rep. 7, 39484 (2017)
O. El-Atwani, J.E. Nathaniel II, A.C. Leff, B.R. Muntifering, J.K. Baldwin, K. Hattar, M.L. Taheri: J. Nucl. Mater. 484, 236–244 (2017)
K. Hattar, D.C. Bufford, D.L. Buller: Nucl. Instrum. Methods Phys. Res. 338, 56–65 (2014)
C.W. Allen, R.C. Birtcher, S.E. Donnelly, K. Furuya, N. Ishikawa, M. Song: Appl. Phys. Lett. 74, 2611–2613 (1999)
M. Song, K. Mitsuishi, H. Yasuda, K. Furuya: J. Electron Microsc. 51(Suppl.), S211–S214 (2002)
C.W. Allen, R.C. Birtcher, S.E. Donnelly, M. Song, K. Mitsuishi, K. Furuya, U. Dahmen: Philos. Mag. Lett. 83, 57–64 (2003)
M. Tanaka, K. Furuya, T. Saito: Microsc. Microanal. 4, 207–217 (1998)
P. Gnauck, W. Nisch, E. Plies: Cross-sectional investigation of the internal interface between biological cell tissue and implant materials in the transmission electron microscope (TEM). In: Proc. Int. Congr. Electron Microsc. 14, Vol. 3, ed. by H.A. Calderon Benavides, M.J. Yacaman (IEEE, Piscataway 1998) pp. 515–516
T. Isshiki, K. Nishio, Y. Deguchi, H. Yamamoto, M. Shojiri: HRTEM observation of ceramics with a new heating stage coupled to radiation thermometer. In: Proc. Int. Congr. Electron Microsc. 14, Vol. 3, ed. by H.A. Calderon Benavides, M.J. Yacaman (1998) pp. 521–522
C. Gammer, J. Kacher, C. Czarnik, O.L. Warren, J. Ciston, A.M. Minor: Appl. Phys. Lett. 109(8), 081906 (2016)
H. Poppa: J. Vac. Sci. Technol. 2, 42–48 (1965)
Metadaten
Titel
In Situ Transmission Electron Microscopy
verfasst von
Frances M. Ross
Andrew M. Minor
Copyright-Jahr
2019
Verlag
Springer International Publishing
Buch
Springer Handbook of Microscopy

Print ISBN: 978-3-030-00068-4

Electronic ISBN: 978-3-030-00069-1

Copyright-Jahr: 2019

DOI
https://doi.org/10.1007/978-3-030-00069-1_3

Premium Partner

    Marktübersichten

    Die im Laufe eines Jahres in der „adhäsion“ veröffentlichten Marktübersichten helfen Anwendern verschiedenster Branchen, sich einen gezielten Überblick über Lieferantenangebote zu verschaffen. 

    Zur Marktübersicht
    Bildnachweise