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Journal of Electronic Materials

Ausgabe 11/2013

2012 U.S. Workshop on the Physics and Chemistry of II-VI Materials. Guest Editors: S. Sivananthan and N.K. Dhar

Inhalt (52 Artikel)

Foreword

S. Sivananthan, N. K. Dhar, Y. Anter

Characterization of Plasma Etching Process Damage in HgCdTe

A. Gaucher, J. Baylet, J. Rothman, E. Martinez, C. Cardinaud

Numerical Simulation and Analytical Modeling of InAs nBn Infrared Detectors with p-Type Barriers

Marion Reine, Jonathan Schuster, Benjamin Pinkie, Enrico Bellotti

Correlations of Bridgman-Grown Cd0.9Zn0.1Te Properties with Different Ampoule Rotation Schemes

Amlan Datta, Santosh Swain, Yunlong Cui, Arnold Burger, Kelvin Lynn

Interaction Between AsHg and V Hg in Arsenic-Doped Hg1−x Cd x Te

Ziyan Wang, Yan Huang, Xiaoshuang Chen, Huxian Zhao, Wen Lei, Wei Lu

A Slightly Oxidizing Etchant for Polishing of CdTe and CdZnTe Surfaces

V. G. Ivanits’ka, P. Moravec, V. M. Tomashik, K. Mašek, Z. F. Tomashik, J. Franc, R. Grill, P. Höschl

Superlattice and Quantum Dot Unipolar Barrier Infrared Detectors

David Z.-Y. Ting, Alexander Soibel, Sam A. Keo, Arezou Khoshakhlagh, Cory J. Hill, Linda Höglund, Jason M. Mumolo, Sarath D. Gunapala

Determination of Critical Thickness for Epitaxial ZnTe Layers Grown by Molecular Beam Epitaxy on (211)B and (100) GaSb Substrates

J. Chai, O. C. Noriega, A. Dedigama, J. J. Kim, A. A. Savage, K. Doyle, C. Smith, N. Chau, J. Pena, J. H. Dinan, D. J. Smith, T. H. Myers

Comparison of the Schaake and Benson Etches to Delineate Dislocations in HgCdTe Layers

S. Farrell, Mulpuri V. Rao, G. Brill, Y. Chen, P. Wijewarnasuriya, N. Dhar, J. D. Benson, K. Harris

Depth Profiling of Electronic Transport Parameters in n-on-p Boron-Ion-Implanted Vacancy-Doped HgCdTe

G. A. Umana-Membreno, H. Kala, J. Antoszewski, Z. H. Ye, W. D. Hu, R. J. Ding, X. S. Chen, W. Lu, L. He, J. M. Dell, L. Faraone

Cross-Sectional Study of Macrodefects in MBE Dual-Band HgCdTe on CdZnTe

M. Reddy, D. D. Lofgreen, K. A. Jones, J. M. Peterson, W. A. Radford, J. D. Benson, S. M. Johnson

The Effect of Subbandgap Illumination on the Bulk Resistivity of CdZnTe

Jonathan S. Wright, Aaron L. Washington II, Martine C. Duff, Arnold Burger, Michael Groza, Liviu Matei, Vladimir Buliga

Postgrowth Annealing of CdTe Layers Grown on Si Substrates by Metalorganic Vapor-Phase Epitaxy

K. Yasuda, M. Niraula, S. Namba, T. Kondo, S. Muramatsu, H. Yamashita, Y. Wajima, Y. Agata

Advancements in THM-Grown CdZnTe for Use as Substrates for HgCdTe

Jason MacKenzie, Francis Joseph Kumar, Henry Chen

Strain Determination in Quasi-Lattice-Matched LWIR HgCdTe/CdZnTe Layers

P. Ballet, X. Baudry, B. Polge, D. Brellier, J. Merlin, P. Gergaud

Low-Temperature Photoluminescence Study of CdTe:In Crystals Annealed in Molten Bismuth

G. Yang, A. E. Bolotnikov, Y. Cui, G. S. Camarda, A. Hossain, K. H. Kim, J. Franc, E. Belas, R. B. James

TEM Characterization of HgCdTe/CdTe Grown on GaAs(211)B Substrates

Jae Jin Kim, R. N. Jacobs, L. A. Almeida, M. Jaime-Vasquez, C. Nozaki, David J. Smith

Analysis of Mesa Dislocation Gettering in HgCdTe/CdTe/Si(211) by Scanning Transmission Electron Microscopy

R. N. Jacobs, A. J. Stoltz, J. D. Benson, P. Smith, C. M. Lennon, L. A. Almeida, S. Farrell, P. S. Wijewarnasuriya, G. Brill, Y. Chen, M. Salmon, J. Zu

Novel Multistate Quantum Dot Gate FETs Using SiO2 and Lattice-Matched ZnS-ZnMgS-ZnS as Gate Insulators

M. Lingalugari, K. Baskar, P.-Y. Chan, P. Dufilie, E. Suarez, J. Chandy, E. Heller, F. C. Jain

Investigations on a Multiple Mask Technique to Depress Processing-Induced Damage of ICP-Etched HgCdTe Trenches

Z. H. Ye, W. D. Hu, W. Lei, L. Yang, P. Zhang, Y. Huang, C. Lin, C. H. Sun, X. N. Hu, R. J. Ding, X. S. Chen, W. Lu, L. He

Simulation of Current Transport in Polycrystalline CdTe Solar Cells

F. Troni, R. Menozzi, E. Colegrove, C. Buurma

Investigation of Radiation Collection by InSb Infrared Focal-Plane Arrays with Micro-optic Structures

N. Guo, W. D. Hu, X. S. Chen, W. Lei, Y. Q. Lv, X. L. Zhang, J. J. Si, W. Lu

Large-Format and Long-Wavelength Infrared Mercury Cadmium Telluride Detectors

J. Wenisch, H. Bitterlich, M. Bruder, P. Fries, R. Wollrab, J. Wendler, R. Breiter, J. Ziegler

Four-State Sub-12-nm FETs Employing Lattice-Matched II–VI Barrier Layers

F. Jain, P.-Y. Chan, E. Suarez, M. Lingalugari, J. Kondo, P. Gogna, B. Miller, J. Chandy, E. Heller

Investigation of Trap States in Mid-Wavelength Infrared Type II Superlattices Using Time-Resolved Photoluminescence

Blair C. Connelly, Grace D. Metcalfe, Hongen Shen, Michael Wraback, Chadwick L. Canedy, Igor Vurgaftman, Joseph S. Melinger, Chaffra A. Affouda, Eric M. Jackson, Jill A. Nolde, Jerry R. Meyer, Edward H. Aifer

Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrates

J. D. Benson, L. O. Bubulac, C. M. Lennon, R. N. Jacobs, P. J. Smith, J. K. Markunas, M. Jaime-Vasquez, L. A. Almeida, A. Stoltz, J. A. Arias, G. Brill, Y. Chen, P. S. Wijewarnasuriya, M. F. Vilela, J. Peterson, S. M. Johnson, D. D. Lofgreen, D. Rhiger, E. A. Patten, J. Bangs

Variable-Field Hall Measurement and Transport in LW Single-Layer n-Type MBE Hg1−x Cd x Te

A. E. Brown, M. Jaime-Vasquez, L. A. Almeida, J. Arias, C. M. Lennon, R. N. Jacobs, J. Pellegrino, S. Sivananthan

High-Performance M/LWIR Dual-Band HgCdTe/Si Focal-Plane Arrays

M. F. Vilela, K. R. Olsson, E. M. Norton, J. M. Peterson, K. Rybnicek, D. R. Rhiger, C. W. Fulk, J. W. Bangs, D. D. Lofgreen, S. M. Johnson

Nitrogen Plasma Doping of Single-Crystal ZnTe and CdZnTe on Si by MBE

Richard Kodama, Thomas Seldrum, Xiaojin Wang, J. H. Park, Eric Colegrove, Xin Zheng, Ramesh Dhere, Siva Sivananthan

1/f Noise in HgCdTe Focal-Plane Arrays

M.A. Kinch, R.L. Strong, C.A. Schaake

Fabrication and Simulation of an Indium Gallium Arsenide Quantum-Dot-Gate Field-Effect Transistor (QDG-FET) with ZnMgS as a Tunnel Gate Insulator

P.-Y. Chan, M. Gogna, E. Suarez, F. Al-Amoody, S. Karmakar, B. I. Miller, E. K. Heller, J. E. Ayers, F. C. Jain

Applications of the Infrared Measurement Analyzer: Hydrogenated LWIR HgCdTe Detectors

Christopher Buurma, Paul Boieriu, Ramana Bommena, Sivalingam Sivananthan

Modeling of Dark Current in HgCdTe Infrared Detectors

A. Ferron, J. Rothman, O. Gravrand

History of the “Detector Materials Engineering” Crystal Growth Process for Bulk Hg1−x Cd x Te

W. M. Higgins, D. A. Nelson, R. G. Roy, R. P. Murosako, R. A. Lancaster, J. Tower, P. Norton

Arsenic p-Doping of HgCdTe Grown by Molecular Beam Epitaxy (MBE): A Solved Problem?

James W. Garland, Christoph Grein, Sivalingam Sivananthan

Ge-ZnSSe Spatial Wavefunction Switched (SWS) FETs to Implement Multibit SRAMs and Novel Quaternary Logic

P. Gogna, E. Suarez, M. Lingalugari, J. Chandy, E. Heller, E.-S. Hasaneen, F.-C. Jain

The Surface Kinetics of MBE-Grown CdTe (211)B During In Situ Cyclic Annealing

C. M. Lennon, L. A. Almeida, R. N. Jacobs, J. D. Benson, P. J. Smith, J. K. Markunas, J. Arias, J. Pellegrino

Issues in HgCdTe Research and Expected Progress in Infrared Detector Fabrication

O. Gravrand, G. Destefanis, S. Bisotto, N. Baier, J. Rothman, L. Mollard, D. Brellier, L. Rubaldo, A. Kerlain, V. Destefanis, M. Vuillermet

A Novel Metal-Rich Anneal for In Vacuo Passivation of High-Aspect-Ratio Mercury Cadmium Telluride Surfaces

Chang-Feng Wan, Thomas Orent, Thomas Myers, Ishwara Bhat, Andy Stoltz, Joe Pellegrino

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