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Erschienen in:
1990 | OriginalPaper | Buchkapitel
Introduction
verfasst von : Niraj K. Jha, Sandip Kundu
Erschienen in: Testing and Reliable Design of CMOS Circuits
Verlag: Springer US
Enthalten in: Professional Book Archive
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Very Large Scale Integration (VLSI) has enabled us to implement very complex circuits on a single chip. Complementary Metal Oxide Semiconductor (CMOS) technology has played a dominant role in allowing this to happen. The advantages of VLSI circuits are obvious. However, they do pose a problem. The problem is how do we test the VLSI chips to ensure that they function as they are supposed to. With chips containing a million or more transistors, testing has become a difficult and time-consuming job. Testing is becoming an increasing part of the time it takes from conception to marketing of a chip. This problem can only become more severe in the future.